Patent classifications
G01R1/0416
Connector apparatus for a field device as well as field device with such a connector apparatus
A connection apparatus .[.comprises.]. .Iadd.includes: .Iaddend.a platform.[.,.]..Iadd.; .Iaddend.a plug connector having a plug connector part secured to the platform and electrically connected to the circuit of the field device and a plug connector part connectable with .[.the.]. .Iadd.a .Iaddend.connection cable and complementary to the first plug connector part.[., as well as.]..Iadd.; and .Iaddend.a lid .[.held movably.]. .Iadd.moveable .Iaddend.relative to the platform for at least partially covering the plug connector.[.formed by connecting the plug connector parts.].. The lid is swingable between a first end position, in which the lid at least partially covers the plug connector, and a second end position, and is .[.additionally.]. adapted in .[.at least one.]. .Iadd.an .Iaddend.open position located between the first end position and the second end position to expose the plug connector such that the plug connector part can be separated from the plug connector part, .[.as well as.]. .Iadd.and, .Iaddend.at least in the first end position.Iadd., .Iaddend.to secure the plug connector part connected with the plug connector part.
Test point adaptor for coaxial cable connections
A test point adaptor includes a body having a first and second end along a longitudinal axis. The second end includes an outer conductive sleeve. A cap includes a sleeve and a terminator. The body includes a first and second interface at the first and second ends, respectively. A center conductor extends though the body from the first interface toward the second interface. The second end includes a conical contact surface of the outer conductive sleeve. The cap matingly engages the second interface. The second end includes an electrically conductive contact member in electrical contact with the center conductor and a gripping arrangement electrically coupled with the electrically conductive contact member. The cap includes a conical contact surface to engage the conical contact surface of the outer conductive sleeve. A terminator is received by the gripping arrangement, which electrically couples the terminator to the center conductor.
Electronic monitoring circuit for detecting the variation in the power or current absorbed by at least one electronic circuit under test and electronic system for testing the operation of the at least one electronic circuit
An electronic monitoring circuit for detecting a variation in the power or current absorbed by an electronic circuit under test is disclosed. The circuit includes an input terminal adapted to receive a pulse-width modulation control signal, a resistor having a first terminal connected to the input terminal, and a capacitor having a first terminal connected to a second terminal of the resistor. The output terminal is adapted to generate an output signal as a function of the value of the voltage drop at the ends of the capacitor, said output signal being representative of a variation of the pulse width of the pulse-width modulation control signal. The variation of the pulse width is a function of the power or current absorbed by the electronic circuit under test.
Substrate for mounting light emitting diodes with testing capabilities
Embodiments relate to testing LEDs by applying a voltage difference between anode electrodes and cathode electrodes of the LEDs using transistors and probe pads and determining whether the LEDs satisfy a threshold level of operability. A final substrate has transistors that apply the voltage difference to the LEDs via conductive traces and probe pads during testing mode. A gate voltage is applied to gate terminals of the transistors, a first voltage is applied to anode electrodes of the LEDs, and a second voltage is applied to cathode electrodes of the LEDs. After applying the voltages, turning on of the LEDs is observed. Embodiments also relate to testing current leakage in the final substrate with the transistors and the LEDs.
BATTERY PROPERTY MEASUREMENT APPARATUS
Discussed is a battery property measurement apparatus including a main body made of an insulative material, the main body being configured to be put on a hand of a user; and a measurement unit installed at a portion of the main body at which a finger of the user is located, the measurement unit being configured to contact at least a portion of respective opposite ends of a battery, the measurement unit being electrically connected to the battery when the user push on the battery using the finger in a state in which the battery is coupled to the measurement unit. BIRCH, STEWART, KOLASCH & BIRCH, LLP CAM/CAM/bo(ssk)
ENCAPSULATED COMPONENT ATTACHMENT TECHNIQUE USING A UV-CURE CONDUCTIVE ADHESIVE
A method for acquiring a signal from an encapsulated test point on a device under test, includes forming a hole in an encapsulant adjacent to the test point, the hole extending through the encapsulant to the test point, delivering a UV-curable conductive adhesive into the hole such that the delivered adhesive contacts the test point, applying UV light from a UV light source to cure the delivered adhesive, and connecting a conductive element between the cured adhesive and a test and measurement instrument.
Method for testing multicore cable, method for manufacturing multicore cable assembly, and multicore cable test device
A method for testing a multicore cable that includes a single common shield covering plural insulated wires. The testing method includes inputting a test signal, by capacitive coupling, to an end portion of the insulated wire under test among end portions of the insulated wires exposed at one end of the multicore cable, and measuring voltages of output signals output by capacitive coupling respectively from end portions of the insulated wires exposed at the other end of the multicore cable, and identifying the other end portion of the insulated wire under test based on the measured voltages. The voltages of output signals are measured in a state that an output variation reduction capacitive element is connected in series with a coupling capacitance generated by the capacitive coupling.
Connector structure
A connector structure includes a connector body that includes wiring in an internal section; an opening of the connector body, the opening being positioned to overlap the wiring when being viewed in a predetermined direction, the opening communicating with the internal section; and a probe holding mechanism in the opening, the probe holding mechanism blocking up the opening. The probe holding mechanism is configured to have a probe inserted through the probe holding mechanism in the predetermined direction and is configured to, when the probe is inserted through the probe holding mechanism, deform and hold the probe.
DEVICE UNDER TEST BOARD WITH OFFSET CONNECTION TO HOST BOARD
The present disclosure relates to a circuit board that includes a first edge connector configured to communicatively couple the circuit board to a first connector of a second circuit board. The first edge connector extends from a side of the circuit board a first length. The circuit board also includes a second edge connector configured to communicatively couple the circuit board to a second connector of the second circuit board. The second edge connector extends from the side of the circuit board a second length that is different than the first length.
Test fixture for observing current flow through a set of resistors
The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.