An apparatus for performing multiple tests on a device under test (DUT) are provided. The apparatus includes at least one non-transitory computer-readable medium having stored thereon computer-executable instructions and at least one processor coupled to the at least one non-transitory computer-readable medium. The computer-executable instructions are executable by the at least one processor and cause the apparatus to perform operations of inputting a plurality of test patterns to a test apparatus, performing each of the plurality of test patterns on the DUT without interruption, and obtaining a respective result for the DUT in response to each of the plurality of test patterns.

An integrated circuit includes a functional circuit (10) having a power grid (20) with a set of power grid points (30.i) for monitoring; and an electronic monitoring circuit (100) that has a variably operable reference circuit (150) responsive to an input register (155) and having an output, comparison circuitry (110) having plural outputs and having a first input coupled to the output of said variably operable reference circuit (150) and a set of second inputs each second input coupled to a respective one of said power grid points (30.i); and an output register (120) having at least two register bit cells (120.i) respectively fed by the plural outputs of said comparison circuitry (110.i). Other integrated circuits, and processes of testing and of manufacturing are also disclosed.

An integrated circuit includes a functional circuit (10) having a power grid (20) with a set of power grid points (30.i) for monitoring; and an electronic monitoring circuit (100) that has a variably operable reference circuit (150) responsive to an input register (155) and having an output, comparison circuitry (110) having plural outputs and having a first input coupled to the output of said variably operable reference circuit (150) and a set of second inputs each second input coupled to a respective one of said power grid points (30.i); and an output register (120) having at least two register bit cells (120.i) respectively fed by the plural outputs of said comparison circuitry (110.i). Other integrated circuits, and processes of testing and of manufacturing are also disclosed.

Fault detection circuitry and a corresponding method are disclosed. A count value that is indicative of the switching period of a PWM signal is determined and it is determined whether this count value is between a first threshold and a second threshold. An error signal is generated when the switching period is not between the first and the second threshold. A count value that is indicative of the switch-on duration of the PWM signal is determined and compared with a switch-on threshold in order to determine whether the switch-on duration is greater than a maximum switch-on duration. A count value that is indicative of the switch-off duration of the PWM signal is determined and compared with a switch-off threshold in order to determine whether the switch-off duration is greater than a maximum switch-off duration. Error signals can be generated when the durations are greater than the maximum durations.

Fault detection circuitry and a corresponding method are disclosed. A count value that is indicative of the switching period of a PWM signal is determined and it is determined whether this count value is between a first threshold and a second threshold. An error signal is generated when the switching period is not between the first and the second threshold. A count value that is indicative of the switch-on duration of the PWM signal is determined and compared with a switch-on threshold in order to determine whether the switch-on duration is greater than a maximum switch-on duration. A count value that is indicative of the switch-off duration of the PWM signal is determined and compared with a switch-off threshold in order to determine whether the switch-off duration is greater than a maximum switch-off duration. Error signals can be generated when the durations are greater than the maximum durations.

An integrated circuit comprises a first functional unit and one or more other functional units. The first functional unit has an input for receiving data and an output for providing data. The integrated circuit tests and operates the first functional unit. Testing comprises: connecting the input of the first functional unit to the output of the first functional unit, thereby generating a loopback path from the output of the first functional unit to the input of the first functional unit; loading a test pattern onto the first functional unit; feeding a test clock signal comprising one or more clock edges, thereby prompting the first functional unit to transform the test pattern; and reading the transformed test pattern. Operating the first functional unit comprises: connecting the input of the first functional unit to an output of the other functional units; and feeding a normal clock signal to the first functional unit.

An integrated circuit comprises a first functional unit and one or more other functional units. The first functional unit has an input for receiving data and an output for providing data. The integrated circuit tests and operates the first functional unit. Testing comprises: connecting the input of the first functional unit to the output of the first functional unit, thereby generating a loopback path from the output of the first functional unit to the input of the first functional unit; loading a test pattern onto the first functional unit; feeding a test clock signal comprising one or more clock edges, thereby prompting the first functional unit to transform the test pattern; and reading the transformed test pattern. Operating the first functional unit comprises: connecting the input of the first functional unit to an output of the other functional units; and feeding a normal clock signal to the first functional unit.

One embodiment is a system including a data collector located in a cable network for capturing multi-tone signals traversing the cable network; a data repository located in a cloud network and having an interface for communicating with the data collector and for storing the multi-tone signals captured by the data collector and network data associated with the cable network; and a central server including a memory element storing Predictive Services Management (PSM) algorithms comprising instructions and associated data and a processor operable to execute the PSM algorithms. The central server is configured for detecting a fault in the cable network and identifying a segment associated with the fault; determining a maximum tap magnitude for the fault; calculating an aggregate tap magnitude for the fault; and classifying a severity of the fault based at least in part on the maximum tap magnitude and the aggregate tap magnitude.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system comprises pre-qualifying test components, functional test components, a controller, a transceiver, and a switch. The pre-qualifying test components are configured to perform pre-qualifying testing on a device under test. The functional test components are configured to perform functional testing on the device under test. The controller is configured to direct selection between the pre-qualifying testing and functional testing. The transceiver is configured to transmit and receive signals to/from the device under test. The switch is configured to selectively couple the transceiver to the pre-qualifying test components and functional test components.

A semiconductor device capable of suppressing a sharp change in current consumption and a self-diagnosis control method thereof are provided. According to one embodiment, the semiconductor device 1 includes a logic circuit, which is a circuit to be diagnosed, a self-diagnostic circuit for diagnosing the logic circuit, and a diagnostic control circuit for controlling the diagnosis of the logic circuit by the self-diagnostic circuit, and the diagnostic control circuit includes a diagnostic abort control circuit for gradually stopping the diagnosis of the logic circuit by the self-diagnostic circuit when the semiconductor device receives a stop signal instructing the stop of the diagnosis of the logic circuit by the self-diagnostic circuit.