G01R27/20

Evaluation jig and evaluation method

An evaluation jig comprises a pair of female terminals connectable to a pair of male terminals of a charging connector, and an adjustment member that can adjust contact resistance of the female terminal and the male terminal. The female terminal is reducible in diameter. The adjustment member can apply an external force to the female terminal to reduce the female terminal in diameter.

System and method for contact measurement circuit

According to an embodiment, a contact measurement circuit is configured to be coupled between a first contact and a second contact, and the contact measurement circuit includes a first transistor, a control capacitor, and a voltage measurement unit. The first transistor includes a first conduction terminal configured to be coupled to the first contact, a second conduction terminal, and a first control terminal. The control capacitor includes a first capacitor terminal coupled to the second conduction terminal and a second capacitor terminal coupled to the first control terminal. The voltage measurement unit is coupled to the first capacitor terminal and the second capacitor terminal, and the second capacitor terminal is configured to be coupled to the second contact.

CLAMP METER
20180210014 · 2018-07-26 ·

A clamp meter to be used for detecting resistance of a ground loop on which the detection is to be performed includes a source transformer unit that is configured to receive an alternating input voltage signal and is capable of being electrically coupled to the ground loop on which the detection is to be performed; an induction transformer unit that is capable of being electrically coupled to the ground loop and the induction transformer unit being configured to be capable of generating an induced current signal as a response to the input voltage signal; a reference resistance loop that is electrically coupled to the source transformer unit and the induction transformer unit; and a processing controller that receives the induced current signal and the processing controller is configured to be capable of determining the resistance of the ground loop based on the induced current signal.

LIGHTNING PROTECTION SYSTEM EVALUATION BASED ON IMPEDANCE ANALYSIS
20240352922 · 2024-10-24 ·

A lightning protection system is provided, in particular for a rotor blade, the system including: i) a lightning conductor for conducting electrical energy of a lightning; and ii) a measurement device electrically coupled to the lightning conductor and configured to measure an impedance with respect to the lightning conductor. Further, a rotor blade and a wind turbine are provided.

ARRANGEMENT HAVING AN INSULATION MONITOR, AND IT SYSTEM
20240353465 · 2024-10-24 ·

An arrangement having an insulation monitor for an IT system and a discharge resistor for discharging a ground discharge capacitance of the IT system is provided. The arrangement has two Z diodes that are arranged back-to-back and connected in series with the discharge resistor. Each of the two Z diodes has a reverse voltage above a test voltage of the insulation monitor.

Top contact resistance measurement in vertical FETs

A test device includes a diode junction layer having a first dopant conductivity region and a second dopant conductivity region formed within the diode junction layer on opposite sides of a diode junction. A first portion of vertical transistors is formed over the first dopant conductivity region as a device under test, and a second portion of vertical transistors is formed over the second dopant conductivity region. A common source/drain region is formed over the first and second portions of vertical transistors. Current through the first portion of vertical transistors permits measurement of a resistance at a probe contact connected to the common source/drain region.

Method of measuring the energy consumption of the branches of an electrical network and measurement equipment implementing said method
09989567 · 2018-06-05 · ·

Equipment (1) for measuring the energy consumption of branches (11-N) of an electrical network (10) which comprises a single voltages measuring device (2) connected upstream of the branches of the network so as to measure the voltages of the network in a centralized manner, and several dedicated current measuring devices (3) connected to each branch of the network so as to measure the currents on the branches of the network. The measuring devices (2, 3) are connected by network cable (6) allowing digital communication of the voltage measurements to the current measuring devices (3), which comprises a processing unit (33) for calculating the energy consumption of the analyzed branch of the network. The voltage and current measurements are performed by sampling, and the sampling frequencies are compared and adjusted automatically so as to synchronize the current samples with the voltage samples.

Method of measuring the energy consumption of the branches of an electrical network and measurement equipment implementing said method
09989567 · 2018-06-05 · ·

Equipment (1) for measuring the energy consumption of branches (11-N) of an electrical network (10) which comprises a single voltages measuring device (2) connected upstream of the branches of the network so as to measure the voltages of the network in a centralized manner, and several dedicated current measuring devices (3) connected to each branch of the network so as to measure the currents on the branches of the network. The measuring devices (2, 3) are connected by network cable (6) allowing digital communication of the voltage measurements to the current measuring devices (3), which comprises a processing unit (33) for calculating the energy consumption of the analyzed branch of the network. The voltage and current measurements are performed by sampling, and the sampling frequencies are compared and adjusted automatically so as to synchronize the current samples with the voltage samples.

Integrated circuit containing DOEs of GATECNT-tip-to-side-short-configured, NCEM-enabled fill cells

Wafers, chips, or dies that contain fill cells with structures configured to obtain in-line data via non-contact electrical measurements (NCEM). Such NCEM-enabled fill cells may target/expose a variety of open-circuit, short-circuit, leakage, or excessive resistance failure modes, including GATECNT-tip-to-side-short and/or GATECNT-tip-to-side-leakage failure modes. Such wafers, chips, or dies may include Designs of Experiments (DOEs), comprised of multiple NCEM-enabled fill cells, of at least two types, all targeted to the same failure mode.

SEMICONDUCTOR DEVICE
20180128868 · 2018-05-10 ·

A semiconductor device includes an external terminal, a switching output stage that performs switching drive of a terminal voltage at the external terminal, an output control unit arranged to generate a drive signal for the switching output stage according to an input pulse signal, a counter arranged to count the number of pulses of the input pulse signal so as to generate a mask signal, a logical gate arranged to mask the input pulse signal according to the mask signal, and a comparator arranged to compare the terminal voltage with a predetermined threshold value voltage so as to generate a reset signal of the counter.