A nonvolatile memory device includes memory cell region including a first metal pad and a peripheral circuit region including a second metal pad, is connected to the memory cell region by the first metal pad and the second metal pad and includes including an address decoder and a page buffer circuit located on a first substrate. A memory cell array is provided in the memory cell region, which includes a first vertical structure on a second substrate. The first vertical structure includes first sub-blocks and first via areas in which one or more through-hole vias are provided, and through-hole vias pass through the first vertical structure. A control circuit in the peripheral circuit region groups the memory blocks into a plurality of groups based on whether the memory blocks is close to the first via areas and performs address re-mapping.

An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.

A memory system includes a memory device including a plurality of memory units capable of inputting or outputting data individually, and a controller coupled with the plurality of memory units via a plurality of data paths. The controller is configured to perform a correlation operation on two or more read requests among a plurality of read requests input from an external device, so that the plurality of memory units output plural pieces of data corresponding to the plurality of read requests via the plurality of data paths based on an interleaving manner. The controller is configured to determine whether to load map data associated with the plurality of read requests before a count of the plurality of read requests reaches a threshold, to divide the plurality of read request into two groups based on whether to load the map data, and to perform the correlation operation per group.

An electronic apparatus includes a circuit board, a memory chip mounted on the circuit board, a memory controller to control an operation of the memory chip, a conductive pattern including a first control line to connect from a first terminal of the memory chip to a first terminal of the memory chip and a second control line to connect from a second terminal of the memory controller to a second terminal of the memory chip, and a capacitive element to provide a termination voltage. The first control line is connected to the capacitive element and the second control line is not connected to the capacitive element.

An integrated circuit includes a driving circuit and an enable control circuit. The driving circuit is configured to perform a setup operation based on a first driving current and perform a preset operation, using different driving currents, based on a first enable signal and a second enable signal. The enable control circuit is configured to generate the first and second enable signals.

A circuit module with improved line load, may comprise a first line, a first switch, a second line, a second switch and a second driver. The first switch may be on and off to conduct and stop conducting between the first line and a first node. The second switch may be on and off to conduct and stop conducting between the second line and the first node. The second driver, coupled to the second line, may be enabled to drive the second line according to a voltage of a second node, and may be disabled to stop driving the second line. The voltage of the second node may be controlled by a voltage of the first node. When the first switch is on, the second switch may be off. When the second switch is off, the second driver may be enabled.

Systems, methods, circuits, and apparatus including computer-readable mediums for managing page buffer circuits in memory devices are provided. In one aspect, a memory device includes a memory cell array, memory cell lines connecting respective lines of memory cells, and a page buffer circuit including page buffers coupled to the memory cell lines. Each page buffer includes a sensing latch circuit and a storage latch circuit. The sensing latch circuit includes a sensing transistor coupled to a sensing node and at least one sensing latch unit having a first node coupled to the sensing node and a second node coupled to a first terminal of the sensing transistor. The storage latch circuit includes at least one storage latch unit having third and fourth nodes coupled to the sensing node and a gate terminal of the sensing transistor. A second terminal of the sensing transistor is coupled to a ground.

A data processing system includes a compute blade generating a write command to store data and a read command to read the data, and a memory blade. The compute blade has a memory that stores information about performance characteristics of each of a plurality of memories, and determines priority information through which eviction of a cache line is carried out based on the stored information.

A memory device includes a calibration circuit configured to perform a ZQ calibration operation according to a calibration command signal and a calibration power voltage, and a calibration control circuit configured to determine the calibration command signal based on a comparison result obtained by comparing the calibration power voltage level with at least one reference voltage level.

A non-volatile memory device, including a non-volatile memory cell array, a sense amplifier, a random access memory (RAM), and a buffer circuit, is provided. The sense amplifier is configured to generate readout data. The RAM is configured to store write-in data. The buffer circuit generates a detection result according to target data and the readout data, and writes the detection result to the RAM.