Technology for an apparatus is described. The apparatus can include a memory and a storage controller. The storage controller can be configured to receive a search command with one or more parameters that instructs the storage controller to search for a data pattern in data stored in the memory. The storage controller can be configured to search the data stored in the memory for the data pattern according to the one or more parameters included in the search command. The storage controller can be configured to locally search the data in the memory for the data pattern without transferring the data to a processor to perform the search.

A transducer such as a translinear proportional-to-absolute-temperature sensor uses two amplifiers, where each amplifier is used in a variety of modes. The first amplifier generates a measurement voltage though feedback in an analog circuit. The second amplifier samples and integrates the measurement in a switched-capacitor mode, and the output is stored on a capacitor. Then the first amplifier is set to measure its offset. The offset is sampled and integrated by the second amplifier, and the output is stored on a second capacitor. Then the first and second amplifiers are set to buffer the voltages stored on the capacitors. The measurement can then be offset-adjusted by digital or analog means. The adjusted measurement is then available to be used for calibration of, e.g., an image sensor. Other transducers, such as pressure sensors, strain sensors, gyroscopes, magnetometers, accelerometers, and xyz positioning sensors may employ the same dual amplifier approach.

A novel nonlinear impulse sampler is presented that provides a clock sharpening circuit, sampling stage, and post-sampling block. The clock sharpening circuit sharpens the incoming clock while acting as a buffer, and the sharpened clock is fed to the input of the sampling stage. The impulse sampling stage has two main transistors, where one transistor generates the impulse and the other transistor samples the input signal. Post-sampling block processes the sampled signal and acts as a sample and hold circuit. The architecture uses an ultrafast transmission-line based inductive peaking technique to turn on a high-speed sampling bipolar transistor for a few picoseconds. It is shown that the sampler can detect impulses as short as 100psec or less.

Systems and methods for measuring a temperature dependency of a threshold voltage are provided. Disclosed systems can include a shared pre-charge P-type metal-oxide-semiconductor (PMOS) transister, configured to pre-charge an output node to a supply voltage. The system can further include a sensing PMOS transistor, electrically coupled to the shared pre-charge PMOS transistor, configured to discharge the output node to a first voltage at or near the threshold voltage of the sensing PMOS transistor and measure a second voltage at the output node.

A computation circuit includes a computing cell array configured to provide a plurality of physical values respectively corresponding to a plurality of elements of a matrix; a vector input circuit configured to provide a plurality of input voltages corresponding to an input vector to the computing cell array; and a vector output circuit configured to output a plurality of output voltages each corresponding to a dot product between the input vector and a column vector of the matrix according to the plurality of input voltages and the plurality of effective capacitances.

An inverting amplifier includes an input terminal, an output terminal, a PMOS transistor, another PMOS transistor, an NMOS transistor, another NMOS transistor, and a clamp circuit. The PMOS transistors are connected in series between a supply voltage and an output terminal. The NMOS transistors are connected in series between a ground voltage and the output terminal. The clamp circuit is connected to the gate of the other PMOS transistor and the gate of the other NMOS transistor. The clamp circuit includes a switch, a capacitor, another switch, and another capacitor. At least one of the gate of the PMOS transistor and the gate of the NMOS transistor is connected to the input terminal.

An amplifying circuit according to an embodiment includes an input terminal, an output terminal, first and second operational amplifiers, first and second input impedance elements, first to third feedback impedance elements, and an adder. The first (second) operational amplifier includes an inversion input terminal connected to a first (third) node and an output terminal connected to a second (fourth) node. The first (second) input impedance element has one end connected to the input terminal and the other end connected to the first (third) node. The first (second) feedback impedance element has one end connected to the first (third) node and the other end connected to the second (fourth) node. The third feedback impedance element has one end connected to the first node and the other end connected to the fourth node. The adder adds output voltages of the first and second operational amplifiers.

The present disclosure relates to a bootstrapped switch circuit, a track-and-hold circuit, an analog-to-digital converter, a method for operating a track-and-hold circuit, a base station, and a mobile station. The bootstrapped switch circuit comprises an output for an output signal, a first input, a switching element configured to couple the output with a signal from the first input, a bootstrapper capacitor configured to drive the switching element, and a second input coupled to the bootstrapper capacitor.

An N-tap feedforward equalizer (FFE) comprises a set of N FFE taps coupled together in parallel, a filter coupled between the (N−1)th FFE tap and the Nth FFE tap, and a summer coupled to an output of the set of N FFE taps. Each FFE tap includes a unique sample-an-hold (S/H) circuit that generates a unique time-delayed signal and a unique transconductance stage that generates a unique transconductance output based on the unique time-delayed signal. The filter causes the N-tap FFE to have the behavior of greater than N taps. In some examples, the filter is a first order high pass filter that causes coefficients greater than N to have an opposite polarity of the Nth coefficient. In some examples, the filter is a first order low pass filter that causes coefficients greater than N to have the same polarity as the Nth coefficient.

A resistor-capacitor (RC) sensor circuit of an electronic device is driven to a drive voltage using a representative copy of a current that drives an electronic circuit line of the electronic device. The RC sensor circuit is to sample voltages that are indicative of an RC time constant of the electronic circuit line. A first sample voltage is determined by sampling a first representative voltage generated at the RC sensor circuit by driving the RC sensor circuit with the representative copy of the current over a first time period. A second sample voltage is determined by sampling a second representative voltage generated at the RC sensor circuit by driving the RC sensor circuit with the representative copy of the current over a second time period. A ratio of the first sample voltage and the second sample voltage is indicative of the RC time constant of the electronic circuit line.