Detecting whether a target device that includes multiple electronic components is genuine or suspected counterfeit by: performing a test sequence of energizing and de-energizing the target device and collecting electromagnetic interference (EMI) signals emitted by the target device; generating a target EMI fingerprint from the EMI signals collected; retrieving a plurality of reference EMI fingerprints from a database library, each of which corresponds to a different configuration of electronic components of a genuine device of the same make and model as the target device; iteratively comparing the target EMI fingerprint to the retrieved reference EMI fingerprints and generating a similarity metric between each compared set; and indicating that the target device (i) is genuine where the similarity metric for any individual reference EMI fingerprint satisfies a threshold test, and is a suspect counterfeit device where no similarity metric for any individual reference EMI fingerprint satisfies the test.

Detecting whether a target device that includes multiple electronic components is genuine or suspected counterfeit by: performing a test sequence of energizing and de-energizing the target device and collecting electromagnetic interference (EMI) signals emitted by the target device; generating a target EMI fingerprint from the EMI signals collected; retrieving a plurality of reference EMI fingerprints from a database library, each of which corresponds to a different configuration of electronic components of a genuine device of the same make and model as the target device; iteratively comparing the target EMI fingerprint to the retrieved reference EMI fingerprints and generating a similarity metric between each compared set; and indicating that the target device (i) is genuine where the similarity metric for any individual reference EMI fingerprint satisfies a threshold test, and is a suspect counterfeit device where no similarity metric for any individual reference EMI fingerprint satisfies the test.

A system and method for testing a tractor trailer is disclosed. The system includes a housing having connections for establishing an electrical and pressure connection to the electrical system and ABS of a tractor trailer, respectively, a circuit board that generates electrical signals and pressure signals corresponding to the connections, an electronic device for displaying the electrical signals and pressure signals, a wireless transceiver for transmitting the electrical signals and pressure signals to the electronic device, and a memory for storing the transmitted electrical signals and pressure signals. The method includes connecting the tractor trailer electrical system and ABS connections to the housing, powering on the tractor trailer, querying an electrical signal and/or pressure signal of the electrical system and ABS, wirelessly transmitting the electrical signal and/or pressure signal to an electronic device, and displaying the electrical signal and/or pressure signal on the electronic device.

The present invention discloses an automatic laser calibration kit for calibrating the distance between a test device of a wireless charging system and a device under test (DUT). The calibration kit may be located in a wireless charging test system. The test system may comprise a test plane for controlling the DUT and a gripping arm for controlling the test device. The calibration kit may comprise: a laser pointer, configured to emit a laser beam; a mirror, positioned on the gripping arm and configured to reflect the laser beam to form a spot on the test plane; and a camera, configured to monitor the position of the spot.

A system for laser enhanced voltage contrast using an optical fiber is provided. The system includes a vacuum chamber with a stage that secures a wafer. A laser light source outside the vacuum chamber directs light to an optical fiber. The optical fiber transmits all wavelengths of light from the laser light source into the vacuum chamber through a wall of the vacuum chamber.

The disclosure describes a process and apparatus for accessing devices on a substrate. The substrate may include only full pin JTAG devices (504), only reduced pin JTAG devices (506), or a mixture of both full pin and reduced pin JTAG devices. The access is accomplished using a single interface (502) between the substrate (408) and a JTAG controller (404). The access interface may be a wired interface or a wireless interface and may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

An inspection device includes a reference signal output section, a noise removal section, and an electrical characteristic measurement section. The reference signal output section is connected to an external power supply device in electrical parallel with a semiconductor sample, and outputs a reference signal according to the output of the external power supply device. The noise removal section outputs a noise removal signal obtained by removing a noise component of the output of the external power supply device from the current signal output from the semiconductor sample based on the reference signal. The electrical characteristic measurement section measures the electrical characteristic of the semiconductor sample based on the noise removal signal. The inspection device measures the electrical characteristic of the semiconductor sample to which a voltage is being applied by the external power supply device and which is being irradiated and scanned with light. The inspection device outputs a defective portion of the semiconductor sample based on the electrical characteristic.

A sensor device is provided for testing electrical connections in a DUT using contactless fault detection. The sensor device includes main traces for conducting an RF signal supplied by a signal source; at least one inductor connected to at least one of the main traces; and a slit formed between opposing conductor portions at a tip of the sensor device for sensing open circuits and/or short circuits in portions of the DUT located in a sensing region below the slit, the tip being at an end of the sensor device opposite ends of the main traces connected to the signal source. An electric field, generated by the sensor device in response to the RF signal, substantially concentrates in the slit, enhancing the sensing of the open and/or the short circuits during the contactless fault detection.

A sensor device is provided for testing electrical connections in a DUT using contactless fault detection. The sensor device includes main traces for conducting an RF signal supplied by a signal source; at least one inductor connected to at least one of the main traces; and a slit formed between opposing conductor portions at a tip of the sensor device for sensing open circuits and/or short circuits in portions of the DUT located in a sensing region below the slit, the tip being at an end of the sensor device opposite ends of the main traces connected to the signal source. An electric field, generated by the sensor device in response to the RF signal, substantially concentrates in the slit, enhancing the sensing of the open and/or the short circuits during the contactless fault detection.

Systems and methods presented herein include a robotic wearable device testing system with a track drive system that includes one or more tracks having a plurality of attachment pads configured to attach to one or more wearable devices. Each track of the one or more tracks is configured to move along a path defined by the track. In addition, the robotic wearable device testing system includes a tap point drive system that includes one or more tap point sliders configured to slide laterally with respect to the track drive system. Each tap point slider of the one or more tap point sliders includes a tap point configured to wirelessly communicate with the one or more wearable devices when the one or more wearable devices are in close proximity with the tap point. Each tap point slider of the one or more tap point sliders also includes an electronic interference door configured to block wireless signals between the one or more wearable devices and the tap point. The robotic wearable device testing system also includes control circuitry configured to control relative movement of the one or more tracks and the one or more tap point sliders to position one or more wearable devices attached to respective attachment pads of the plurality of attachment pads in close proximity with a tap point of the one or more tap point sliders, and to control movement of the electronic interference door to allow or block the wireless signals between the one or more wearable devices and the tap point of the one or more tap point sliders.