Provided is an X-ray imaging panel in which off-leakage current can be decreased, and a method for producing the same. An imaging panel includes a photodiode that includes a lower electrode, a photoelectric conversion layer 15 provided on the lower electrode, and an upper electrode 14b provided on the photoelectric conversion layer 15. The photoelectric conversion layer 15 includes a first amorphous semiconductor layer 151, an intrinsic amorphous semiconductor layer 152, and a second amorphous semiconductor layer 153. In the photoelectric conversion layer 15, an upper end portion 1531 of the second amorphous semiconductor layer 153 has a protrusion portion 15a that protrudes toward an outer side of the photoelectric conversion layer 15 with respect to an upper end portion 1521 of the intrinsic amorphous semiconductor layer 152.

According to an embodiment, a photon counting CT apparatus includes a scintillator, a photodiode array, a holder, a divider, and an image generator. The scintillator is configured to convert X-rays into light. The array includes first and second pixels. The first pixel includes a photodiode in a first range receiving the light emitted from the scintillator. The photodiode outputs an electrical signal based on the light. The second pixel includes a photodiode in a second range different from the first range. The holder is circuitry configured to hold a value of an electrical signal output by the second pixel. The divider circuitry is configured to count the number of photons of light incident on the first pixel by dividing an integrated value of electrical signals output by the first pixel by the held value. The image generator is circuitry configured to reconstruct an image based on the counted number.

In a conventional phase-contrast X-ray imaging system, a source grating G0 generates an array of partially coherent line sources which illuminate an object and thereafter phase grating G1. The periodicity in the phase grating is self-imaged at certain instances further away from the X-ray source and sampled by a mechanically movable third absorptive analyzer grating G2 before the demodulated fringe intensity is detected by a conventional X-5 ray detector. This application proposes to directly demodulate the fringe intensity using a structured scintillator having a plurality of slabs in alignment with sub-pixels of an optical detector layer, in combination with electronic signal read-out approaches. Therefore, a mechanically movable third absorptive analyzer grating G2 can be omitted from a phase-contrast X-ray imaging system.

A tomographic imaging apparatus includes an X-ray detector comprising a plurality of dual mode pixels and configured to detect radiation that has passed through an object, and at least one processor configured to obtain scan data from the X-ray detector, and control each pixel of the plurality of dual mode pixels to operate in one of a first mode and a second mode, wherein each pixel of the plurality of dual mode pixels includes a sensor configured to generate a scan signal by converting incident radiation into an electric signal, a first signal path circuit configured to transmit the scan signal in the first mode, a second signal path circuit configured to transmit the scan signal in the second mode, and a photon counter configured to count photons from the scan signal transmitted through one of the first and second signal path circuits.

A pixel circuit of an X-ray sensor includes a photo diode, a first transistor, a second transistor and a third transistor. The photo diode is used to sense X-rays and to generate a corresponding electrical sensing signal. The first transistor is electrically connected with the photo diode to reset the electrical sensing signal. The second transistor is electrically connected with the photo diode to amplify the electrical sensing signal and to generate an amplified sensing signal. The third transistor is electrically connected with the second transistor to output the amplified sensing signal. The second transistor has a terminal electrically connected with a high voltage, and the first transistor has a terminal electrically connected with a calibration voltage. The high voltage and the calibration voltage are controlled separately.

The radiation detector according to the present invention is always able to calculate the summation value accurately, regardless of the intensity of the fluorescent emission that is produced in the scintillator. That is, if the method for calculating the summation value set forth in the present invention is used, then the number of instantaneous intensity data d that are added together each time a fluorescent emission is produced in the scintillator will be larger the greater the intensity of the fluorescent emission. Doing this prevents the intensity of an intense fluorescent emission from being understated. Moreover, the summing portion in the present invention is able to calculate the summation value with high reliability. This is because the instantaneous intensity data used in calculating the summation value are above a threshold value a, causing the signal-to-noise ratios to be adequately high and the reliability to be high as well.

An X-ray detector device includes in one example a switching portion and a photodetecting portion connected to the switching portion. The photodetecting portion includes a bottom electrode, a semiconductor area disposed above the bottom electrode, and a top electrode disposed above the semiconductor area. The area of the top electrode is smaller than the area of a top surface of the semiconductor area.

An X-ray image pickup system (10) includes an X-ray source (16), an image pickup panel (12), a scintillator (13), and an X-ray control unit (14E). The image pickup panel includes a photoelectric conversion element (26), a capacitor (50), a thin film transistor (24), and TFT control units (14A, 14B, 14F). To the photoelectric conversion element (26), scintillation light is projected. The capacitor (50) is connected to the photoelectric conversion element (26), and accumulates charges. The thin film transistor (24) is connected to the capacitor (50). The TFT control units (14A, 14B, 14F) control an operation of the thin film transistor (24). The thin film transistor (24) includes a semiconductor active layer (32) made of an oxide semiconductor. The X-ray control unit (14E) intermittently projects X-ray to the X-ray source (16). The TFT control units (14A, 14B, 14F) cause the thin film transistor (24) to operate when the X-ray is not projected, so as to read out the charges accumulated in the capacitor (50).

The present disclosure relates to an X-ray detector. The X-ray detector includes the first and second gate lines arranged to be spaced apart from each other on a substrate, a data line and a bias line that are arranged to be spaced apart from each other in a direction intersecting the first and second gate lines, and define a unit pixel area, a storage capacitor that is arranged in the unit pixel area and has one end connected to a ground, a phototransistor that is turned on by a reset signal applied to the first gate line and provides a signal generated by an incident light source to the storage capacitor, and a thin film transistor that is turned on by a gate signal applied to the second gate line to provide a charge stored in the storage capacitor to the data line.

A novel X-ray detector for in-line computed tomography includes two-dimensional pixel arrays in a single piece of silicon, which allows a signal from every pixel in the silicon to be read out during an X-ray beam exposure period. The pixel arrays face the X-ray source to ensure that X-ray photons follow a straight line that intersects the X-ray source and the 2D pixel arrays. A layer of an X-ray scintillator may be applied in front of the 2D array. The detector may be implemented in a tiled detector array arrangement, or on a single PCB board. When multiple on-board detectors are arranged and mounted on a curved gantry, the novel X-ray detector system can be utilized in multi-slice in-line CT applications. The X-ray detector readout electronics is compatible with that of a conventional detector module, where signals from individual detectors can be read out in parallel.