The present invention relates to an analysis of a waveform of a signal. A waveform of the signal is divided into multiple sections and a signal integrity identifier is assigned to each section. Accordingly, a representation of the respective signal integrity identifier may be provided for each section of the waveform. The representation of the signal integrity identifier may comprise an abstract representation, for example a graphical element, an alphanumeric element, a color or even an audio signal.

Apparatuses of a noise measurement system and methods for using the same are disclosed. In one embodiment, a noise measurement system may include a plurality of probe groups electrically coupled to a plurality of DUTs, where a probe group in the plurality of probe groups includes multiple channels, and where the multiple channels of each probe group are bundled as a group for reducing electromagnetic interference among the plurality of probe groups, and wherein the group is shielded from corresponding signal groups of other DUTs with a connection to a circuit ground of the noise measurement system for reducing ground loop generated signal interference. The noise measurement system may further include a controller configured to perform noise measurement.

The present invention relates to a method for training a signal characterization neural network. The method comprises the steps of: providing a measurement signal having at least one distortion; assigning at least one predefined signal integrity identifier to a corresponding distortion within the measurement signal; generating at least one input training vector based on the provided measurement signal and the corresponding assigned signal integrity identifier; and applying the generated input training vector on input terminals of the signal characterization neural network for training the signal characterization neural network. The present invention also relates to a method for automatically characterizing a measurement signal. The present invention further relates to a measurement apparatus and a corresponding method for analyzing a waveform signal.

A semiconductor system includes a first semiconductor device suitable for outputting an external command and a termination control signal and being inputted with a data signal; and a second semiconductor device suitable for generating a termination enable signal in response to the external command and the termination control signal, generating a pull-up signal in response to the termination enable signal, and generating a pull-down signal in response to the termination enable signal and a test mode signal.

A method for identifying the noise figure of a device under test is described. A signal generator that outputs the modulated signal, a device under test and an analyzer are provided. The signal generator is connected with the analyzer directly wherein at least two error vector magnitude measurements are performed. The signal generator is connected with the device under test and the device under test is connected with the analyzer wherein at least two error vector magnitude measurements are performed. The noise contribution of the device under test is determined from the error vector magnitude measurements performed. A gain measurement is performed on the device under test. The noise figure of the device under test is calculated based on the noise contribution of the device under test obtained and the gain of the device under test obtained. Further, a measurement system is described.

A controller system includes a microprocessor having a sequencer configured to output at least one spare multiplexor control signal, a memory, and a plurality of sensor inputs. At least one stimulation circuit is connected to a sensor signal line. The at least one stimulation circuit being connected to the at least one spare multiplexor control signal. The stimulation circuit is configured such that a state of the at least one spare multiplexor control signal controls a state of the stimulation circuit.

A digital circuit includes a scan chain which loads data into and unloads data from the digital circuit. Checking circuitry is coupled to the scan chain and generates a first digital signature based on data indicative of a pre-testing status of the digital circuit as the data is unloaded from the digital circuit via the scan chain. When testing is completed, the data is restored to the digital circuit via the scan chain. The checking circuitry generates a second digital signature as the data is loaded into the digital circuit. The first digital signature is compared to the second digital signature to verify an integrity of the process. A specific data pattern may be loaded into the scan chain as the data is unloaded. An output of the scan chain may be monitored to detect the pattern and an error signal may be generated based on when the pattern is detected.

A receiver includes a sampler that samples first voltage levels corresponding to a first logical value of data and second voltage levels corresponding to a second logical value of the data, based on a sampling clock. An equalizer receives and adjusts the first and second voltage levels. A clock and data recovery circuit recovers the sampling clock, based on the first and second voltage levels from the equalizer. An eye opening measurement circuit: (1) tracks a first sigma level by a first step unit depending on upper voltage levels greater than a first reference voltage level among the first voltage levels, (2) tracks a second sigma level by a second step unit depending on lower voltage levels less than a second reference voltage level among the second voltage levels, and (3) calculates a difference between the first sigma level and the second sigma level.

A glitch measurement device is coupled to a circuit under-test and includes a counter circuitry and a detector circuitry. The counter circuitry is coupled to the circuit under-test, and is configured to perform a first counting operation according to an input signal transmitted to the circuit under-test to generate a first count signal, and to perform a second counting operation according to an output signal outputted from the circuit under-test to generate a second count signal. The detector circuitry is coupled to the circuit under-test and the counter circuitry, and is configured to receive the first count signal and the second count signal according to the input signal, and to generate a glitch indication signal according to the first count signal and the second count signal.

A noise source monitoring apparatus includes: a first storage unit storing captured image data; a second storage unit storing observed waveform data; a processing unit calculating, for each of the switch units, the degree of correlation between occurrence of a noise and operation of the switch unit, based on the captured image data and the observed waveform data; and a display control unit causing a display unit to display information indicating the degree of correlation.