A signal transfer structure including a tapered input line extending in a first direction and having an input terminal and a contact terminal, a width of the input line increasing from the input terminal to the contact terminal in the first direction and a signal being input to the input terminal; a diverging line in contact with the contact terminal of the input line and extending in a second direction different from the first direction; an output line connected to the diverging line and from which the signal is output; and an interconnector, the interconnector including a vertical via between the diverging line and the output line and a via line connected to the vertical via and having a same characteristic impedance as the output line.

There is provided an intermediate connection member provided between a first member having a plurality of first terminals and a second member having a plurality of second terminals to electrically connect the plurality of first terminals and the plurality of second terminals, respectively. The intermediate connection member includes: a block member including connection members configured to electrically connect the plurality of first terminals and the plurality of second terminals, respectively; a frame member having an insertion hole into which the block member is inserted; and an electronic component electrically connected to one of the connection members.

A test and measurement device, including a first input structured to receive a first voltage from a first conductor of a first triaxial cable, a second input structured to receive a second voltage from a second conductor of the first triaxial cable or a second triaxial cable, circuitry configured to change modes based on the first voltage and the second voltage; and an output structured to output a signal.

The disclosure describes a novel method and apparatus for improving silicon interposers to include test circuitry for testing stacked die mounted on the interposer. The improvement allows for the stacked die to be selectively tested by an external tester or by the test circuitry included in the interposer.

An electrical contact assembly includes an electrically nonconductive base, a first electrical contact supported by the base and a second electrical contact supported by the base such that the first contact and the second contact are separated by a space. The first electrical contact is configured to engage a first external conductive circuit element and the a second electrical contact is configured to engage a second external conductive circuit element. The first contact and the second contact are configured such that a portion of the first contact and a portion of the second contact converge as the base moves in a first direction relative to the first and second external conductive circuit elements and diverge as the base moves in a second direction relative to the first and second external conductive circuit elements.

A test point adaptor for coaxial cables includes a main body, a test body, and a cap. The main body has a first longitudinal axis and includes a first end comprising a first interface, a second end comprising a second interface, and a first center conductor extending at least from the first interface to the second interface. The test body has a second longitudinal axis arranged transversely to the main body and includes an outer conductive sleeve, a test body end comprising a third interface, an electrically conductive contact member in electrical contact with the first center conductor, and a gripping arrangement electrically coupled with the electrically conductive contact member. The third interface includes a conical contact surface of the outer conductive sleeve. The cap includes a sleeve configured to matingly engage an outer surface of the outer conductive sleeve. The outer conductive sleeve includes a conical contact surface configured to engage the conical contact surface of the outer conductive sleeve when the cap is matingly engaged with the outer sleeve. The cap includes a terminator configured to be aligned with and received by the gripping arrangement, which electrically couples the terminator to the electrically conductive contact member.

A semiconductor inspection jig includes: a jig body having a recessed part provided on a top surface of the jig body; a printed circuit board provided on the top surface of the jig body; a GND block provided in the recessed part and having first and second side faces opposite to each other; first and second blocks provided in the recessed part and sandwiching the GND block; a push-up part pushing up the GND block from a bottom surface of the recessed part; a first press part pressing the first block against the first side face of the GND block; and a second press part pressing the second block against the second side face of the GND block.

An electric meter includes: a plurality of connectors configured to form electrical connections to corresponding plurality of receptacles in an electric meter socket, wherein at least one electrical connection to the plurality of receptacles is formed with a neutral wire; and a plurality of measurement devices configured to measure electrical characteristics of voltage and current waveforms provided to the electric meter from an electric distribution system and a distributed energy resource (DER) device via the plurality of connectors. The neutral wire provides an electrical reference point for measurement of the voltage waveforms.

An electric meter socket includes: a first plurality of connection points within the electric meter socket configured to form electrical connections to line voltage wirings of an electric distribution system; a second plurality of connection points within the electric meter socket configured to form electrical connections to output voltage wirings of a DER device; one or more connection points within the electric meter socket configured to form an electrical connection of neutral wires of the electric distribution system, the DER device, and a load; and a plurality of receptacles, each of the plurality of receptacles electrically connected to a corresponding connection point and configured to accept a mating connector of an electric meter.