Provided is a device for detecting a defect of an optical film, comprising a light emitting unit, a reflection unit, a screen, and an image capturing unit, and a method for detecting a defect of an optical film, comprising emitting light to a reflection unit, projecting the light reflected by the reflection unit onto an optical film, capturing an image of a screen which displays a projection shape obtained by projecting the light onto the optical film, and analyzing the image.

This invention discloses an air pipe joint for inspecting a substrate, including a hollow pipe body and a light source. The pipe body comprises a first pipe body and a second pipe body which are bent to and communicated with each other. Free ends of the first pipe body and the second pipe body are respectively an air inlet end for connecting an air intake pipe and an air outlet end for discharging air. The light source is fixed inside the pipe body. The light emitted by the light source is emitted from the air outlet end. This invention further discloses a measurement system for substrate inspection. The air pipe joint can emit light from the air outlet end thereof, reduce a blind spot on the transparent stage and influence on measurement accuracy due to a blocking of the air pipe joint itself against the light source.

A display panel manufacturing system includes a substrate providing module configured to provide a substrate including an active region on which thin-film transistors are disposed, and a peripheral region adjacent to the active region, a test substrate providing module configured to provide a test substrate, an organic film forming module configured to form an ink pattern on each of the substrate and the test substrate, the organic film forming module including a plurality of heads, each of which is configured to drop an ink, an offset inspection module configured to inspect the ink pattern on the substrate, a pattern inspection module configured to inspect the ink pattern on the test substrate, and a droplet inspection module configured to inspect an ink, which is dropped from a head selected from the heads.

A monitoring method of a thimble base includes the following steps: arranging a reflective surface on a thimble head of a thimble base; arranging at least a light source and a receiver on the thimble base; establishing a reflection path between the thimble bases to project light onto the reflective surface of the thimble head of one of the thimble bases in the reflection path, so that light is reflected between the reflective surfaces and is finally reflected to the receiver. The disclosure also provides a monitoring apparatus of the thimble bases. The monitoring apparatus includes a carrying platform, thimble bases arranged in an array on the carrying platform, and at least one light projecting and receiving device. Compared with the prior art, the disclosure realizes real-time monitoring of the thimble bases, thereby avoiding the problem of fragmentation caused by deformation of the thimble bases.

An inspection is performed using a captured image obtained by irradiating, with blue light, an optical wavelength conversion sheet that includes a quantum dot layer which contains a quantum dot emitting red light and green light by receiving blue light with blue light from a back surface side and imaging from a front surface side with a camera. A filter which cuts the blue light and transmits the red light and the green light is disposed between the camera and the optical wavelength conversion sheet.

A method for detecting degree of particulate contamination on a flat panel mainly includes the following steps: illuminating a to-be-detected flat panel (40) by using a light source module (10), to form an illumination field; adjusting a half width of the illumination field; adjusting a luminous intensity at a center of the illumination field and a luminous intensity at an edge of the half width of the illumination field; adjusting a light intensity and a position of the light source, as well as a position of a detector (20); and acquiring signals from foreign objects on the flat panel by using the detector (20). This method greatly alleviates particle mirror crosstalk and crosstalk of patterns on the lower surface of the flat panel, and improves the SNR, thus enhancing the accuracy in detection of foreign objects on the flat panel.

An angle adjustment tool, an angle adjustment system for a liquid crystal panel and a corresponding line defect analysis method are disclosed. The angle adjustment tool includes: a base; a first toothed member and a second toothed member; a rotating scale; and an angle indicator. The first toothed member includes a first toothed portion. A first end of the second toothed member has a second toothed portion and engages with the first toothed portion of the first toothed member, and a second end of the second toothed member is connected to the rotating scale; the second toothed member is pivotable about a central pivot axis of the second toothed portion. A pitch circle diameter of the second toothed portion is n times a pitch circle diameter of the first toothed portion, where n is a positive integer greater than or equal to 2.

A display inspection device includes a light source, a light condenser unit, a light splitter unit, and a photoelectric converter that are arranged, in sequence, externally of a display-to-be-inspected. The light condenser unit provides constant-frequency excitement to the inspection light beam so as to make constant-frequency variation of focus of the inspection light beam. The range of variation of the focus of the inspection light beam always covers a focus point on a surface of the display-to-be-inspected so that the inspection device possess an active focusing function, allowing a surface configuration, reflectivity, or defect of the display-to-be-inspected to be reflected in variation of intensity of a reflected light beam and also allowing the focusing point of the inspection light beam not to be constrained to focus on the surface of an objected-to-be-inspected thereby greatly increasing an inspection range of the device and improving inspection efficiency.

A patterning apparatus includes a laser generator, at least one lens, a detector, and a controller. The laser generator generates a first laser beam and a second laser beam having different intensities. The at least one lens irradiates the first laser beam to form a pattern in a substrate, irradiates a second laser beam to determine a defect of the pattern, and condenses reflected beams generated as the second laser beam is reflected from the substrate. The detector converts the reflected beams to electrical signals. The controller determines a defect of the pattern based on the electrical signals.

A sparkle contrast correcting method includes a step of acquiring a first sparkle contrast that is caused by an anti-glare layer that is disposed on a surface of an electronic display and information that represents a first measurement condition, the first sparkle contrast being used as a comparison standard and being measured in the first measurement condition by using a first imaging lens that images emitted light from the anti-glare layer and a first two-dimensional image sensor on which the emitted light is imaged, a step of acquiring a second sparkle contrast that is caused by the anti-glare layer and information that represents a second measurement condition, the second sparkle contrast being used as a comparison target and being measured in the second measurement condition that differs from the first measurement condition by using a second imaging lens that images emitted light from the anti-glare layer and a second two-dimensional image sensor on which the emitted light is imaged, and a step of correcting the second sparkle contrast, based on a ratio between the first measurement condition and the second measurement condition for comparison with the first sparkle contrast.