A high-voltage test terminal includes a first conductor, a second conductor, and a primary insulator disposed between and coupled to the first and second conductors. A blade is movably connected to the second conductor. The blade is electrically and mechanically connected to the first conductor in a first position and electrically isolated and mechanically disconnected from the first conductor in a second position. A guard insulation layer is disposed between the primary insulator and the first conductor.

An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

A portable connector assembly includes a belt having a clasp for creating a closed loop with the belt. A receiver has port and control electronics. A battery is removably securable in the port of the receiver. The assembly also includes an industrial connector electrically connected to the receiver for electrically connecting the control electronics with a product connector.

A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.

The present disclosure relates to a submersible apparatus (1) for testing a submarine high voltage (HV) cable system. The apparatus (1) includes a cable termination (100) including an electrical insulator (101) and a shielding electrode (102) for the electrical connection with a cable end (201). The apparatus (1) additionally includes a cable bend restrictor (300) having a through channel (301), and a termination locking (400) in through communication with the cable bend restrictor (300) and the cable termination (100). According to another aspect, a method for testing a submarine high voltage (HV) cable apparatus using the above to testing apparatus (1) is additionally disclosed.

A device for performing electrical measurements according to the present disclosure includes a first input post that is electrically conducting, a second input post that is electrically conducting, and a sleeve that is electrically insulating and at least partially surrounds the first input post and the second input post. The sleeve includes a first rib extending in a longitudinal direction of the sleeve and a second rib extending in the longitudinal direction of the sleeve. The first rib and the second rib are constructed to separate the first input post and the second input post.

A probe structure for inspecting characteristics of a connector having at least one terminal includes a plunger, a coaxial probe, a flange, a housing, and a spring. A first end portion of the housing and the flange are configured to restrict rotation of the housing in the circumferential direction in a state in which the first end portion of the housing is fitted into the through-hole of the flange. Thus, inspection of characteristics of the terminal of the connector can be performed with higher accuracy.

The present invention relates to a substrate testing cartridge provided for simultaneously testing multiple substrates for which a substrate treatment process has been finished, and a method for manufacturing same. According to an embodiment of the present invention, a substrate testing cartridge comprises: a chuck member on which a substrate is placed; a probe card which contacts and tests the substrate and is positioned to face the chuck member with reference to the substrate; and coupling members which couple the substrate, the chuck member, and the probe card, wherein each coupling member comprises: a substrate coupling part which couples the substrate and the chuck member; and a chuck coupling part which couples the probe card and the chuck member.

Methods, systems, and apparatuses are described for transferring power. A power transfer device may be configured to securely fit in a fuse block, fuse holder, and/or the like. The power transfer device may transfer power from a source to a load connected to the fuse block, fuse holder, and/or the like, while also isolating the power to prevent the power from backfeeding to the source. The power transfer device may be used to perform testing, measurements, and/or analysis (e.g., voltage measurements, power measurements, frequency analysis, system impedance testing, etc.).

A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body. The lid member includes: a plate-like main body; and a pusher protruding from the main body in a convex shape.