The present disclosure relates to a configurable output stage for a DAC channel. The output stage receives an analog output from a DAC and outputs a signal to an output terminal. The output stage is configurable between a voltage mode and a current mode. In the voltage mode, the output stage supplies the analog signal to the output terminal as a voltage signal. In the current mode, the output stage supplies the analog signal to the output signal as a current signal. The output stage can receive user input to select the desired mode. Consequently, an integrated circuit can be implemented with multiple DAC channels, each having the configurable output stage. A user can choose how many channels they want to operate in a voltage output mode, and how many channels they want to operate in a current output mode, depending on their individual requirements.

Various embodiments relate to analog-to-digital converter (ADC) controllers. An ADC controller may include a number of contexts configured for coupling to an ADC, wherein each context having at least one register for storing at least one configurable parameter. The ADC controller may also include a sequencer operatively coupled to the number of contexts and configured to perform a programmed conversion sequence based on one or more configurable parameters of one or more contexts of the number of contexts. Methods of performing an analog-to-digital (A/D) conversion sequence, and methods of configuring a number of contexts for an analog-to-digital converter (ADC) controller, are also disclosed.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

A baseline wander and offset correction system having inputs configured to receive input signals to be transmitted. Also part of the system is a driver circuit configured to receive and amplify the input signals. The driver circuit is configured with one or more transistors having an optional back bias terminal. A replica circuit receives the input signals and responsive thereto, generates back bias signals which are provided to the back bias terminal of the one or more transistors to change the back bias in response to the input signals having consecutive one values or consecutive zero values. This reduces the size of the one or more AC coupling capacitors located between the driver circuit and a channel. An embodiment may store back bias values in a memory. The back bias values are processed by DAC to generate the back bias signals for offset correction.

A receiver circuit includes an interleaved ADC, a first delay circuit, a second delay circuit, a first processing channel, a second processing channel, and an interleaving ADC timing error detector circuit. The interleaved ADC includes a first ADC and a second ADC in parallel. The first delay circuit delays a first clock signal provided to the first ADC. The second delay circuit delays a second clock signal provided to the second ADC. The first processing channel processes data samples provided by the first ADC, and includes a first slicer. The second processing channel processes data samples provided by the second ADC, and includes a second slicer. The interleaving ADC timing error detector circuit controls delay of the first delay circuit and the second delay circuit based on an output signal of the first slicer, and an output signal or an input signal of the second slicer.

A receiver circuit includes an ADC, a processing channel, and an interference detection path. The processing channel is configured to process data samples provided by the ADC, and includes a notch filter. The interference detection path is configured to detect interference in the data samples, and includes a slicer, a slicer error circuit, and an interference detection circuit. The slicer is configured to slice input of the notch filter. The slicer error circuit is configured to compute an error of the slicer. The interference detection circuit configured to detect an interference signal in the error of the slicer, and set the notch filter to attenuate the interference signal.

A single-ended successive approximation register (SAR) analog-to-digital converter (ADC) includes a first digital-to-analog converter (DAC) having a first capacitor associated with a most significant bit (MSB) of the output code, and a second capacitor associated with other bit or bits of the output code; and a second DAC having a first capacitor associated with a MSB of the output code, and a second capacitor associated with other bit or bits of the output code. A bottom plate of the first capacitor of the second DAC is connected to a negative reference voltage in all phases.

A digital-to-analog conversion device and a digital-to-analog conversion system with multiple digital-to-analog conversion cores is provided. At least some of the multiple digital-to-analog conversion cores may be operated with different clock signals, especially with clock signals of different clock frequencies. For this purpose, each digital-to-analog conversion stage is provided with multiple different clock signals and each stage individually selects one of the multiple clock signals.

A sensor circuit includes at least one ring oscillator having a supply port supplied by at least one current source and a reference frequency. A comparator compares a frequency output of the at least one ring oscillator with the reference frequency to yield a measurement, such as a temperature measurement.