Digital values obtained from an output of a preceding circuit element are temporarily stored and made available for a subsequent circuit element at a controlled moment of time. A digital value is received for temporary storage, as well as a triggering signal, a triggering edge of which defines an allowable time limit before which a digital value must appear at said data input to become available for said subsequent circuit element. A sequence of first and second pulse-enabled subregister stages is used to temporarily store said digital value. Said triggering signal is provided to said first pulse-enabled subregister stage delayed with respect to the triggering signal received by said second pulse-enabled subregister stage. The length of the delay is a fraction of a cycle of the triggering signal. A timing event observation signal is output as an indicator of said digital value at said data input having changed within a time window that begins at said allowable time limit and is shorter than one cycle of said triggering signal.

A digital input circuit for receiving digital input signals of at least one signal generator comprises first and second subcircuits. Each subcircuit includes a digital input to receive a digital input signal and a threshold value element to determine a logic state of the subcircuit. Each subcircuit adopts a first state in response to its digital input signal reaching or falling below a lower threshold value and adopts a second state in response to its digital input signal reaching or exceeding an upper threshold value. The digital input circuit further comprises a combined test and current increasing apparatus to generate a driving signal such that a function test of both the first and second subcircuits is conducted simultaneously with the driving signal and an input current of the digital inputs is increased.

A redundancy circuit includes a selection control signal generation circuit and a column control circuit. The selection control signal generation circuit drives an internal node, which is initialized, to generate a selection control signal when a logic level of a latched address signal is different from a logic level of a fuse signal. The column control circuit buffers a pre-column selection signal based on the selection control signal to generate a column selection signal for execution of a column operation of cells or to generate a redundancy column selection signal for execution of the column operation of redundancy cells.

A redundancy circuit includes a selection control signal generation circuit and a column control circuit. The selection control signal generation circuit drives an internal node, which is initialized, to generate a selection control signal when a logic level of a latched address signal is different from a logic level of a fuse signal. The column control circuit buffers a pre-column selection signal based on the selection control signal to generate a column selection signal for execution of a column operation of cells or to generate a redundancy column selection signal for execution of the column operation of redundancy cells.

Systems, methods, and apparatus for complementary self-limiting logic are disclosed. In one or more embodiments, a method for mitigating errors caused by transients in a logic gate transistor comprises biasing, by a first stage of transistors, a second stage of transistors such that a voltage potential across terminals of each of the transistors of the second stage are at an equal voltage potential. The method further comprises biasing, by the second stage of transistors, the logic gate transistor such that a voltage potential across terminals of the logic gate transistor are at an equal voltage potential, thereby ensuring that the transients will not cause the logic gate transistor to erroneously change logic states when the logic gate transistor is in a logically off state.

Systems, methods, and apparatus for complementary self-limiting logic are disclosed. In one or more embodiments, a method for mitigating errors caused by transients in a logic gate transistor comprises biasing, by a first stage of transistors, a second stage of transistors such that a voltage potential across terminals of each of the transistors of the second stage are at an equal voltage potential. The method further comprises biasing, by the second stage of transistors, the logic gate transistor such that a voltage potential across terminals of the logic gate transistor are at an equal voltage potential, thereby ensuring that the transients will not cause the logic gate transistor to erroneously change logic states when the logic gate transistor is in a logically off state.

Disclosed herein is a circuit including first and second input circuits. The first input circuit is configured to receive first and second logic signals and to source current to first and second control nodes if at least one of the first and second logic signals is at a logic low. The second input circuit is configured to receive the first and second logic signals and to sink current from the first and second control nodes if at least one of the first and second logic signals is at a logic high. A first output circuit is configured to source current to an output node when current is sunk from the first control node. A second output circuit is configured to sink current from the output node when current is sourced to the second control node. A latch is coupled to the output node.

Fault detection circuitry and a corresponding method are disclosed. A count value that is indicative of the switching period of a PWM signal is determined and it is determined whether this count value is between a first threshold and a second threshold. An error signal is generated when the switching period is not between the first and the second threshold. A count value that is indicative of the switch-on duration of the PWM signal is determined and compared with a switch-on threshold in order to determine whether the switch-on duration is greater than a maximum switch-on duration. A count value that is indicative of the switch-off duration of the PWM signal is determined and compared with a switch-off threshold in order to determine whether the switch-off duration is greater than a maximum switch-off duration. Error signals can be generated when the durations are greater than the maximum durations.

Fault detection circuitry and a corresponding method are disclosed. A count value that is indicative of the switching period of a PWM signal is determined and it is determined whether this count value is between a first threshold and a second threshold. An error signal is generated when the switching period is not between the first and the second threshold. A count value that is indicative of the switch-on duration of the PWM signal is determined and compared with a switch-on threshold in order to determine whether the switch-on duration is greater than a maximum switch-on duration. A count value that is indicative of the switch-off duration of the PWM signal is determined and compared with a switch-off threshold in order to determine whether the switch-off duration is greater than a maximum switch-off duration. Error signals can be generated when the durations are greater than the maximum durations.

A power distributor, in particular for an on-board network of a motor vehicle, has an intermediate tap, two power outputs, and one each switching unit for each power output. A switch is provided for a need-based blocking of the associated power output. Each of the switching units is designed in such a way that a blocking of the associated power output takes place, if, in the event a voltage drop at the associated power output and/or at the intermediate tap below a first setpoint value, an error case is determined. The greater the corresponding voltage drop, the faster the blocking of the associated power output takes place.