Systems and methods for operating and calibrating measurement devices are provided herein. The measurement devices generate reference current signals and sense the reference current signals in a conductor under test, which sensed signals are used to determine a calibration factor or a position of the conductor under test. A calibration system may control a calibration voltage source to selectively output calibration voltages in a calibration conductor. The calibration system may obtain data from the electrical parameter measurement device captured by the electrical parameter measurement device when measuring the calibration conductor. Such data may include one or more reference current measurements, one or more voltage measurements, etc. The calibration system utilizes the obtained measurements to generate calibration data which may be stored on the voltage measurement device for use thereby during subsequent operation. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, etc.

The present invention relates to resistance calibration and in particular to resistance calibration in the context of semiconductor integrated circuitry.

Self-testing proximity testing systems and corresponding methods are discussed herein and can include a proximity probe and controller in electrical communication via a cable. A self-testing subsystem can be in communication with the controller and configured to determine whether proximity probes and cables assembled with a controller are compatible or incompatible. The self-testing subsystem can place a known impedance in electrical communication with the controller, modifying a proximity signal output by the controller. When the modified proximity signal differs from a predicted proximity signal by greater than or equal to a threshold amount, the self-testing subsystem can output a first indication indicating that incompatible proximity probes and cables are assembled with a controller. When the modified proximity signal differs from a predicted proximity signal by less than the threshold amount, the self-testing subsystem can output a second indication indicating that compatible proximity probes and cables are assembled with a controller.

A calibration system for a magnetometer having an unknown gain is disclosed. A calibration magnetic field is generated at a calibration frequency of a known amplitude at the magnetometer. A measurement of the calibrating magnetic field is reported by the magnetometer. A ratio of an amplitude of the calibration magnetic field measurement reported by the magnetometer and the known amplitude of the calibrating magnetic field at the magnetometer is computed. The unknown gain of the magnetometer is determined at least partially based on computed ratio.

A signal correction method for correcting a measured signal has the following steps: processing a digital representation of a first signal at a first measurement input; processing a digital representation of a second signal at a second measurement input corresponding to the first signal convoluted with a transfer function; and determining the transfer function for correcting the measured signal. Further, a use of the method, a system for correcting a measured signal, and an oscilloscope are provided.

A method for operating an inductive conductivity sensor, wherein a first electric transmitter signal having a first signal frequency is generated and supplied to the transmitter coil, a first electric receiver signal is measured at the receiver coil and a first conductivity of the medium determined from the first electric receiver and first electric transmitter signals using a first calibration model. At least one further electric transmitter signal having a different signal frequency is generated and supplied to the transmitter coil, a further electric receiver signal is measured at the receiver coil and a further conductivity of the medium determined from the further electric receiver and electric transmitter signals using another calibration model, at least one conductivity difference is determined between each of the determined conductivities of the medium and when the at least one conductivity difference exceeds a threshold conductivity difference, the conductivity difference is signaled as an error.

A Kelvin probe system is provided. The invention is achieved using a rotating Kelvin probe head comprising a Kelvin probe face is provided on a side face of the Kelvin probe head.

Systems and methods for measurement and management provide complex measurements cost-effectively at very high accuracy. These methods and systems in some cases achieve measurement accuracy exceeding the accuracy of the reference standards they rely on, and eliminate expensive and disadvantageous recalibration procedures. The accurate measurements are integrated with management functions, applying the measurement data to meet objectives of the integrated system and workflow goals of its user. The disclosed systems and methods comprise an explicit or expressly represented model both of themselves and of candidate external systems to be measured and managed. The models may be configured and reconfigured by the owner-user through either local or remote means. The system intelligently reconfigures itself to adapt dynamically to the conditions of measurement and the user's and system's goals at each moment. In an embodiment, the system includes high-accuracy and reconfigurable components including a meter or control head adapted for user precision assembly and maintenance that computes and displays or communicates the measurements, displaying measurements in desired units, grouping functions according to ergonomic and cognitive principles based on the activity and workflow of a user in relation to the internal model. The use of models permits the system to compute and provide complex and inferred measurements of ultimate interest to the user, including quantities that cannot be directed measured and only can be determined through reasoning or computation by applying models to raw measurement data. The precision-assembly modular electromechanical design further permits an owner-user to precisely assemble, maintain, modify the apparatus and calibrate the equipment for accuracy.

A method and apparatus for monitoring a secondary power device, for accurately checking a state of the secondary power device, and an electronic system including the apparatus are provided. The method of monitoring a secondary power device includes: setting a first reference parameter by using a voltage of at least one capacitor of the secondary power device; setting a second reference parameter by using the voltage of the at least one capacitor and the first reference parameter; and setting a reference level for checking of the state of the secondary power device by using the second reference parameter, wherein the reference level is used in checking of the state of the secondary power device.

In a system and method for correcting a stress-impaired signal in a circuit, a calibration circuit produces a first calibrated voltage based on a base-emitter voltage of one or more pnp transistors, a second calibrated voltage based on a base-emitter voltage of one or more npn transistors, and a voltage proportional to absolute temperature. A set of reference values are generated based on these voltages. A gain correction factor is calculated based on a function of the set of reference values and a set of temperature-dependent values, and the stress-impaired signal is corrected based on the gain correction factor.