A system and methods for adaptive bi-direction audio wiring, in which a circuit may be attached via a headset port using RJ9 pin configurations in a phone handset, and dynamically test many different phone handset configurations for optimal audio pathing and processing for speaker and microphone audio generation with minimal noise, static, or power fluctuation.

A testing system includes a slot configured to receive a device-under-test (DUT), and a core testing processor configured to communicate with a user interface and with the slot, wherein the core testing processor is associated with communication that is independent of any other communications transmitted within the system, and wherein the core testing processor executes a set of tests associated with the DUT.

A device includes a scan chain including a plurality of storage elements and an output buffer; a shadow shift register having a shadow shift input coupled to a scan output of one of the storage elements of the scan chain; a signature register; and a comparator having a first input, a second input, and an output. The comparator first input is to receive a value of the shadow shift register, and the comparator second input is to receive a value of the signature register. The output buffer has a control input coupled to the comparator output, and the output buffer provides a high-impedance output responsive to the value of the shadow shift register being unequal to the value of the signature register.

A system includes a first integrated circuit including a first interface circuit with a first transmit pin and a first receive pin, and a first test circuit. The system also includes a second integrated circuit including a second interface circuit with a second receive pin coupled to the first transmit pin, and a second transmit pin coupled to the first receive pin. The second integrated circuit further includes a second test circuit configured to route signals from the second receive pin to the second transmit pin, such that the sent test signal is received by the second receive pin, bypasses the second test circuit, and is routed to the second transmit pin. The first test circuit is further configured to receive the routed test signal on the first receive pin via the second conductive path.

A port manager is configured to implement adaptive port ceiling assignment for background Input/Output (I/O) operations between heterogeneous storage arrays. The port manager generates a set of test I/O operations, applies the I/O operations to a port under test, determines a response time to complete the I/O operations on the port under test, and compares the response time of the current test with response times of a set of previous tests. Based on the test values, the port manager identifies a throughput inflection point for the port under test, which is used to set a maximum throughput of the port under test. The adaptive ceiling for the port under test is then set based on the maximum throughput times a ceiling percentage threshold value. The determined adaptive ceiling value is then used to prospectively limit background I/O operations on the port under test.

A device includes a scan chain including a plurality of storage elements and an output buffer; a shadow shift register having a shadow shift input coupled to a scan output of one of the storage elements of the scan chain; a signature register; and a comparator having a first input, a second input, and an output. The comparator first input is to receive a value of the shadow shift register, and the comparator second input is to receive a value of the signature register. The output buffer has a control input coupled to the comparator output, and the output buffer provides a high-impedance output responsive to the value of the shadow shift register being unequal to the value of the signature register.

Disclosed is a fan-out buffer which includes a first channel that includes a first delay circuit adjusting a first delay time of a calibration test signal depending on a first delay control signal, a second channel that includes a second delay circuit adjusting a second delay time of the calibration test signal depending on a second delay control signal, a first edge-to-pulse converter that detects a first edge included in a first time domain reflectometry (TDR) waveform of an output terminal of the first channel and generates a first start pulse signal including a first pulse, a second edge-to-pulse converter that generates a second start pulse signal including a second pulse, a stop pulse signal generator that generates a stop pulse signal including a first stop pulse, and a first delay control signal generator that calculates a phase difference generates the first delay control signal.

Built-in-self-test (BIST operations are performed by receiver lanes of a multilane receiver system, wherein at least one receiver lane is configured as a synthesized clock source for other receiver lanes configured to perform BIST operations. The at least one receiver lane configured as the synthesized clock source may generate a clock signal and provide the clock signal to the other receiver lanes performing the BIST operations. In some examples, digital control signals may be used for coordinating the enablement of the at least one receiver lane to function as the synthesized clock source and for coordinating the enablement of the other receiver lanes to perform BIST operations.

Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation. The margin tester disclosed is lower cost, easier to use and faster than traditional BERT and scopes and can operate on the full multi-lane I/O links in their standard operating states with full loading and cross-talk. The margin tester assesses the electrical receiver margin of an operation multi-lane high speed I/O link of a device under test simultaneously in either or both directions. In a technology-specific form, an embodiment of the margin tester can be implemented as an add-in card margin tester to test motherboard slots of a mother board under test, or as a as a motherboard with slots to test add-in cards.

A detection circuit, a detection method, and an electronic system for detecting an I/O output status are provided. The detection circuit includes a comparison-window generating circuit configured to: detect an I/O data signal, generate a first single pulse signal, determining a first-time window, in response to a rising edge of the I/O data signal, and generate a second single pulse signal, determining a second-time window, in response to a falling edge of the I/O data signal. A first comparison circuit is configured to: receive the first single pulse signal, and compare the I/O drive signal with a preset high-level reference signal within the first time window to obtain a first comparison result. The second comparison circuit is configured to: receive the second single pulse signal, and compare the I/O drive signal with a preset low-level reference signal within the second time window to obtain a second comparison result.