Patent classifications
G01J3/0208
Electronic devices with beam-steered infrared light sensing
An electronic device may include sensors such as a visible-light image sensor for capturing images. The sensors may also include optical sensors that operate at other wavelengths. An infrared light sensor may be used to gather an infrared light spectrum of a target object. The infrared light sensor may have a beam steerer and other adjustable components such as adjustable lenses and adjustable polarizers. During operation, an infrared beam emitted by the infrared light sensor may be steered onto the target object using information from a captured visible-light image and/or other sensor data such as distance sensor data, orientation sensor data, three-dimensional image sensor data, and data from other sensors. Infrared spectra, visible-light camera images, and/or data from other sensors may be used in characterizing target objects so that notifications can be provided to a user and other actions taken.
Electronic device
An electronic device includes at least one grid structure that extends in rows and columns of a pixel array including a plurality of imaging pixels and is structured to separate the imaging pixels from one another to provide optical isolation between two adjacent imaging pixels, a grid shutter coupled to the grid structure and configured to allow a gas to enter the grid structure by opening a passage for the gas or block the gas from entering the grid structure by closing the passage in the grid structure, and a gas detection controller configured to identify the gas flowing into the grid structure based on an image that is acquired by the image sensor when the passage for the gas in the grid structure is opened to allow the gas to be present in the grid structure.
APPARATUS FOR MEASURING RAMAN SPECTRUM AND METHOD THEREOF
An apparatus for measuring time-resolved optical spectrum includes a light source, a sensor for collecting, forming, manipulating and measuring the intensity of the optical radiation, and a controller coupled to the light source and sensor. The sensor includes at least one optical delay element to provide a time delay to a first portion of the optical radiation. The sensor arrangement further includes an optical spectral disperser to split the delayed first portion and the second portion of the optical radiation into dispersed radiation having a plurality of wavelengths, and a sensor element configured to receive each wavelength of the dispersed radiation on a different spatial region, and measure the light intensity associated with each wavelength of the dispersed radiation. The controller collects the light intensity associated with each wavelength of the dispersed radiation measured by the sensor element to form a time-resolved optical spectrum.
OPTICAL ASSEMBLY FOR OPTICAL EMISSION SPECTROSCOPY
An optical assembly for an analyzer instrument for analysis of elemental composition of a sample using optical emission spectroscopy includes: an exciter generating an excitation focused at a target position to produce optical emission from the sample; and an optical arrangement including a light collection arrangement transferring the optical emission from the target position to a detector assembly's detector interface. The light collection arrangement includes: an off-axis parabolic light collecting mirror including an aperture, a lens arrangement including converging and diverging axicon lens portions, the lens arrangement positioned so its optical axis is parallel to that of the light collecting mirror and intersects a surface of the light collecting mirror at the aperture, and an off-axis parabolic focusing mirror having its focal point at the detector interface, the optical axis of the lens arrangement being parallel to that of the focusing mirror and intersects the focusing mirror's surface.
Measuring apparatus
According to one embodiment, there is provided a measuring apparatus including a measurement section and a control section. The measurement section is configured to acquire a response from a sample. The control section is configured to compare a loading obtained by performing principal component analysis in advance with a first evaluation-use loading obtained by performing principal component analysis onto the response acquired from the sample, and to generate a first reliability index for measurement using principal component analysis, in accordance with a comparison result.
Compact apparatus for high-speed chemical spectral signature measurement and method of using same
A multiband IR adjunct (MIRA) sensor to spectroscopically determine the content and the concentration of chemical composition of a targeted object, includes a sensor housing, a first front optics in a first optical channel, a second front optics in the first optical channel, an acousto-optic tunable filter (AOTF), a photo detector (PD), a set of back optics in the first optical channel that focuses polarized narrow-band light beams received from the AOTF device onto the PD, the PD converting the polarized narrow-band light beams into an electrical signal, and a data acquisition unit signal-connected to the PD, the data acquisition unit collecting the electrical signals. Multiple optical channels can be provided within the housing to analyze UV/VIS/near infrared (NIR), short-wavelength infrared (SWIR), mid-wavelength infrared (MWIR), and LWIR wavelength ranges respectively.
SYSTEMS AND METHODS FOR AN ABSORBANCE DETECTOR WITH OPTICAL REFERENCE
Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.
OPTICAL SPECTROMETER AND METHOD FOR SPECTRALLY RESOLVED TWO-DIMENSIONAL IMAGING OF AN OBJECT
The disclosure relates to an optical spectrometer (1) for spectrally resolved two-dimensional imaging of an object (0), comprising a dispersing device (2) arranged to disperse radiation from object (0), a multi-lens array arrangement (3) arranged to receive the dispersed radiation from the dispersing device (2), a two-dimensional detector (4) arranged to receive the dispersed radiation as directed by the multi-lens array arrangement (3), wherein the optical spectrometer (1) further comprises a collimating arrangement (5) for collimating the radiation from object (0) before the radiation reaches the dispersing device (2), the collimating arrangement (5) comprising a diffusing plate (6) for diffusing the radiation and an optical micro-channel component (7) arranged to receive the diffused radiation comprising a plurality of parallel and linear optical micro-channels directed towards the dispersing device (2). The disclosure further relates to a method for spectrally resolved two-dimensional imaging of an object (0).
Optical wall and process sensor with plasma facing sensor
Embodiments disclosed herein include an optical sensor system for use in plasma processing tools. In an embodiment, the optical sensor system, comprises an optically clear body with a first surface and a second surface facing away from the first surface. In an embodiment, the optically clear body further comprises a third surface that is recessed from the second surface. In an embodiment, the optical sensor system further comprises a target over the third surface and a first reflector to optically couple the first surface to the target.
Imaging assisted scanning spectroscopy for gem identification
Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.