Logic gates are made from first and second resistive elements connected together to form a voltage divider. One or both of the resistive elements is a unipolar memristor. OR and NOT gates may be constructed to make a digital logic system.

A complementary resistive switching (CRS) memory device having a three-dimensional crossbar-point vertical multi-layer structure is provided. The CRS memory device having a three-dimensional structure comprises: a conductive pillar; a plurality of CRS memory unit devices surrounding an outer circumferential surface of the conductive pillar and positioned to be spaced apart from each other; and a plurality of word electrode lines making contact with outer circumferential surfaces of the CRS memory unit devices and positioned so as to intersect the conductive pillar, wherein the CRS memory unit devices comprise: a first oxide semiconductor film surrounding the outer circumferential surface of the conductive pillar; a conductive film surrounding the first oxide semiconductor film; and a second oxide semiconductor film surrounding the conductive film. Therefore, a CRS memory device having a CRS-based three-dimensional crossbar-point vertical structure can be provided wherein a CRS device having a three-layer structure is applied as a unit device so as to enable efficient writing and reading without a selection device.

Memory devices might include an array of memory cells, a plurality of access lines, and a heater. The array of memory cells might include a plurality of strings of series-connected memory cells. Each access line of the plurality of access lines might be connected to a control gate of a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells. The heater might be adjacent to an end of each access line of the plurality of access lines.

To provide enhanced data storage devices and systems, various systems, architectures, apparatuses, and methods, are provided herein. In a first example, a multi-layer resistive random access memory (ReRAM) array is provided. Active layers of the array each comprise a plurality of ReRAM elements that each include a gate portion having a gate terminal and a memory cell portion with a source terminal and drain terminal. Insulating layers of the array alternate with the active layers and each comprise an insulating material between adjacent active layers. Wordlines span through more than one layer of the array, with each of the wordlines comprising a column of memory cell portions coupled via source terminals and drain terminals of column-associated ReRAM elements. Bitlines each span through an associated active layer of the array, with each of the bitlines comprising a row of gate portions coupled via at least gate terminals of row-associated ReRAM elements.

To provide enhanced data storage devices and systems, various systems, architectures, apparatuses, and methods, are provided herein. In a first example, a resistive random access memory (ReRAM) array is provided. The ReRAM array includes a plurality of memory cells each comprising resistive memory material formed into a layer of a substrate, with resistance properties of the resistive memory material corresponding to data bits stored by the memory cells. The ReRAM array also includes a plurality of interconnect features each comprising conductive material between adjacent memory cells formed into the layer of the substrate, and gate portions coupled onto the memory cells and configured to individually alter the resistance properties of the resistive memory material of associated memory cells responsive to at least voltages applied to the gate portions.

A memory cell includes a first resistive memory element, a second resistive memory element electrically coupled with the first resistive memory element at a common node, and a switching element comprising an input terminal electrically coupled with the common node, the switching element comprising a driver configured to float during one or more operations.

A resistive memory apparatus may include a memory region including a plurality of resistive memory cells arranged in a plurality of memory cell pairs. The resistive memory apparatus may include a voltage generating circuit configured to generate a read voltage code based on a switching state of at least one memory cell pair. The resistive memory apparatus may include a voltage providing unit configured to generate a read voltage corresponding to the read voltage code.

According to one embodiment, a non-volatile semiconductor memory device comprises a memory cell array and a memory region. The memory cell array has a plurality of physical blocks. Each of the plurality of physical blocks includes a plurality of string units. Each string unit has a plurality of NAND strings that shares a plurality of word lines connected to a plurality of memory cells, respectively. The memory region is disposed to one of the plurality of physical blocks. Each of the plurality of string units configures a first logical block, and when the first logical block is failed, information of the first failed logical block is stored in a first region of the memory region.

A semiconductor memory device according to an embodiment includes a memory cell array that includes a plurality of memory cells. The memory cell array comprises: a plurality of first conductive layers that are stacked in a first direction above a substrate and extend in a second direction intersecting the first direction; a second conductive layer extending in the first direction; a variable resistance film provided at intersections of the plurality of first conductive layers and the second conductive layer; a first select transistor disposed closer to a side of the substrate than a lowermost layer of the plurality of first conductive layers, the first select transistor including a first select gate line intersecting the second conductive layer; a third conductive layer that extends in a third direction intersecting the second direction and is connected to a lower end of the second conductive layer via the first select transistor; and a second select transistor disposed between at least one pair of the plurality of first conductive layers adjacent in the first direction, the second select transistor including a second select gate line intersecting the second conductive layer.

A resistive memory device includes a memory cell array, control logic, a voltage generator, and a read-out circuit. The memory cell array includes memory cells connected to bit lines. Each memory cell includes a variable resistance element to store data. The control logic receives a read command and generates a voltage control signal for generating a plurality of read voltages based on the read command. The voltage generator sequentially applies the read voltages to the bit lines based on the voltage control signal. The read-out circuit is connected to the bit lines. The control logic determines values of data stored in the memory cells by controlling the read-out circuit to sequentially compare values of currents sequentially output from the memory cells in response to the plurality of read voltages with a reference current.