An artificial neuron for a neuromorphic chip comprises a synapse with resistive memory representative of a synaptic weight. The artificial neuron comprises a read circuit, an integration circuit and a logic circuit interposed between the read circuit and the integration circuit. The read circuit is configured to impose on the synapse a read voltage independent of the membrane voltage and to provide an analogue value representative of the synaptic weight. The logic circuit is configured to generate from the analogue value a pulse having a duration. The integration circuit comprises an accumulator of synaptic weights at the terminals of which a membrane voltage is established and a comparator configured to emit a postsynaptic pulse if a threshold is exceeded by the membrane voltage. Moreover, it comprises a source of current controlled by the pulse to inject a current into the accumulator of synaptic weights during this duration.

An artificial neuron for a neuromorphic chip comprises a synapse with resistive memory representative of a synaptic weight. The artificial neuron comprises a read circuit, an integration circuit and a logic circuit interposed between the read circuit and the integration circuit. The read circuit is configured to impose on the synapse a read voltage independent of the membrane voltage and to provide an analogue value representative of the synaptic weight. The logic circuit is configured to generate from the analogue value a pulse having a duration. The integration circuit comprises an accumulator of synaptic weights at the terminals of which a membrane voltage is established and a comparator configured to emit a postsynaptic pulse if a threshold is exceeded by the membrane voltage. Moreover, it comprises a source of current controlled by the pulse to inject a current into the accumulator of synaptic weights during this duration.

A method is presented for temperature assisted programming of flash memory for neuromorphic computing. The method includes training a chip in an environment having a first temperature, adjusting the first temperature to a second temperature in the environment, and employing the chip for inference in the second temperature environment. The first temperature is about 125° C. or higher and the second temperature is about 50° C. or lower.

A memory device includes at least one semiconductor layer having a double PN junction, and an anode and a cathode which simultaneously contact the semiconductor layer, wherein a junction between the semiconductor layer and the anode is a Schottky junction, and a junction between the semiconductor layer and the cathode is an Ohmic junction. In addition, a capacitor-less memory device includes at least one semiconductor layer including a double PN junction, a control gate which contacts the semiconductor layer, and an anode and a cathode which simultaneously contact the semiconductor layer, wherein a junction between the semiconductor layer and the anode is a Schottky junction, and a junction between the semiconductor layer and the cathode is an Ohmic junction. Methods of operating the memory device and the capacitor-less memory device are also disclosed.

A memory device is provided. The memory device includes an array of memory cells arranged in a plurality of rows, a plurality of word lines respectively coupled to the plurality of rows of the memory cells; and a peripheral circuit coupled to the word lines and configured to perform multi-pass programming on a selected row of memory cells coupled to a selected word line of the word lines. The multi-pass programming includes a plurality of programming passes, each of the programming passes having a programming operation and a verify operation. To perform the multi-pass programming, the peripheral circuit is configured to, in a non-last programming pass, perform a negative gate stress (NGS) operation on each memory cell in the selected row of memory cells between the programming operation and the verify operation.

A method of programming a nonvolatile memory device includes: receiving a programming command, data for a plurality of pages, and an address corresponding to a selected word-line; programming the data for one of the pages to an unselected word-line; reading data of a previously programmed page from the selected word-line; and programming the data for the remaining pages and the data of the previously programmed page to the selected word-line.

Technology for sensing non-volatile memory cells in which one or more sense nodes are charged to a sense voltage having a magnitude that improves sensing accuracy. One sense node may be charged to different sense voltages when sensing different memory cells at different times. Multiple sense nodes may be charged to a corresponding multiple different sense voltages when sensing different memory cells at the same time. The one or more sense nodes are allowed to discharge based on respective currents of memory cells for a pre-determined time while applying a reference voltage to the memory cells. The Vts of the selected memory cells are assessed based on respective voltages on the one or more of sense nodes after the pre-determined time. Different sensing voltages may be used based on bit line voltage, bit line resistance, distance of memory cells from the sense node, or other factors.

In one embodiment, a memory device includes a memory core and input receivers to receive commands and data. The memory device also includes a register to store a value that indicates whether a subset of the input receivers are powered down in response to a control signal. A memory controller transmits commands and data to the memory device. The memory controller also transmits the value to indicate whether a subset of the input receivers of the memory device are powered down in response to the control signal. In addition, in response to a self-fresh command, the memory device defers entry into a self-refresh operation until receipt of the control signal that is received after receiving the self-refresh command.

A device includes a first switch, a first irreversibly programmable memory point, and a second irreversibly programmable memory point coupled in parallel with the first irreversibly programmable memory point. The first switch and the parallel combination of the first and second irreversibly programmable memory points are coupled in series between a first node and a second node.

A non-volatile multi-level cell (“MLC”) memory device is disclosed. The memory device has an array of non-volatile memory cells, an array of non-volatile memory cells, with each non-volatile memory cell storing multiple groups of bits. A row buffer in the memory device has multiple buffer portions, each buffer portion storing one or more bits from the memory cells and having different read and write latencies and energies.