A compound may include a set of integrated circuits. An integrated circuit, of the set of integrated circuits, may include calibration standards integrated at a silicon layer of the integrated circuit. The integrated circuit may be included in a package, and a calibration standard, of the calibration standards, may be available to at least one port of a set of ports of the integrated circuit.

Embodiments herein discuss tuning a testing apparatus to better match the input response of a target system in which a cable will be used. For example, conductors in the cable may have a different skew depending on the system in which they are used. The testing apparatus may be tuned using frequency information regarding the type of signals that will be driven on the cable when installed in the target system. In one embodiment, the testing apparatus adjusts a testing cycle refresh rate for generating a testing signal which changes the frequency content of the testing signal. Using the adjusted testing cycle refresh rate results in the driver outputting a testing signal that better reflects the actual signals that will be transmitted on the cable in the target system.

Apparatus and methods for detecting and identifying a cause of a hot-switching event in an automated test system. One or more antennae positioned near mechanical relays in the system may be used to sense electromagnetic radiation. The antennae may be configured to respond to electromagnetic radiation of the type generated during a hot-switching event. Signals measured by the antennae may be processed to determine whether the signals have characteristics of hot-switching events. Processing may entail generating a signal envelope and determining whether the envelope has characteristics indicative of a hot-switching event. When a hot-switching event is detected, information to correlate the event to other events in the test system may also be captured. That information may be time information, enabling program test-system program instructions executing at the time of the event to be identified, such that the test system may be reprogrammed to avoid hot-switching events.

A high-frequency characteristic inspection apparatus includes a pair of high-frequency probes that inspect an electrical characteristic of a plane circuit including a signal region and a ground region formed apart from each other by an S parameter obtained by pushing a tip against a surface of the plane circuit and discharging a high frequency and a measurement apparatus. The high-frequency probe includes a ground terminal that is in contact with the ground region at its tip and a signal terminal that is in contact with the signal region simultaneously with the ground terminal at its tip. The pair of high-frequency probes are configured to contact with a surface of the plane circuit at the same time while facing each other at a certain interval.

Apparatus and methods for detecting and identifying a cause of a hot-switching event in an automated test system. One or more antennae positioned near mechanical relays in the system may be used to sense electromagnetic radiation. The antennae may be configured to respond to electromagnetic radiation of the type generated during a hot-switching event. Signals measured by the antennae may be processed to determine whether the signals have characteristics of hot-switching events. Processing may entail generating a signal envelope and determining whether the envelope has characteristics indicative of a hot-switching event. When a hot-switching event is detected, information to correlate the event to other events in the test system may also be captured. That information may be time information, enabling program test-system program instructions executing at the time of the event to be identified, such that the test system may be reprogrammed to avoid hot-switching events.

A device may determine an analog gain for an aggregated analog signal. The aggregated analog signal may be associated with a calibration test to be used to determine a set of calibration parameters for a load test of a base station. The device may determine the set of calibration parameters for the load test based on an outcome of performing a calibration test. The set of calibration parameters may result in a set of digital gains approximately centered in a digital dynamic gain range. The device may perform the load test after determining the analog gain for the analog signal and based on the set of calibration parameters for the load test.

Provided are a test board and a test system for efficiently testing a semiconductor package, and a manufacturing method for the semiconductor package using the same. A test apparatus includes a field programmable gate array (FPGA) configured to output a first data signal to be transmitted to the semiconductor device and a second data signal to be transmitted to the semiconductor device and a memory configured to store a test result. The FPGA includes a first input/output block configured to output the first data signal, a second input/output block configured to output the second data signal, a serializer/deserializer (SerDes) circuit configured to generate a strobe signal, and a skew calibration input/output block configured to receive the first data signal from the first input/output block, the second data signal from the second input/output block, and the strobe signal from the SerDes circuit.

An example process for aligning channels in automatic test equipment (ATE) includes programming a first delay associated with receiving first data over a channel so that timing of the channel is aligned to timings of other channels in the ATE; programming a second delay associated with a driver driving second data over the channel based on receipt of an edge of the second data so that timing of the second data is aligned to the timing of the channel; and programming a third delay associated with a signal to enable the driver to drive the second data over the channel, with the third delay being programmed to align timing of the signal to the timing of the channel, and with the third delay being based on an edge that corresponds to an edge of the signal created by controlling operation of the driver.

A function generator provides a first signal unit for the delivery of a first signal at a first output. The function generator provides a second signal unit for the delivery of a second signal at a second output. The function generator provides a calibration unit for the generation of a test signal, wherein the test signal can be supplied to the first signal unit and/or to the second signal unit. A comparison unit is connected downstream of the first signal unit and/or the second signal unit. The comparison unit compares the test signal delivered at the first output and/or at the second output with a calibration signal, wherein the output signal of the comparison unit can be supplied to the calibration unit.

This disclosure is in the field of electronics and more specifically in the field of timing control electronics. In an example, a timing control system can include or use an array of circuit cells, and each cell can provide a signal delay using a fixed delay or interpolation. The interpolation can include, in one or more cells, using three timing signals with substantially different delays to create a delayed output signal. Linearity of the delayed output signal is thereby improved. In an example, an impedance transformation circuit can be applied to improve a bandwidth in one or more of the cells to thereby improve the bandwidth of the timing control system.