An apparatus includes a memory sub-system comprising a plurality of memory blocks and a memory block defect detection component. The memory block defect detection component is to set, for a memory block among the plurality of memory blocks, a first block defect detection rate and determine whether the first block defect detection rate is greater than a threshold block defect detection rate for the at least one memory block. In response to a determination that the first block defect detection rate is greater than the threshold block defect detection rate for the memory block, the memory block defect detection component is to assert a program command on the memory block determine whether a program operation associated with assertion of the program command on the at least one memory block is successful. In response to a determination the program operation is unsuccessful, the memory block defect detection component is to determine that a failure involving a plane associated with the memory block and another plane of the memory sub-system has occurred.

An apparatus includes a memory sub-system comprising a plurality of memory blocks and a memory block defect detection component. The memory block defect detection component is to set, for a memory block among the plurality of memory blocks, a first block defect detection rate and determine whether the first block defect detection rate is greater than a threshold block defect detection rate for the at least one memory block. In response to a determination that the first block defect detection rate is greater than the threshold block defect detection rate for the memory block, the memory block defect detection component is to assert a program command on the memory block determine whether a program operation associated with assertion of the program command on the at least one memory block is successful. In response to a determination the program operation is unsuccessful, the memory block defect detection component is to determine that a failure involving a plane associated with the memory block and another plane of the memory sub-system has occurred.

An apparatus includes circuitry configured to maintain a record of a plurality of owners and at least one test operation owned by an owner; prompt automatically the owner in response to a failure of the one test operation; maintain a log of actions taken on the one test operation, and provide availability to the log of actions; update an estimated time to completion, and notify a management entity of the updated estimated time to completion; mark and prioritize an order related to the one test operation, in response to the estimated time to completion being within a threshold of a delivery date; rank the marked order with other marked orders by a risk of not being able to meet the delivery date; and notify the owner of the ranking with an urgent message, in response to the marked order failing to meet the delivery date.

An apparatus includes circuitry configured to maintain a record of a plurality of owners and at least one test operation owned by an owner; prompt automatically the owner in response to a failure of the one test operation; maintain a log of actions taken on the one test operation, and provide availability to the log of actions; update an estimated time to completion, and notify a management entity of the updated estimated time to completion; mark and prioritize an order related to the one test operation, in response to the estimated time to completion being within a threshold of a delivery date; rank the marked order with other marked orders by a risk of not being able to meet the delivery date; and notify the owner of the ranking with an urgent message, in response to the marked order failing to meet the delivery date.

A method includes determining, by an analysis system, a system aspect of a system for a protection evaluation. The method further includes determining, by the analysis system, at least one evaluation perspective for use in performing the protection evaluation on the system aspect. The method further includes determining, by the analysis system, at least one evaluation viewpoint for use in performing the protection analysis on the system aspect. The method further includes obtaining, by the analysis system, protection data regarding the system aspect in accordance with the at least one evaluation perspective and the at least one evaluation viewpoint. The method further includes calculating, by the analysis system, a protection rating as a measure of protection maturity for the system aspect based on the protection data, the at least one evaluation perspective, the at least one evaluation viewpoint, and at least one evaluation rating metric.

A method includes determining, by an analysis system, a system aspect of a system for a protection evaluation. The method further includes determining, by the analysis system, at least one evaluation perspective for use in performing the protection evaluation on the system aspect. The method further includes determining, by the analysis system, at least one evaluation viewpoint for use in performing the protection analysis on the system aspect. The method further includes obtaining, by the analysis system, protection data regarding the system aspect in accordance with the at least one evaluation perspective and the at least one evaluation viewpoint. The method further includes calculating, by the analysis system, a protection rating as a measure of protection maturity for the system aspect based on the protection data, the at least one evaluation perspective, the at least one evaluation viewpoint, and at least one evaluation rating metric.

A diagnosis circuit makes a diagnosis of a first multiplexer. The first multiplexer receives input data elements, selects one of the input data elements, and outputs the selected one as a selected data element. The diagnosis circuit includes a comparator unit and a second multiplexer. The comparator unit compares each of the input data elements to be supplied to the first multiplexer with the selected data element provided by the first multiplexer. The second multiplexer receives comparative data elements corresponding one to one to results of comparison made by the comparator unit with respect to the input data elements and outputs, out of the comparative data elements, a comparative data element, including a result of comparison between the one input data element selected by the first multiplexer and the selected data element, as a result data element.

A diagnosis circuit makes a diagnosis of a first multiplexer. The first multiplexer receives input data elements, selects one of the input data elements, and outputs the selected one as a selected data element. The diagnosis circuit includes a comparator unit and a second multiplexer. The comparator unit compares each of the input data elements to be supplied to the first multiplexer with the selected data element provided by the first multiplexer. The second multiplexer receives comparative data elements corresponding one to one to results of comparison made by the comparator unit with respect to the input data elements and outputs, out of the comparative data elements, a comparative data element, including a result of comparison between the one input data element selected by the first multiplexer and the selected data element, as a result data element.

A test fixture for testing aerosol provision devices may include a housing, a plurality of testing modules disposed at the housing where each of the testing modules includes a cavity configured to receive a portion of an aerosol provision device, and processing circuitry operably coupled to the testing modules. Each of the testing modules may be configured to interface with an assembly of a respective one of the aerosol provision devices to transition the assembly between an initial state and a transitioned state during a functional test controlled by the processing circuitry. The processing circuitry may be configured to conduct the functional test of at least two of the testing modules simultaneously.

A test fixture for testing aerosol provision devices may include a housing, a plurality of testing modules disposed at the housing where each of the testing modules includes a cavity configured to receive a portion of an aerosol provision device, and processing circuitry operably coupled to the testing modules. Each of the testing modules may be configured to interface with an assembly of a respective one of the aerosol provision devices to transition the assembly between an initial state and a transitioned state during a functional test controlled by the processing circuitry. The processing circuitry may be configured to conduct the functional test of at least two of the testing modules simultaneously.