An apparatus comprises a first semiconductor chip comprising a first communication controller to receive first debug data from a second semiconductor chip; a memory to store the first debug data from the second semiconductor chip and second debug data of the first semiconductor chip; and a second communication controller to transmit the first debug data from the second semiconductor chip and the second debug data of the first semiconductor chip to an output port of the first semiconductor chip.

Embodiments relate to a system and method of using a test pattern for testing functionalities of external devices when an item is attached to a vehicle. The method includes identifying an item mechanically coupled to a vehicle, establishing a first connection via a communication module, with the item, generating a test pattern for testing a device from a plurality of devices, wherein the device is at least one of part of the vehicle, and part of the item and determining control of the device. The method further includes actuating the device to verify a functionality of the device based on the test pattern.