The present invention discloses a method for detecting the mechanical response of a mechanical component by an organic mechanoresponsive fluorescent material, comprising the following steps of: selecting an organic mechanoresponsive fluorescent material; preparing an organic mechanoresponsive fluorescent material solution; forming a film on a metal surface; calibrating fluorescence intensity and obtaining the fluorescence intensity and distribution in a crack tip area; observing the fluorescence signal generated at cracks to monitor the occurrence of fatigue cracks, and predict a propagation pathway of fatigue cracks by using the fluorescence intensity distribution in the crack tip area.

The present invention discloses a method for detecting the mechanical response of a mechanical component by an organic mechanoresponsive fluorescent material, comprising the following steps of: selecting an organic mechanoresponsive fluorescent material; preparing an organic mechanoresponsive fluorescent material solution; forming a film on a metal surface; calibrating fluorescence intensity and obtaining the fluorescence intensity and distribution in a crack tip area; observing the fluorescence signal generated at cracks to monitor the occurrence of fatigue cracks, and predict a propagation pathway of fatigue cracks by using the fluorescence intensity distribution in the crack tip area.

A system (100a) for determining the type of a diamond (130a), the system (100a) comprising a plurality of lasers (110a,120a) for directing light towards a diamond (130a), wherein each laser is of a different wavelength of light; wherein the spectrum of light from the plurality of lasers (110a,120a) extends from ultra-violet to near infra-red; a spectrometer (140a) for collecting luminescence spectrum from the diamond (130a) responsive to inhomogeneities upon light from the lasers (110a,120a) being directed towards the diamond (130a); a processor module (150a) for comparing photoluminescence spectrum collected by the spectrometer (140a) with pre-existing photoluminescence spectrum of known diamond type; and an output module (160a) for providing an output signal indicative of the diamond type of the diamond (130a), upon a predetermined threshold of correlation between the photoluminescence spectrum from the diamond (130a) and the pre-existing photoluminescence spectrum from the diamond (130a) and the pre-existing photoluminescence spectrum responsive to inhomogeneities of known diamond type.

A system comprising: a high index dielectric configured to: a) create a bi-periodic interference pattern of two standing sinusoidal waves on illumination by two pairs of counter-propagating sinusoidal light beams at different incident angles, wherein the incident angles are selected in accordance with the index of refraction of the high index dielectric to i) to 5 determine the spatial frequency of each counter-propagating light beam pair, and ii) cause total internal reflection, and b) generate, from the bi-periodic interference pattern, an evanescent bi-periodic standing sinusoidal wave; a light source configured to illuminate the high index dielectric with the two pairs of counter-propagating sinusoidal light beams at the different incident angles and thereby illuminate a fluorescing object positioned at the surface of the high index dielectric with the generated evanescent bi-periodic standing sinusoidal wave; and one or more delay lines configured to independently modify the initial phase of each counter-propagating light beam pair.

A photoluminescence measurement device may include: a sample holder; a detector configured to collect a photoluminescence signal; a processing unit configured to process a signal collected by the detector; and a support disposed facing a rear face of the sample holder, opposite to the front face, and on one face, called the main face, of which rests at least one radiation source for emitting light radiation illuminating the rear face and likely to be collected, by transparency of the sample holder with respect to the light radiation, by the detector.

There is disclosed methods and apparatus for detecting contamination on cold-formed steel parts prior to subsequent press-hardening in which such contamination may be problematic, and also for detecting contamination on cold-forming machinery that might be transferred to cold-formed steel parts during cold-forming. In some aspects, the disclosure also relates to methods and apparatus for detecting splits or cracks in cold-formed steel parts prior to subsequent press-hardening. The methods and apparatus make use of ultraviolet light to detect contamination or to detect splits or cracks.

Techniques regarding tracking the application coverage of an antimicrobial coating and/or monitoring the degradation of the antimicrobial coating on a surface are provided. For example, one or more embodiments described herein can comprise a method that includes forming an antimicrobial coating by mixing a first solution comprising a tracer compound with a second solution comprising an antimicrobial compound. The method can further include inhibiting growth of a microbe on a surface by applying the antimicrobial coating to the surface.

A method of detecting a presence of foreign material in a ply is disclosed. A source of foreign material is marked with a fluorescent indicator. The source of foreign material is separated from the ply. An illumination source is provided for illuminating the ply at a different wavelength than the fluorescent indicator fluoresces so that the ply reflects light at a different wavelength. A sensor detects illumination of the ply and fluorescent indicator included in the foreign material disposed upon the ply. Differences in light reflected from the ply and fluorescence of the indicator disposed in the foreign material are detected thereby identifying existence of the foreign material in the ply.

The present disclosure relates to a substrate defect measuring apparatus for detecting defects inside a substrate by photoluminescence and detecting defects outside the substrate by using the scattering of incident light for generating photoluminescence, and provides an apparatus for constituting an optical system in order to measure scattered and/or reflected light together in a procedure of measuring the photoluminescence, thereby shortening a measurement time.

A flow of air including a fungal spore is directed to a collection cartridge. The fungal spore is trapped within the collection cartridge. The fungal spore is illuminated with light and a first image of the fungal spore is captured while the fungal spore is illuminated with the light. The first image is analyzed to identify an outline of the fungal spore. The fungal spore is illuminated with ultraviolet (UV) light and a second image of the fungal spore is captured while the fungal spore is illuminated with the UV light. A measurement is made of a degree of fluorescence within the outline of the fungal spore. A state of the fungal spore is determined based on the degree of fluorescence.