A processing system includes a processing core including a microprocessor, a memory controller configured to read software instructions for execution by the processing core, a plurality of safety monitoring circuits configured to generate a plurality of error signals by monitoring operation of the processing core and the memory controller, a fault collection and error management circuit implemented as a hardware circuit, and a connectivity test circuit. The fault collection and error management circuit is configured to receive the plurality of error signals from the plurality of safety monitoring circuits and generate one or more reaction signals as a function of the plurality of error signals. The connectivity test circuit is configured to, during a diagnostic phase executed by the processing system after executing a reset phase and before executing a software runtime phase, test connectivity between the plurality of safety monitoring circuits and the fault collection and error management circuit.

Examples for servicing a computing device by a servicing agent are described. In an example, the servicing agent receives a first set of information which includes device information corresponding to the computing device. Further, the servicing agent receives a second set of information during a second session, wherein the second set of information is received through a user input and is indicative of a state of the computing device. The servicing agent further processes the first set of information and the second set of information to determine a diagnostic test. The servicing agent causes to execute the diagnostic test on the computing device.

The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer’s system. Additional embodiments are also provided and described in the disclosure.

An automatic robot control system and methods relating thereto are described. These systems include components such as a touch screen panel (“TSP”) robot controller for controlling a TSP robot, a camera robot controller for controlling a camera robot and an audio robot controller for controlling an audio robot. The TSP robot operates inside a TSP testing subsystem, the camera robot operates inside a camera testing subsystem, and the audio robot operates inside an audio testing subsystem. Inside the audio testing subsystem, an audio signals measurement system, using a bi-directional coupling, controls the operation of the audio robot controller. In this control scheme, a test application controller is designed to control the different types of subsystem robots.

Methods relating to TSP, camera, and audio robots, and their controllers, taken individually or in combination, for automatic testing of device functionalities are also described.

An automatic robot control system and methods relating thereto are described. These systems include components such as a touch screen panel (“TSP”) robot controller for controlling a TSP robot, a camera robot controller for controlling a camera robot and an audio robot controller for controlling an audio robot. The TSP robot operates inside a TSP testing subsystem, the camera robot operates inside a camera testing subsystem, and the audio robot operates inside an audio testing subsystem. Inside the audio testing subsystem, an audio signals measurement system, using a bi-directional coupling, controls the operation of the audio robot controller. In this control scheme, a test application controller is designed to control the different types of subsystem robots. Methods relating to TSP, camera, and audio robots, and their controllers, taken individually or in combination, for automatic testing of device functionalities are also described.

There is provided a system and method for performing system integration on an embedded system of a connected and/or autonomous vehicle. Integration testing may include obtaining one or more requirements and/or specifications for a system under test; generating a metamodel based on the requirements and/or specifications; generating test cases based on the metamodel; prioritizing said test cases based on hazards associated with said test cases; executing one or more of said prioritized test cases; and obtaining a verdict for each of said one or more prioritized test cases.

A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

A method for processing data between host computer and CPLD provides a host computer, a circuit board comprising a UART unit, a pre-debugged hardware, and a CPLD. The UART unit communicates with the host computer via UART. The method further provides the CPLD coupled between the UART unit and the pre-debugged hardware and allows the CPLD to receive data from the host computer via the UART unit and to analyze the data. According to the method, the CPLD debugs the pre-debugged hardware according to the analyzed data and obtains a result of debugging. The CPLD outputs the result and allows the CPLD to transmit the result to the host computer via the UART unit. A system using the method is also provided.

A device maintenance apparatus includes a setting operator configured to allow for setting a test pattern, the test pattern being set to define a change of output signals output from a device over time, and an execution operator configured to make the device output the output signals based on the set test pattern.

A test system, for example for set top boxes or game consoles, includes logic to reformat media signals output by a device under test, logic to receive the reformatted media signals and to analyze them for errors, and a pluggable interface coupling the device under test to the logic to reformat the media signals.