G06F11/26

At-speed test access port operations
11585852 · 2023-02-21 · ·

In some examples, an integrated circuit comprises: a TDI input, a TDO output, a TCK input and a TMS input; a TAP state machine (TSM) having an input coupled to the TCK input, an input coupled to the TMS input, an instruction register control output, a TSM data register control (DRC) output, and a TSM state output; an instruction register having an input coupled to the TDI input, an output coupled to the TDO output, and a control input coupled to the instruction register control output of the TAP state machine; router circuitry including a TSM DRC input coupled to the TSM DRC output, a control DRC input coupled to the TSM state output, and a router DRC output; and a data register having an input coupled to the TDI input, an output coupled to the TDO output, and a data register DRC input coupled to the router DRC output.

Automated internet of things device testing including modifying a device table to generate an association table

A method, system, and computer program product for automated testing of Internet of Things devices are provided. The method generates a device table for a set of devices. The device table includes a set of inputs and a set of controllable outputs for each device. A set of input signals are detected for a device for a subset of inputs associated with the device. The set of input signals are detected from one or more controllable outputs of a subset of devices. The device table is modified based on the set of input signals and the one or more controllable outputs to generate an association table representing a relation of the subset of inputs with the one or more controllable outputs. The method detects a fault in one or more device of the set of devices based on a test input signal and the association table.

Automated internet of things device testing including modifying a device table to generate an association table

A method, system, and computer program product for automated testing of Internet of Things devices are provided. The method generates a device table for a set of devices. The device table includes a set of inputs and a set of controllable outputs for each device. A set of input signals are detected for a device for a subset of inputs associated with the device. The set of input signals are detected from one or more controllable outputs of a subset of devices. The device table is modified based on the set of input signals and the one or more controllable outputs to generate an association table representing a relation of the subset of inputs with the one or more controllable outputs. The method detects a fault in one or more device of the set of devices based on a test input signal and the association table.

DEVICE AND SYSTEM FOR VALIDATION AND MODIFICATION OF DEVICE STATE TRANSITIONS FOR AN AEROSOL GENERATION DEVICE

A test fixture for testing aerosol provision devices may include a housing, a plurality of testing modules disposed at the housing where each of the testing modules includes a cavity configured to receive a portion of an aerosol provision device, and processing circuitry operably coupled to the testing modules. Each of the testing modules may be configured to interface with an assembly of a respective one of the aerosol provision devices to transition the assembly between an initial state and a transitioned state during a functional test controlled by the processing circuitry. The processing circuitry may be configured to conduct the functional test of at least two of the testing modules simultaneously.

DEVICE AND SYSTEM FOR VALIDATION AND MODIFICATION OF DEVICE STATE TRANSITIONS FOR AN AEROSOL GENERATION DEVICE

A test fixture for testing aerosol provision devices may include a housing, a plurality of testing modules disposed at the housing where each of the testing modules includes a cavity configured to receive a portion of an aerosol provision device, and processing circuitry operably coupled to the testing modules. Each of the testing modules may be configured to interface with an assembly of a respective one of the aerosol provision devices to transition the assembly between an initial state and a transitioned state during a functional test controlled by the processing circuitry. The processing circuitry may be configured to conduct the functional test of at least two of the testing modules simultaneously.

Memory system with accessible storage region to gateway

A memory system comprising a first storage region which stores first firmware corresponding to an external first electronic control apparatus; a second storage region which stores second firmware corresponding to an external gateway and third firmware corresponding to the first electronic control apparatus; and a controller configured to transmit the second firmware and the third firmware to the gateway on the basis of a first command received from the gateway, and transmit the first firmware to the gateway on the basis of a second command received from the gateway.

Memory system with accessible storage region to gateway

A memory system comprising a first storage region which stores first firmware corresponding to an external first electronic control apparatus; a second storage region which stores second firmware corresponding to an external gateway and third firmware corresponding to the first electronic control apparatus; and a controller configured to transmit the second firmware and the third firmware to the gateway on the basis of a first command received from the gateway, and transmit the first firmware to the gateway on the basis of a second command received from the gateway.

Data Hazard Generation
20230101206 · 2023-03-30 ·

Implementations are directed to methods, systems, and computer-readable media for data hazard generation for instruction sequence generation. In one aspect, a computer-implemented method includes: obtaining data hazard information defining a data hazard to be generated during computer instruction generation, the data hazard specifying a data dependency between a first instruction and a second instruction occurring after the first instruction, and generating, based on the data hazard information and register usage data of a plurality of registers, an instruction for execution in a current processing cycle that satisfies the data dependency specified by the data hazard. The register usage data specifies, for each register of the plurality of registers, whether data was read from or written into the register in a plurality of processing cycles preceding the current processing cycle.

Data Hazard Generation
20230101206 · 2023-03-30 ·

Implementations are directed to methods, systems, and computer-readable media for data hazard generation for instruction sequence generation. In one aspect, a computer-implemented method includes: obtaining data hazard information defining a data hazard to be generated during computer instruction generation, the data hazard specifying a data dependency between a first instruction and a second instruction occurring after the first instruction, and generating, based on the data hazard information and register usage data of a plurality of registers, an instruction for execution in a current processing cycle that satisfies the data dependency specified by the data hazard. The register usage data specifies, for each register of the plurality of registers, whether data was read from or written into the register in a plurality of processing cycles preceding the current processing cycle.

MEMORY SYSTEM WITH ACCESSIBLE STORAGE REGION TO GATEWAY

A memory system comprising a first storage region which stores first firmware corresponding to an external first electronic control apparatus; a second storage region which stores second firmware corresponding to an external gateway and third firmware corresponding to the first electronic control apparatus; and a controller configured to transmit the second firmware and the third firmware to the gateway on the basis of a first command received from the gateway, and transmit the first firmware to the gateway on the basis of a second command received from the gateway.