A solid-state multi-channel protection circuit includes a microcontroller, a current sensor, a plurality of temperature sensors, and first and second multiplexers selectively connecting the current sensor to one of a plurality of solid-state devices and each of the plurality of temperature sensors to the microcontroller. The microcontroller selectively controls the second multiplexer to receive a temperature output associated with one of the plurality of solid-state devices, and selectively controls the first multiplexer to receiver a current output related to the measured current associated with the same solid-state device, wherein the microcontroller provide over-current protection and over-temperature protection based on the received temperature output and the received current output.

A method and an integrated circuit for limiting a switchable load current. The integrated circuit includes a main transistor, through which in the conductive state a load current flows for supplying a load and a mirror transistor, a gate terminal of the mirror transistor being electrically connected to a gate terminal of the main transistor and a source terminal of the mirror transistor being electrically connected to a source terminal of the main transistor. The integrated circuit further includes a coupling circuit, which is configured to track a source drain voltage of the mirror transistor as a function of the source drain voltage of the main transistor. A gate control circuit is further provided, which limits the load current through the main transistor on the basis of a drain current through the mirror transistor.

A short circuit detection circuit includes a current terminal, a sense resistor, an amplifier, and a resistor-capacitor ladder. The sense resistor is coupled to the current terminal, and is configured to develop a sense voltage proportional to a current through the current terminal. The amplifier is coupled to the sense resistor, and is configured to generate a scaled current proportional to the sense voltage. The resistor-capacitor ladder is coupled to the amplifier, and is configured to generate a measurement voltage that represents a surface temperature rise due to the current through the current terminal.

A driver circuit is provided. The driver circuit comprises a power transistor and a gate driver circuit arrangement. The driver circuit is integrated in a package. In addition, the driver circuit comprises a terminal for an external transistor. The external transistor and the power transistor are controlled by the gate driver circuit arrangement in a mutually corresponding manner.

A gate driver system includes a gate driver circuit coupled to a gate terminal of a transistor and configured to generate an on-current during a plurality of turn-on switching events to turn on the transistor, wherein the gate driver circuit includes a first driver configured to source a first portion of the on-current to the gate terminal to charge a first portion of the gate voltage and a second driver configured to, during a first boost interval, source a second portion of the on-current to the gate terminal to charge a second portion of the gate voltage; a measurement circuit configured to measure a transistor parameter indicative of an oscillation of a load current for a turn-on switching event; and a controller configured to receive the measured transistor parameter and regulate a length of the first boost interval based on the measured transistor parameter.

A method determines a current flowing through at least one switching element of an electrical circuit arrangement. When the switching element is turned on the current flows through a switchable portion of the switching element. The switching element is associated with a temperature sensor and a voltage sensor. The temperature sensor measures a temperature of the switching element and the voltage sensor measures a voltage drop across the switchable portion of the switching element. The temperature sensor and the voltage sensor are connected to a computing device. The computing device determines a current value of the current based on the measured temperature and the measured voltage drop.

According to one embodiment, a deterioration checking apparatus includes an inductor that is connected in series to a main current path of a MOS transistor to be checked, and forms a closed loop together with the MOS transistor when the MOS transistor is in an ON-state, a control circuit that controls ON/OFF of the MOS transistor, a current sensor that detects a current released from the inductor, and a calculation circuit that calculates an ON-resistance of the MOS transistor from an attenuation characteristic of a current released from the inductor when the MOS transistor is in an ON-state, and calculates a threshold voltage of the MOS transistor from an attenuation characteristic of a current released from the inductor when the MOS transistor is in an OFF-state. Therefore, it is possible to easily check a deterioration state of the MOS transistor.

An electronic device includes a first group III nitride transistor and an over current protection circuit (OCP). The OCP circuit includes an input device and a detection device. The input device is configured to receive a control signal and to generate a first voltage to a gate of the first group III nitride transistor. The detection device is configured to generate an output signal having a first logical value if a current at a drain of the first group III nitride transistor is less than a predetermined value and to generate the output signal having a second logical value if the current at the drain of the first group III nitride transistor is equal to or greater than the predetermined value, wherein the first logical value is different from the second logical value.

A semiconductor module including a first switching device coupled to a first line, a terminal, at which a first voltage corresponding to a first current flowing through the first switching device is generated, coupled to the first switching device, a second switching device coupled to the first line for allowing a second current corresponding to the first current to flow therethrough, a voltage generation circuit configured to apply, to a second line, a second voltage lower than a power supply voltage, a resistor, across which a third voltage corresponding to the second current is generated, coupled between the second switching device and the terminal, a reference voltage circuit coupled to the terminal for generating a fourth voltage, and a comparator circuit coupled between the first and second lines, for determining whether the first switching device is in an overcurrent state based on a comparison between the third and fourth voltages.

In some examples, this description provides for an apparatus. The apparatus includes a power switch having a power switch source configured to receive an input voltage, a power switch drain, and a power switch gate. The apparatus also includes a current sense component coupled to the power switch. The apparatus also includes a current limiting circuit coupled to the power switch gate, the power switch drain, and the current sense component. The apparatus also includes an over-current protection (OCP) circuit coupled to the power switch source, the power switch drain, and the power switch gate. The apparatus also includes an output voltage (VOUT) clamp coupled to the power switch drain and the power switch gate.