The disclosure describes a process and apparatus for accessing devices on a substrate. The substrate may include only full pin JTAG devices (504), only reduced pin JTAG devices (506), or a mixture of both full pin and reduced pin JTAG devices. The access is accomplished using a single interface (502) between the substrate (408) and a JTAG controller (404). The access interface may be a wired interface or a wireless interface and may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

In a measurement system, a signal probing circuit may provide probed signals by probing voltages and currents and/or incident and reflected waves at a port of a device under test (DUT). A multi-channel receiver structure may include receivers that receive two probed signals from the signal probing hardware circuit, each receiver having its own sample clock derived from a master clock and further having a respective digitizer for digitizing a corresponding one of the two probed signals. A synchronization block, external to the receivers and including a reference clock derived from the master clock, may enable the two probed signals to be phase coherently digitized across the receivers by synchronizing the respective sample clocks of the receivers while the reference clock is being shared with the receivers. A signal processing circuit may then process the phase coherently digitized probed signals.

A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.

A system for over-the-air testing of a device under test includes a measurement antenna, a reference antenna, a device under test capable of wirelessly transmitting and/or receiving complex radio frequency signals, and an analyzer. The analyzer has at least two ports, wherein the reference antenna is connected with a first port of the analyzer. The measurement antenna is connected with a second port of the analyzer. The analyzer is capable of determining a phase difference and a power ratio of radio frequency signals received via the measurement antenna and the reference antenna. The analyzer is capable of performing an IQ analysis on complex radio frequency signals. Further, a method of over-the-air testing of a device under test is disclosed.

The present disclosure relates to a system for aligning a measurement system suitable for radio frequency measurement of a device under test. The system includes an alignment device, a measurement module and an indication module. The alignment device includes at least two alignment antennas configured to receive a signal over-the-air from a measurement antenna of the measurement system. The measurement module is configured to measure a phase difference between the at least two alignment antennas receiving the signal. The indication module is configured to indicate the measured phase difference between the at least two alignment antennas or a reference quantity associated with the measured phase difference. Further, a method of aligning a measurement system used for radio frequency measurement of a device under test is described.

The present disclosure relates to a system for aligning a measurement system suitable for radio frequency measurement of a device under test. The system includes an alignment device, a measurement module and an indication module. The alignment device includes at least two alignment antennas configured to receive a signal over-the-air from a measurement antenna of the measurement system. The measurement module is configured to measure a phase difference between the at least two alignment antennas receiving the signal. The indication module is configured to indicate the measured phase difference between the at least two alignment antennas or a reference quantity associated with the measured phase difference. Further, a method of aligning a measurement system used for radio frequency measurement of a device under test is described.

An over-the-air measurement system for performing over-the-air measurements on a device under test is described. The measurement system comprises a measurement device having several measurement antennas, several waveguides, wherein at least one waveguide is assigned to each measurement antenna, several waveguide-to-cable adapters, and a positioning unit assigned to the measurement antennas. The number of the waveguide-to-cable adapters is at least identical to the number of the measurement antennas. The positioning unit is configured to move the measurement antennas with respect to the waveguide-to-cable adapters.

The disclosed technology generally relates to characterization of semiconductor structures, and more particularly to optical characterization of high-k dielectric materials. A method includes providing a semiconductor structure comprising a semiconductor and a high-k dielectric layer formed over the semiconductor, wherein the dielectric layer has electron traps formed therein. The method additionally includes at least partially transmitting an incident light having an incident energy through the high-k dielectric layer and at least partially absorbing the incident light in the semiconductor. The method additionally includes measuring a nonlinear optical spectrum resulting from the light having the energy different from the incident energy, the nonlinear optical spectrum having a first region and a second region, wherein the first region changes at a different rate in intensity compared to the second region. The method further includes determining from the nonlinear optical spectrum one or both of a first time constant from the first region and a second time constant from the second region, and determining a trap density in the high-k dielectric layer based on the one or both of the first time constant and the second time constant.

The disclosed technology generally relates to characterization of semiconductor structures, and more particularly to optical characterization of high-k dielectric materials. A method includes providing a semiconductor structure comprising a semiconductor and a high-k dielectric layer formed over the semiconductor, wherein the dielectric layer has electron traps formed therein. The method additionally includes at least partially transmitting an incident light having an incident energy through the high-k dielectric layer and at least partially absorbing the incident light in the semiconductor. The method additionally includes measuring a nonlinear optical spectrum resulting from the light having the energy different from the incident energy, the nonlinear optical spectrum having a first region and a second region, wherein the first region changes at a different rate in intensity compared to the second region. The method further includes determining from the nonlinear optical spectrum one or both of a first time constant from the first region and a second time constant from the second region, and determining a trap density in the high-k dielectric layer based on the one or both of the first time constant and the second time constant.

Embodiments of the present disclosure provide an antenna assembly for a test system. The antenna assembly includes a feedthrough part, two waveguide inputs, a single waveguide output as well as a multiplexing part that is interconnected between the two waveguide inputs and the single waveguide output. The multiplexing part is integrated within the feedthrough part at least partially. Moreover, embodiments of the present disclosure provide a test system and a method of establishing a test system for testing a device under test.