G01R31/2836

Apparatus and method for verifying operation of air data probes

A method, comprises: receiving measured air pressure data from each air data probe on a vehicle; receiving a first set of data from at least one sensor system on the vehicle; determining predicted noise levels for each air data probe using a noise modelling system and the received first set of data; determining a transmission loss for each air data probe; determining if any air data probe is faulty by determining if an transmission loss of any of the air data probes is greater than a first threshold value, where an air data probe is deemed faulty if its transmission loss is greater than the first threshold value; and if the transmission loss of any of the air data probes is greater than the first threshold value, then generating a signal to indicated that at least one air data probe is faulty.

Electrical equipment diagnostic systems
10942211 · 2021-03-09 · ·

An electrical equipment diagnostic system can include an electrical equipment and a sensor device controlled by a user that takes a first measurement of a first parameter of the electrical equipment while the electrical equipment is operating. The system can also include a controller communicably coupled to the sensor device, where the controller includes a storage repository, where the storage repository includes at least one threshold value and at least one algorithm. The controller can receive the first measurement from the sensor device, and process the at least one first algorithm using the first measurement. The controller can also identify a problem with the electrical equipment based on results of the at least one first algorithm, and instruct the user to perform specific tasks to correct the problem with the electrical equipment.

Direction-to-fault and zone-based distance-to-fault electric power sectionalizer systems

Electric power Fault detection, isolation and restoration (FDIR) systems using smart switches that autonomously coordinate operations to minimize the number of customers affected by outages and their durations, without relying on communications with a central controller or between the smart switch points. The smart switches typically operate during the substation breaker reclose cycles while the substation breakers are open, which enables the substation breakers to reclose successfully to restore service within their normal reclosing cycles. Alternatively, the smart switch may be timed to operate before the substation breakers trip to effectively remove the substation breakers from the fault isolation process. Both approaches allow the FDIR system to be installed with minimal reconfiguration of the substation protection scheme.

Methods and apparatus for online timing mismatch calibration for polar and segmented power amplifiers

An apparatus and methods for timing mismatch in a power amplifier includes a segmented PA with two-path timing mismatch calibration to improve ACLR performance over different signal transitions, process, voltage and temperature (PVT) variations and device aging; a fast and efficient algorithm for measuring and calibrating the delay of two paths (signal path and control path); a signal magnitude variation detection circuit, such as flash ADC, with improved comparator's performance for RF signal processing and minimum delay. A method for choosing the threshold voltage of the magnitude variation detection circuit, according to status of the signals and orthogonal frequency-division multiplexing (OFDM) related standards; other critical blocks.

Method for locating open circuit failure point of test structure

The present application discloses a method for locating an open circuit failure point of a test structure, which includes the following steps: step 1: providing a sample formed with a test structure, a first metal layer pattern and a second metal layer pattern of the test structure forming a series resistor structure through each via; step 2: performing a first active voltage contrast test to the sample to show an open circuit point and making a first scratch mark at an adjacent position of the open circuit point; step 3: forming a coating mark at the first scratch mark on the sample; step 4: performing a second active voltage contrast test to the sample to show the open circuit point and locating a relative position of the open circuit point by using a position of the coating mark as a reference position.

Abnormality Prompting Method and Intelligent Socket
20210036469 · 2021-02-04 ·

An abnormality prompting method and an intelligent socket (30) are provided. Prompting is performed when a home appliance runs abnormally by means of the intelligent socket (30). The method includes: the intelligent socket (30) receives a state message from a first home appliance (S202), and the state message includes indication information used for indicating a current working mode of the first home appliance; the intelligent socket (30) obtains an actual value of a working parameter of the first home appliance (S203); the intelligent socket (30) determines a working state of the first home appliance according to the actual value of the working parameter and a maximum value of the working parameter allowed by the working mode (S204); when determining that the working state of the first home appliance is an abnormal state, the intelligent socket (30) outputs a prompt message (S205).

SYSTEMS AND METHODS FOR FALSE-POSITIVE REDUCTION IN POWER ELECTRONIC DEVICE EVALUATION

Systems and methods of testing the health of vehicular power devices are disclosed herein. A method may include producing operating points as a function of cycling current (I.sub.ds) and voltage drain to source (V.sub.ds) when a subject device is conducting current. The method may further include determining a mean of moving distribution to adapt a center of the moving distribution contrasted with a plurality of known healthy devices. The method may also include indicating an imminent fault in the subject device based upon a discontinuity among operating points above a threshold.

Autonomous electric power fault detection, isolation and restoration systems

Fault detection, isolation and restoration systems for electric power systems using smart switch points that autonomously coordinate operations to minimize the number of customers affected by outages and their durations, without relying on communications with a central controller or between the smart switch points. Each smart recloser can be individually programmed to operate as a tie-switch, a Type-A (normal or default type) sectionalizer, or a Type-B (special type) sectionalizer. The Type-A recloser automatically opens when it detects a fault, uses a direction-to-fault and zone-based distance-to-fault operating protocol, and stays as is with no automatic opening when power (voltage) is lost on both sides of the switch. The Type-B sectionalizer does the same thing and is further configured to automatically open when it detects that it is deenergized on both sides for a pre-defined time period, and to operate like a tie-switch once open.

Real time operational leakage current measurement for probe heater PHM and prediction of remaining useful life

A system for an aircraft includes a heater comprising a resistive heating element and insulation surrounding the resistive heating element. A first current flows into the resistive heating element to provide heat and a second current flows out of the resistive heating element. The system further includes a leakage sensor configured to produce a leakage sensor signal representing a leakage current from the heater and a prediction processor configured to predict heater failure based on the leakage sensor signal.

CRACK DETECTION CHIP AND CRACK DETECTION METHOD USING THE SAME
20210018553 · 2021-01-21 ·

A crack detection chip includes a chip which includes an internal region and an external region surrounding the internal region, a guard ring formed inside the chip along an edge of the chip to define the internal region and the external region, an edge wiring disposed along an edge of the internal region in the form of a closed curve and a pad which is exposed on a surface of the chip and is connected to the edge wiring. The edge wiring is connected to a Time Domain Reflectometry (TDR) module which applies an incident wave to the edge wiring through the pad, and detects a reflected wave formed in the edge wiring to detect a position of a crack.