An apparatus and method for diagnosing whether a charging and discharging switching element provided on a charging and discharging path of a battery pack operates normally. A charging and discharging switching unit having a charging and discharging switch and a fuse is installed on a charging and discharging path between a battery cell and a pack terminal. The apparatus includes a first diagnosing path a second diagnosing path, a third diagnosing path, an integrated diagnosing path having a diagnosis switching unit and a diagnosis resistor, a voltage measuring unit, and a control unit configured to turn on and off the diagnosis switching unit and determine whether the charging and discharging switching unit is operating abnormally based on the diagnosis voltage measured by the voltage measuring unit.

An apparatus and method for diagnosing whether a charging and discharging switching element provided on a charging and discharging path of a battery pack operates normally. A charging and discharging switching unit having a charging and discharging switch and a fuse is installed on a charging and discharging path between a battery cell and a pack terminal. The apparatus includes a first diagnosing path a second diagnosing path, a third diagnosing path, an integrated diagnosing path having a diagnosis switching unit and a diagnosis resistor, a voltage measuring unit, and a control unit configured to turn on and off the diagnosis switching unit and determine whether the charging and discharging switching unit is operating abnormally based on the diagnosis voltage measured by the voltage measuring unit.

Provided is a semiconductor device capable of detecting an abnormal state in which two fuses are both short-circuited or cut. The semiconductor device includes: a trimming circuit having a first fuse and a second fuse connected in series; a current source circuit configured to supply current to the trimming circuit; and a determination circuit configured to determine whether a connection state or disconnect state of the first fuse and the second fuse are abnormal or not based upon signals derived from an output signal of the trimming circuit.

Provided is a semiconductor device capable of detecting an abnormal state in which two fuses are both short-circuited or cut. The semiconductor device includes: a trimming circuit having a first fuse and a second fuse connected in series; a current source circuit configured to supply current to the trimming circuit; and a determination circuit configured to determine whether a connection state or disconnect state of the first fuse and the second fuse are abnormal or not based upon signals derived from an output signal of the trimming circuit.

The invention relates generally to an Internet of Things (IoT) enabled wireless sensor system using attached and/or embedded passive electromagnetic sensors (PES) with distribution hardware. One embodiment of this invention includes a wireless sensor system, which permits process control and predictive maintenance on a utility's electrical transmission and distribution grid. Another embodiment includes a wireless sensor system, which permits process control and predictive maintenance of liquid or gas through a pipeline. Another embodiment includes a wireless sensor system, which permits measurement of breathable air pollutants. Furthermore, a method of manufacturing a protective passive electromagnetic sensor pod and passive electromagnetic sensor equipped distribution hardware components is provided.

The invention relates generally to an Internet of Things (IoT) enabled wireless sensor system using attached and/or embedded passive electromagnetic sensors (PES) with distribution hardware. One embodiment of this invention includes a wireless sensor system, which permits process control and predictive maintenance on a utility's electrical transmission and distribution grid. Another embodiment includes a wireless sensor system, which permits process control and predictive maintenance of liquid or gas through a pipeline. Another embodiment includes a wireless sensor system, which permits measurement of breathable air pollutants. Furthermore, a method of manufacturing a protective passive electromagnetic sensor pod and passive electromagnetic sensor equipped distribution hardware components is provided.

A data storage device is disclosed comprising a storage medium, an input configured to receive a supply voltage from a voltage source, and control circuitry powered by the supply voltage. The control circuitry is configured to adjust a load of the data storage device, detect a load voltage at the adjusted load, detect a load current at the adjusted load, process the detected load voltage and the detected load current to detect a current limit of the voltage source, and configure the data storage device in response to the detected current limit of the voltage source.

A semiconductor device includes a substrate; an insulating layer positioned above the substrate, wherein the insulating layer has two ends; a first doped region formed in the substrate and positioned at one end of the two ends of the insulating layer; a second doped region formed in the substrate and positioned at the other end of the two ends of the insulating layer, wherein the second doped region is opposite to the first doped region; a control terminal positioned above the insulating layer; a first fuse head positioned above the control terminal and electrically coupled to the first doped region; a second fuse head positioned above the first fuse head; and a fuse area positioned between the first fuse head and the second fuse head.

A semiconductor device includes a substrate; an insulating layer positioned above the substrate, wherein the insulating layer has two ends; a first doped region formed in the substrate and positioned at one end of the two ends of the insulating layer; a second doped region formed in the substrate and positioned at the other end of the two ends of the insulating layer, wherein the second doped region is opposite to the first doped region; a control terminal positioned above the insulating layer; a first fuse head positioned above the control terminal and electrically coupled to the first doped region; a second fuse head positioned above the first fuse head; and a fuse area positioned between the first fuse head and the second fuse head.

Disclosed herein is a semiconductor device including a non-volatile memory unit. The non-volatile memory unit has a subject current path disposed in a semiconductor integrated circuit and a fuse element inserted in series on the subject current path, and changes output data according to a voltage between both ends of the fuse element when supply of a subject current to the subject current path is intended. A current supply part that switches the subject current between a plurality of stages is disposed in the non-volatile memory unit.