Methods, systems, and computer program products for inspecting a pipe in a well using an eddy-current based pipe inspection tool comprises conveying the pipe inspection tool through the well, obtaining a first voltage measurement at an axial position along the pipe from at least one main receiver. The first voltage measurement includes a residual voltage induced in the at least one main receiver by a residual magnetic field resulting from residual magnetism in the pipe. A second voltage measurement is obtained at said axial position along the pipe from at least one second receiver. The first voltage measurement and the second voltage measurement are processed to obtain a processed measurement representing a difference between the first and second voltage measurements. The processed measurement is substantially free of the residual voltage and may be use to estimate a thickness of the pipe and other pipe characteristics.

Embodiments of the present invention include systems, apparatuses, and methods that include a pipeline inspection apparatus containing a carriage, a first member including at least a first and second sensor configured to take a first round of measurements of a pipe, a second member including at least a third and fourth sensor configured to take a first round of measurements of the pipe, and a multiplexer. The first and second members are attached to opposite side members of the carriage. The carriage, first member, and second member are configured to surround a section of the pipe and are movably mountable on the pipe. The multiplexer receives a signal from the at least first, second, third, and fourth sensors and creates a measurement signal.

A method includes deploying an electromagnetic (EM) defect detection tool in a downhole environment having a plurality of tubular strings with different diameters. The method also includes receiving raw measurements collected by the EM defect detection tool. The method also includes deconvolving the raw measurements with another input to obtain deconvolved raw measurements. The method also includes using the deconvolved raw measurements to determine a defect in at least one of the plurality of tubular strings. The method also includes performing, by a device, an operation in response to the determined defect.

Methods and systems for evaluating integrity of a tubular located within a wellbore are provided. The method includes measuring an operation parameter of the wellbore, measuring a feature of the tubular two or more times to produce an integrity log each time the feature is measured, and determining a tubular integrity analysis for the tubular by using the integrity logs and the operation parameter. The tubular integrity analysis contains parameter limitations for the tubular. The method also includes determining if tubular integrity is within or outside the parameter limitations. If the tubular integrity is within the parameter limitations, then determine a duration of integrity for the tubular. If the tubular integrity is outside of the parameter limitations, then determine a location on the tubular for loss of tubular integrity.

To specify a trajectory of an eddy current sensor provided on a polishing table of a substrate polishing apparatus, disclosed is a method of identifying a trajectory of an eddy current sensor as seen from a substrate in a substrate polishing apparatus having a polishing table and a polishing head. The method includes: obtaining a sensor output map as three-dimensional data; polishing the substrate; obtaining a profile of the real-time polishing signal as two-dimensional data; and extracting a trajectory having a profile most similar to the profile of the real-time polishing signal as two-dimensional data from the sensor output map as three-dimensional data and identifying the extracted trajectory as a trajectory of the eddy current sensor as seen from the substrate.

A method of chemical mechanical polishing includes bringing a substrate having a conductive layer disposed over a semiconductor wafer into contact with a polishing pad, generating relative motion between the substrate and the polishing pad, monitoring the substrate with an in-situ electromagnetic induction monitoring system as the conductive layer is polished to generate a sequence of signal values that depend on a thickness of the conductive layer, determining a sequence of thickness values for the conductive layer based on the sequence of signal values, and at least partially compensating for a contribution of conductivity of the semiconductor wafer to the signal values.

The present disclosure relates to a transmitter for a Pulsed Eddy Current system, configured to generate a changing electromagnetic field which induces eddy currents in an object of an electrically conductive material arranged within the electromagnetic field. The transmitter includes a switching device and a transmitter coil configured to be connected to a voltage source. The switching device is arranged for switching a current generated by the voltage source through the transmitter coil. The transmitter coil comprises a plurality of parallel electrically conductive coil layers with a respective damping resistor connected across each of the coil layers, each of the coil layers being connected in series with a respective diode.

An apparatus and a method for inspecting a leak of a battery cell are provided. An apparatus for inspecting a battery cell leak to inspect whether a battery cell leaks includes: a vacuum chamber including an upper chamber and a lower chamber and configured to set a receiving space to a controlled pressure different from an external first pressure, the upper chamber and the lower chamber being arranged to face each other with the receiving space for a battery cell therebetween and providing sealing for the receiving space; a vacuum pipe valve fluidly connected to the receiving space for the battery cell to set the receiving space to a second pressure less than the first pressure; and a thickness measuring sensor configured to measure a before-vacuum thickness of the battery cell under the first pressure and measure an after-vacuum thickness of the battery cell under the second pressure. According to the present disclosure, an apparatus and a method for inspecting a battery cell leak, capable of easily and precisely capturing damage to an exterior material of a battery cell are provided.

The present disclosure relates to a transmitter for a Pulsed Eddy Current system, configured to generate a changing electromagnetic field which induces eddy currents in an object of an electrically conductive material arranged within the electromagnetic field. The transmitter includes a switching device and a transmitter coil configured to be connected to a voltage source. The switching device is arranged for switching a current generated by the voltage source through the transmitter coil. The transmitter coil comprises a plurality of parallel electrically conductive coil layers with a respective damping resistor connected across each of the coil layers, each of the coil layers being connected in series with a respective diode.

A method of non-contact measurement of a thickness (d) of an object of an electrically conductive material by means of a Pulsed Eddy Current, PEC, system including a transmitter coil and a receiver coil. The method includes, after having turned off a current in the transmitter coil, at the receiver coil, measuring a voltage induced by the decaying magnetic field at a first time point, a second time point, and a third time point. The method also includes calculating a total magnetic flux which is generated by the eddy currents in the object at the first time point and picked up by the receiver coil, by comparing the measured flux at the first time point with a predetermined total flux picked up by the receiver coil when no object is present. The method also includes normalizing measured magnetic flux resulting from the eddy currents and picked up by the receiver coil, using the calculated total magnetic flux as a normalization factor such that the normalized eddy current flux is independent of a distance between the object and the transmitter and receiver coils. The method also including, based on the measurements at the first, second and third time points, determining the thickness and the resistivity of the object.