A detector circuit included in a computer system filters the voltage level of a power supply node to generate filtered signals. The detector circuit either compares the filtered signals or samples the filtered signal and compares the samples to reference levels to detect changes in the voltage level of the power supply node that exceed thresholds for magnitude and duration. A control circuit included in the computer system generates, using the glitch signal, control signals that can be used to change operating parameters of functional circuits included in the computer system.

A multi-bit flip-flop (MBFF) has flip-flops connected to form an internal scan chain. One of the flip-flops outputs a first data-out signal at a first data output terminal of the MBFF, and includes a selection circuit, a latch-based circuit, and a data-out stage circuit. The selection circuit transmits a data signal or a test signal to an output node of the selection circuit to serve as an input signal. The latch-based circuit generates a first signal according to the input signal. The data-out stage circuit receives the first signal, and generates the data-out signal according to the first signal. When the MBFF operates in a test mode, the selection circuit transmits the test signal to serve as the input signal, and the data-out stage circuit keeps the data-out signal at a fixed voltage level regardless of a voltage level of the test signal.

The present disclosure generally relates to a method for generating a signal test specification, a data processing circuit, and a cloud system. The signal test specification is to be applied by a measurement device for testing a device under test. At least one first voltage requirement and at least one first timing requirement for a first power rail signal of the device under test to be tested are stored in a structured file format. At least one second voltage requirement and at least one second timing requirement for a second power rail signal of the device under test to be tested are stored in a structured file format. At least one relative constraint having a relation between at least two of voltage requirements and timing requirements is stored in a structured file format.

The invention discloses an extended joint test action group based controller and a method for functional debugging using the extended joint test action group based controller. The object of the invention to lower the power dissipation (dynamic and leakage) but providing the same functionality of the testing and debugging procedures at the same time will be solved by an extended joint test action group (JTAG) controller for testing flip-flops of a register of an integrated circuit (IC) using a design for testing scan infrastructure on the IC which comprises at least one scan chain, wherein an external debugger is connected to the design for testing scan infrastructure via the JTAG controller which is extended by a debug controller, whereas a feedback loop is formed from an output of the scan chain to an input multiplexer of the scan chain which is activated according to the extended JTAG controller.

In an embodiment a method for testing a digital electronic circuit includes coupling an external test equipment to a digital electronic circuit in order to apply an external voltage signal to the digital electronic circuit when an automatic test pattern generation (ATPG) procedure with a given test pattern is performed, wherein a value of the external voltage signal is controlled by the external test equipment and measuring, at the external test equipment, the digital supply voltage at an output of the voltage regulator and at an input of the internal digital circuitry, wherein the external voltage signal is applied to the differential inputs of the op-amp voltage regulator through an adaptation circuit to obtain determined values of the digital supply voltage.

According to one embodiment, a design support device executes a first processing. The first processing includes setting a control value group for a semiconductor element. The semiconductor element includes gates including first and second gates. The control value group includes a first time difference between first and second timings. A voltage is applied to the first gate at the first timing. A voltage is applied to the second gate at the second timing. The first processing includes calculating a characteristic value from an output result when an electrical signal corresponding to the control value group is input to the semiconductor element. The first processing includes calculating a first function from history data including not less than one data set. The data set includes the control value group and a score based on the characteristic value. The design support device sets a new control value group.

A full load test system of an electrical power converter and the test method thereof is disclosed. The full load test method of the electrical power converter comprises the following steps: (a) providing a power converter under test (PCUT); (b) configuring the PCUT in/on a test circuit; (c) serially connecting the PCUT with at least one bidirectional power converter in the test circuit; (d) connecting the test circuit to an alternating current low voltage three-phase power source; and (e) performing a test of the PCUT under full-load condition.

A regenerative load system includes a voltage input and a load current regulator electrically connected to the voltage input. The system includes a fly back rectifier electrically connected to the load current regulator. A current output is electrically connected to the fly back rectifier. A system for regeneratively testing electrically powered equipment includes a power source. The system includes a unit under test (UUT) having a voltage input electrically connected to the power source, a regenerative load system electrically connected to the UUT. The regenerative load system (RLS) includes a RLS voltage input electrically connected to the UUT, a load current regulator electrically connected to the RLS voltage input, a fly back rectifier electrically connected to the load current regulator, and a current output electrically connected to the fly back rectifier. The current output is configured and adapted to provide current the UUT and/or the power source.

A system and methods for adaptive bi-direction audio wiring, in which a circuit may be attached via a headset port using RJ9 pin configurations in a phone handset, and dynamically test many different phone handset configurations for optimal audio pathing and processing for speaker and microphone audio generation with minimal noise, static, or power fluctuation.

Methods of a scan partitioning a circuit are disclosed. One method includes calculating a power score for circuit cells within a circuit design based on physical cell parameters of the circuit cells. For each of the circuit cells, the circuit cell is assigned to a scan group according to the power score for the circuit cell and a total power score for each scan group. A plurality of scan chains is formed. Each of the scan chains is formed from the circuit cells in a corresponding scan group based at least in part on placement data within the circuit design for each of the circuit cells. Interconnect power consumption can be assessed to determine routing among circuit cells in the scan chains.