A watt-hour meter block adapter assembly includes a housing. The watt-hour meter block adapter assembly includes a blade supported by the housing. The blade includes a blade end and a jaw end. The blade includes a middle portion that extends from the blade end to the jaw end. The middle portion and blade end are rectangular in cross-section. An area of the rectangular cross-sectional area of the middle portion is greater than an area of the rectangular cross-sectional area of the blade end.

The invention relates to a reflectometry system for detecting faults on a hardened multipoint connector of an electrical network, of the type that comprises a measuring probe, characterized in that it comprises an interfacing and impedance matching part that is electrically suitable for mounting on the connector to be tested and comprises a body provided with at least one element in the form of a collector ring for the contact masses of the connector and a measuring opening for the probe of the reflectometry system.

A battery cell connector for use with an external device. In an aspect, the battery cell connector comprises a body with at least three layers, configured to simultaneously provide improved weldability and conductivity. In the same aspect, the battery cell connector comprises a terminal connected to the terminal arm of the body of the cell connector and a voltage transmitting component connected to said terminal, wherein the voltage transmitting component is configured to connect to an external device on the opposing end.

Apparatuses for characterizing system channels and associated methods and systems are disclosed. In one embodiment, a tester is coupled to an adaptor configured to plug into a CPU socket of a system platform (e.g., a motherboard). The motherboard includes a memory socket that is connected to the CPU socket through system channels. The adaptor may include a connector configured to physically and electrically engage with the CPU socket, an interface configured to receive test signals from the tester, and circuitry configured to internally route the test signals to the connector. The adaptor, if plugged into the CPU socket, can facilitate the tester to directly assess signal transfer characteristics of the system channels. Accordingly, the tester can determine optimum operating parameters for the memory device in view of the system channel characteristics.

The present invention relates to the inspection process which includes providing access to the microdevice contacts, measuring the microdevice and analyzing the data to identify defects or performance of the micro device. The invention also relates to the forming of test electrodes on microdevices. The test electrodes may be connected to hidden contacts. The type of microdevices may be vertical, lateral or a flip chip.

The socket 20 comprises a first contact probe 21 which has a first end which is to contact with a first terminal 91 of the DUT 90, a second contact probe 22 which has a second end which is to contact with a second terminal 92 of the DUT 90, and an inner housing 23 which holds the first and second contact probes 21, 22 so that the first end and the second end are located on substantially the same virtual plane VP, and the length L.sub.2 of the second contact probe 22 is shorter than the length L.sub.1 of the first contact probe 21. The interposer 30 comprises a substrate 31 which has a through hole 311 into which the first contact probe 21 is to be inserted, and a wiring pattern 32 which is disposed on the substrate 31, and the wiring pattern 32 has a pad 321 with which the second contact probe 22 is to contact.

A connecting device for electrically connecting signal contact portions of an electrical device under test includes a lower modular unit and an upper modular unit. The lower modular unit includes a port substrate and a plurality of lower connecting terminals electrically connected with the port substrate. The upper modular unit is disposed above the lower modular unit and includes a plurality of upper connecting terminals movable relative to an upper wall. The upper connecting terminals are movable as a result of a downward pressing of the electrical device to the upper modular unit to project outwardly of the upper wall and to electrically connect with the signal contact portions. The upper connecting terminals are electrically connected with the lower connecting terminals.

Apparatuses for characterizing system channels and associated methods and systems are disclosed. In one embodiment, a tester is coupled to an adaptor configured to plug into a CPU socket of a system platform (e.g., a motherboard). The motherboard includes a memory socket that is connected to the CPU socket through system channels. The adaptor may include a connector configured to physically and electrically engage with the CPU socket, an interface configured to receive test signals from the tester, and circuitry configured to internally route the test signals to the connector. The adaptor, if plugged into the CPU socket, can facilitate the tester to directly assess signal transfer characteristics of the system channels. Accordingly, the tester can determine optimum operating parameters for the memory device in view of the system channel characteristics.

In a method of testing a semiconductor wafer, a probe tip contacts a pad in a scribe line space between facing sides of first and second dies. The probe tip is electrically coupled to an automated test equipment (ATE). The second die is spaced apart from the first die. The scribe line space includes an interconnect extending along at least an entire length of the facing sides of the first and second dies. The pad is electrically coupled through the interconnect to at least one of the first or second dies. With the ATE, circuitry is tested in at least one of the first or second dies. The pad is electrically coupled through the interconnect to the circuitry.

The present disclosure relates to a measuring system including: an automation field device embodied for determining and/or monitoring a process variable of a medium; a connection unit, which includes a connection plug, which is electrically connected with the field device, and a cable, which is connected to the connection plug with a cable connection and which serves for supplying the field device with electrical energy and/or for transmitting information between the field device and a superordinated unit; and a protective cover, which surrounds the connection unit and the field device connected with the connection unit in a protection section, wherein by means of the protective cover the impact resistance of the measuring system in the protection section is increased.