A wiring quality test method includes the following: a respective wiring result topological structure and a respective expected topological structure corresponding to each signal to be tested in a set of signals to be tested are determined based on a wiring layout; for each signal to be tested, the wiring result topological structure is compared with the expected topological structure, to obtain a topological structure comparison result corresponding to the signal to be tested; in response to determining that the topological structure comparison result is greater than a preset threshold, it is determined a test result indicating that wiring for the signal to be tested is inappropriate; and a quality test report is generated based on test results of the signals to be tested.

Techniques for designing and implementing networks-on-chip (NoCs) are provided. For example, a computer-implemented method for programming a network-on-chip (NoC) onto an integrated circuit includes determining a first portion of a plurality of registers to potentially be included in a NoC design, determining routing information regarding datapaths between registers of the first portion of the plurality of registers, and determining an expected performance associated with the first portion of the plurality of registers. The method also includes determining whether the expected performance is within a threshold range, including the first portion of the plurality of registers and the datapaths in the NoC design after determining that the expected performance is within the threshold range, and generating instructions configured to cause circuitry corresponding to the NoC design to be implemented on the integrated circuit.

To increase the efficiency of an electronic design automation (EDA) process, for a putative integrated circuit design for which computerized routing is to be carried out within an EDA program, run a sweep line algorithm selectively on active metal shapes in said putative design for different layers, to determine a total number of said active metal shapes, and compute a memory requirement for computerized routing on said active shapes based on said total number of said active shapes. For said putative design, compute a memory requirement for computerized routing on inactive metal shapes based on a total number of said inactive shapes; partition said putative design into a plurality of partitions, based on said memory requirement for computerized routing on said active and inactive shapes, such that an available system memory is not exceeded. Separately run a routing job on each of said plurality of partitions.

To increase the efficiency of an electronic design automation (EDA) process, for a putative integrated circuit design for which computerized routing is to be carried out within an EDA program, run a sweep line algorithm selectively on active metal shapes in said putative design for different layers, to determine a total number of said active metal shapes, and compute a memory requirement for computerized routing on said active shapes based on said total number of said active shapes. For said putative design, compute a memory requirement for computerized routing on inactive metal shapes based on a total number of said inactive shapes; partition said putative design into a plurality of partitions, based on said memory requirement for computerized routing on said active and inactive shapes, such that an available system memory is not exceeded. Separately run a routing job on each of said plurality of partitions.

A constraint graph for a candidate routing solution is created; each node in the graph represents a position of an end of a metal shape and each arc in the graph represents a design rule constraint between two of the nodes. A solution graph is computed, for at least a portion of the constraint graph, using a shape processing algorithm. The solution graph is checked for design rule violations to generate one or more violation graphs. A constraint window and a selection of one or more arcs for at least one of the violation graphs are generated. The candidate routing solution is revised, based on one or more violated design rules corresponding to at least one of the selected arcs within the constraint window. Optionally, an integrated circuit is fabricated in accordance with the revised solution.

A constraint graph for a candidate routing solution is created; each node in the graph represents a position of an end of a metal shape and each arc in the graph represents a design rule constraint between two of the nodes. A solution graph is computed, for at least a portion of the constraint graph, using a shape processing algorithm. The solution graph is checked for design rule violations to generate one or more violation graphs. A constraint window and a selection of one or more arcs for at least one of the violation graphs are generated. The candidate routing solution is revised, based on one or more violated design rules corresponding to at least one of the selected arcs within the constraint window. Optionally, an integrated circuit is fabricated in accordance with the revised solution.

Examples described herein provide a computer-implemented method that includes identifying, by a processing device, a victim/aggressor pair of nets for an integrated circuit. The method further includes severing nets of the victim/aggressor pair of nets. The method further includes swapping severed segments of the nets. The method further includes rerouting the nets subsequent to swapping the severed segments of the nets.

Examples described herein provide a computer-implemented method that includes identifying, by a processing device, a victim/aggressor pair of nets for an integrated circuit. The method further includes severing nets of the victim/aggressor pair of nets. The method further includes swapping severed segments of the nets. The method further includes rerouting the nets subsequent to swapping the severed segments of the nets.

An integrated device product having objects positioned in accordance with in-situ constraints. Said in-situ constraints comprise predetermined constraints and their local modifications. These local modifications, individually formulated for a specific pair of objects, account for on-the-spot conditions that influence the optimal positioning of the objects. The present invention improves the yield of integrated devices by adding local process modification distances to the predetermined constraints around processing hotspots thus adding extra safety margin to the device yield.

A method of constructing an RF filter comprises designing an RF filter that includes a plurality of resonant elements disposed, a plurality of non-resonant elements coupling the resonant elements together to form a stop band having a plurality of transmission zeroes corresponding to respective frequencies of the resonant elements, and a sub-band between the transmission zeroes. The non-resonant elements comprise a variable non-resonant element for selectively introducing a reflection zero within the stop band to create a pass band in the sub-band. The method further comprises changing the order in which the resonant elements are disposed along the signal transmission path to create a plurality of filter solutions, computing a performance parameter for each of the filter solutions, comparing the performance parameters to each other, selecting one of the filter solutions based on the comparison of the computed performance parameters, and constructing the RF filter using the selected filter solution.