Systems and methods for assembling and developing a System-on-a-chip (SoC) by using templates and designer input data are described. One of the methods includes receiving a request for generating a design of the SoC. In response to the request, a template database is accessed to provide templates of a plurality of designs of systems-on-chips (SoCs). Each of the templates is for a technology application. The method includes receiving a selection of one of the templates. The one of the templates represents components of the SoC. The method also includes receiving a configuration file including configuration data input for the components of the SoC. The method includes compiling the configuration file and a definition file for the SoC to generate design files for the SoC.

A method and a system for identifying glitches in a circuit are provided. The method includes identifying a sub-circuit that drives a net from a plurality of nets in a circuit, generating a glitch detection circuit comprising dual-rail encoding from the net to a signal driver of the sub-circuit, modifying the sub-circuit to include the glitch detection circuit, generating an optimized hardware design language (HDL) output file associated with the glitch detection circuit and the sub-circuit, and performing a simulation or a formal verification of the optimized HDL output file to determine whether a signal associated with the net glitches.

A method and a system for identifying glitches in a circuit are provided. The method includes identifying a sub-circuit that drives a net from a plurality of nets in a circuit, generating a glitch detection circuit comprising dual-rail encoding from the net to a signal driver of the sub-circuit, modifying the sub-circuit to include the glitch detection circuit, generating an optimized hardware design language (HDL) output file associated with the glitch detection circuit and the sub-circuit, and performing a simulation or a formal verification of the optimized HDL output file to determine whether a signal associated with the net glitches.

A computer-based high-level synthesis (HLS) technique for circuit implementation includes providing a library as a data structure, wherein the library includes a function configured to perform a vector operation using one or more vector(s). The library can include a software construct defining a variable number of elements included in the vector(s). The number of elements can be determined from a variable included in an HLS application that uses the library to perform the function. The variable can specify an arbitrary positive integer value. The method also can include generating a circuit design from the HLS application. The circuit design can implement the function in hardware to perform the vector operation in one clock cycle. A data type of each element of the vector(s) may be specified as a further software construct within the library and determined from a further variable of the HLS application.

A computer-based high-level synthesis (HLS) technique for circuit implementation includes providing a library as a data structure, wherein the library includes a function configured to perform a vector operation using one or more vector(s). The library can include a software construct defining a variable number of elements included in the vector(s). The number of elements can be determined from a variable included in an HLS application that uses the library to perform the function. The variable can specify an arbitrary positive integer value. The method also can include generating a circuit design from the HLS application. The circuit design can implement the function in hardware to perform the vector operation in one clock cycle. A data type of each element of the vector(s) may be specified as a further software construct within the library and determined from a further variable of the HLS application.

A system for verifying signals in electronic circuits that includes a waveform translator and a test-and-measurement instrument. The waveform translator is configured to receive a simulated waveform for a node of a simulated prototype circuit and to translate the simulated waveform into a translated waveform. The test-and-measurement instrument is configured to obtain a measured waveform and to determine a deviation of the measured waveform from the simulated waveform using the translated waveform.

A system for verifying signals in electronic circuits that includes a waveform translator and a test-and-measurement instrument. The waveform translator is configured to receive a simulated waveform for a node of a simulated prototype circuit and to translate the simulated waveform into a translated waveform. The test-and-measurement instrument is configured to obtain a measured waveform and to determine a deviation of the measured waveform from the simulated waveform using the translated waveform.

A method of manufacturing a semiconductor device includes reducing errors in a migration of a first netlist to a second netlist, the first netlist corresponding to a first semiconductor process technology (SPT), the second first netlist corresponding to a second SPT, the first and second netlists each representing a same circuit design, the reducing errors including: inspecting a timing constraint list corresponding to the second netlist for addition candidates; generating a first version of the second netlist having a first number of comparison points relative to a logic equivalence check (LEC) context, the first number of comparison points being based on the addition candidates; performing a LEC between the first netlist and the first version of the second netlist, thereby identifying migration errors; and revising the second netlist to reduce the migration errors, thereby resulting in a second version of the second netlist.

A method of manufacturing a semiconductor device includes reducing errors in a migration of a first netlist to a second netlist, the first netlist corresponding to a first semiconductor process technology (SPT), the second first netlist corresponding to a second SPT, the first and second netlists each representing a same circuit design, the reducing errors including: inspecting a timing constraint list corresponding to the second netlist for addition candidates; generating a first version of the second netlist having a first number of comparison points relative to a logic equivalence check (LEC) context, the first number of comparison points being based on the addition candidates; performing a LEC between the first netlist and the first version of the second netlist, thereby identifying migration errors; and revising the second netlist to reduce the migration errors, thereby resulting in a second version of the second netlist.

Concepts, systems and methods are described for generating a quantum circuit from a Unitary Coupled Cluster (UCC) ansatz which represents the excitation of a reference state by a parameterised operator including excitation operators. The UCC ansatz includes multi-qubit Pauli operators, referred to as Pauli strings, determined from each excitation operator. The method comprises partitioning the Pauli strings into mutually commuting sets and sequencing the Pauli strings by set. Pauli gadgets are then generated from the Pauli strings by Trotterization, the Pauli gadgets having the same sequencing by set as the Pauli strings. Each set of Pauli gadgets is diagonalised to convert the Pauli gadgets into phase gadgets which are then transformed into one- and two-qubit native gates to generate the quantum circuit.