Embodiments of the present invention provide a trailed multiple-viewing-angle item inspection system and method of operating the same. The inspection system includes: a trailer vehicle, a radiation inspection device, a power supply device and a power grid connection device. The trailer vehicle is mounted with a power supply chamber within which a power supply device and a power grid connection device are mounted and an inspection chamber within which a radiation inspection device is mounted. The radiation inspection device includes: ray radiation source configured to emit X-rays from various positions, detectors, a body frame, a transfer device, a data and image process system and a display and operation device. The trailed multiple-viewing-angle item inspection system of the present invention can obtain a transmission image containing depth information of an item by its one pass through the device, and achieve a high-speed inspection, a good image quality and a high inspection efficiency of hazardous articles, and its flexibility and movability can meet requirements in various working conditions.

A super-resolution digital tomosynthesis system for imaging an object including a source configured to emit penetrating particles toward an object; a detector configured to acquire a series of projection images of the object in response to the penetrating particles from the source; positioning apparatus configured to position the source and the detector; and an imaging system coupled to the source, the detector, and the positioning apparatus. The imaging system is configured to control the positioning apparatus to position the source in relation to the detector along a scan path and to change a distance between the source and the detector, control the source and the detector to acquire the series of projection images along the scan path with the distance change between the source and detector, and construct a tomographic volume exhibiting super-resolution from data representing the acquired series of projection images.

The present invention pertains to an apparatus and method for X-ray imaging wherein a radiation source comprising rows of discrete emissive locations can be positioned such that these rows are angularly offset relative to rows of sensing elements on a radiation sensor. A processor can process and allocate responses of the sensing elements in appropriate memory locations given the angular offset between source and sensor. This manner of allocation can include allocating the responses into data rows associated with unique positions along a direction of columns of discrete emissive locations on the source. Mapping coefficients can be determined that map allocated responses into an image plane.

A method including inspecting, using an X-ray transmission image, internal defects in a TSV formed in a semiconductor wafer, and detecting the X-rays, and processing an X-ray transmission image. Therein, the detection of X-rays is configured such that: the detection azimuth of the X-rays, and the detection elevation angle of the X-rays relative to the X-ray source are determined on the basis of information on the arrangement interval, depth, and planar shape of structures formed in the sample. The angle of rotation of a rotating stage on which the sample is mounted is adjusted in accordance with the detection azimuth which has been determined, and the X-rays that have been transmitted through the sample are detected with the position of the detector set to the detection elevation angle which has been determined.

The present disclosure relates to the field of a cabinet x-ray incorporating an x-ray tube, an x-ray detector, and an optical camera for the production of organic and non-organic images. The computing device receives data including video data from an optical camera, a laser detector, an infrared detector, an ultrasonic detector, or a weight scale or pressure sensor, and determines automatically, based on the resultant data, if a sample/specimen has been left in the sample chamber. In particular, the disclosure relates to a system and method with corresponding apparatus for automatic detection if a sample/specimen has been left in the sample chamber without having to open the chamber door.

In one embodiment, an automated high-speed X-ray inspection tool may emit, by an X-ray source, an X-ray beam to an object of interest with a portion of the X-ray beam penetrating through the object of interest. The automated high-speed X-ray inspection tool may capture, by an X-ray sensor, one or more X-ray images of the object of interest based on the portion of the X-ray beam that penetrates through the object of interest. Each of the X-ray images may be captured with a field of view of at least 12 million pixels.

An X-ray diagnosis apparatus according to an embodiment includes processing circuitry configured: to acquire a two-dimensional X-ray image of an examined subject imaged in a first imaging process; to designate at least one track on which an X-ray generator is to move in a second imaging process to be performed after the first imaging process; and to perform a predicting process of predicting, on the basis of the two-dimensional X-ray image and the track, an artifact that is to occur when the second imaging process is performed by using the track.

An X-ray diagnosis apparatus according to an embodiment includes processing circuitry configured: to acquire a two-dimensional X-ray image of an examined subject imaged in a first imaging process; to designate at least one track on which an X-ray generator is to move in a second imaging process to be performed after the first imaging process; and to perform a predicting process of predicting, on the basis of the two-dimensional X-ray image and the track, an artifact that is to occur when the second imaging process is performed by using the track.

A super-resolution digital tomosynthesis system for imaging an object including a source configured to emit penetrating particles toward an object; a detector configured to acquire a series of projection images of the object in response to the penetrating particles from the source; positioning apparatus configured to position the source and the detector; and an imaging system coupled to the source, the detector, and the positioning apparatus. The imaging system is configured to control the positioning apparatus to position the source in relation to the detector along a scan path and to change a distance between the source and the detector, control the source and the detector to acquire the series of projection images along the scan path with the distance change between the source and detector, and construct a tomographic volume exhibiting super-resolution from data representing the acquired series of projection images.

The present invention relates to a system (10) for X-ray dark field, phase contrast and attenuation tomosynthesis image acquisition. The system comprises an X-ray source (20), an interferometer arrangement (30), an X-ray detector (40), a control unit (50), and an output unit. A first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector. An examination region is located between the X-ray source and the X-ray. The first axis extends through the examination region, and the examination region is configured to enable location of an objection to be examined. The interferometer arrangement is located between the X-ray source and the X-ray detector. The interferometer arrangement comprises a first grating (32) and a second grating (34). A second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating. The control unit is configured to control movement of the X-ray source and/or movement of the X-ray detector to provide a plurality of image acquisition states, wherein the X-ray source and X-ray detector are configured to operate to acquire image data. For each of the plurality of image acquisition states the first axis extends through the examination region at a different angle. The control unit is configured to control movement of the first grating or movement of the second grating in a lateral position direction perpendicular to the second axis. For each of the acquisition states the first grating or second grating is at a different lateral position of a plurality of lateral positions. The output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data.