There are provided a memory system and an operating method thereof. The memory system includes a semiconductor memory configured to perform a memory operation and perform a suspend operation of suspending a currently performed memory operation and a controller configured to control the memory operation. The controller controls the semiconductor memory to perform the suspend operation in a suspension-allowed period by determining a detailed operation period of the currently performed memory operation.

A memory system includes: a memory device including a memory cell array and a page buffer circuit, the memory device performing a data program operation or a data erase operation, suspending the data program operation or the data erase operation in response to a suspend command, performing a data read operation of storing read data from the memory cell array in the page buffer circuit in response to a read command, and performing a data output operation of outputting the read data stored in the page buffer circuit; and a memory controller outputting a pre-resume command to the memory device between a first time at which the data read operation is complete and a second time at which the data output operation starts.

A memory controller and a storage device including the same are provided. The memory controller includes a memory channel controller configured to perform erase/program, read, and erase/program suspend operations for a flash memory, a flash translation layer configured to control an operation of the memory channel controller by receiving a write/read command, and transmit a completion for the write/read command, a host interface configured to receive the write/read command from a host, transmit the write/read command to the flash translation layer, receive the completion from the flash translation layer, and calculate a write/read latency for the write/read command based on the completion, and a suspend-limit changer configured to dynamically change an erase/program suspend-limit based on the calculated write/read latency, the erase/program suspend-limit being a maximum allowed number of erase/program suspend operations.

A memory system, a memory controller and an operating method are disclosed. By inputting a read command to the memory device, starting to input data for a write command when the write command is input to the memory device while the memory device performs a read sensing operation for the read command, and inputting, to the memory device, data for the write command when input of the write command is started, it is possible to enhance the write performance of the memory system when the memory system executes a write operation after a read operation.

A semiconductor memory device includes a bit line, a first memory cell electrically connected to the bit line, and a sense amplifier connected to the bit lin. The sense amplifier includes a first capacitor element having an electrode that is connected to a first node electrically connectable to the bit line, a first transistor having a gate connected to the first node and a first end connectable to a second node, a second transistor having a first end connected to the second node and a second end connected to a third node, a second capacitor element having an electrode connected to the third node, and a latch circuit connected to the second node.

There are provided a memory system and an operating method thereof. The memory system includes a semiconductor memory configured to perform a memory operation and perform a suspend operation of suspending a currently performed memory operation and a controller configured to control the memory operation. The controller controls the semiconductor memory to perform the suspend operation in a suspension-allowed period by determining a detailed operation period of the currently performed memory operation.

Identifying a faulty memory die in a non-volatile memory storage system. Various methods include: commencing a programming operation of a multi-state block of a subject die, the programming operation including populating a transfer data latch with a first set of data and transferring the data to a first data latch, populating the transfer data latch with a second set of data and transferring the data to second data latch, arranging the first and second data sets in a suitable format of the multi-state block, and writing the data sets to the multi-state block; prior to populating the transfer data latch with the second data set, performing a program suspend and read operation thereby populating the transfer data latch with read data; and comparing the read data to the data contained in the first data latch and, if the comparison results in a match, identifying the subject die as faulty.

In one example, a nonvolatile memory device, such as a NAND flash memory device, includes an array of non-volatile memory cells. Program operations performed by the memory may be suspended (e.g., in order to service a high priority read request). The memory device includes a timer to track a duration of time the program operation is suspended. Upon program resume, the controller applies a program voltage after resume that is adjusted based on the duration of time the program operation is suspended.

According to one embodiment, a semiconductor memory device including a first memory cell; a word line; a bit line; a row decoder; a sense amplifier including a latch circuit; a data register; and a control circuit capable of suspending a write operation during the write operation of the first memory cell to perform a read operation of the first memory cell. In a read operation of the first memory cell performed while suspending the write operation, the row decoder applies a read voltage to the word line, and the sense amplifier transmits data read from the first memory cell to the data register as read data when writing to the first memory cell is completed, and transfers write data held by the latch circuit to the data register as the read data when the writing is not completed.

An apparatus is described. The apparatus includes a memory chip having logic circuitry to suspend application of an erasure voltage, wherein, respective responses of the erasure voltage to a decision to suspend the application of the erasure voltage depend on where the erasure voltage is along its waveform.