Various aspects provide for a digitally programmable analog duty-cycle correction circuit. For example, a system includes a duty-cycle correction circuit and a duty-cycle distortion detector circuit. The duty-cycle correction circuit adjusts a clock associated with the transmitter. The duty-cycle distortion detector circuit facilitates digital control of a duty-cycle of the clock associated with the duty-cycle correction circuit based on duty-cycle distortion error associated with output of the transmitter.

A circuit includes a digital-to-analog conversion circuit, an amplifying circuit, a mixing circuit, and an analog-to-digital converter. The digital-to-analog conversion circuit is configured to receive and convert audio data in the digital domain and output audio data in the analog domain. The audio data includes a main-tone component. The amplifying circuit is configured to output an audio signal according to the audio data in the analog domain. The mixing circuit is configured to eliminate the main-tone component according to the audio data in the analog domain and the audio signal and to output a feedback signal. The analog-to-digital converter is configured to convert the feedback signal from the analog domain to the digital domain.

A circuit includes a digital-to-analog conversion circuit, an amplifying circuit, a mixing circuit, and an analog-to-digital converter. The digital-to-analog conversion circuit is configured to receive and convert audio data in the digital domain and output audio data in the analog domain. The audio data includes a main-tone component. The amplifying circuit is configured to output an audio signal according to the audio data in the analog domain. The mixing circuit is configured to eliminate the main-tone component according to the audio data in the analog domain and the audio signal and to output a feedback signal. The analog-to-digital converter is configured to convert the feedback signal from the analog domain to the digital domain.

Techniques for testing circuits, such as converter circuits, such as digital-to-analog converter circuits (DACs), are described. A digital signal processor (DSP) can generate a waveform, such as sine wave, and apply the sine wave to the circuit under test, e.g., a DAC. The DAC can generate an output and the DSP can regenerate the waveform and determine an accuracy of the DAC such as to determine whether the DAC meets one or more specified criteria. In some example implementations, the tests can be performed using variable voltage amplitude segments.

A multilevel analog to digital converter (ADC) is composed of noise shaping filter and multi-level quantizer, where said quantizer is made from an array of comparators, each coupled with one reference level, the said quantizer is coupled with a thermometric digital to analog converters (DAC) in the feedback path, the said DAC output is compared with ADC input and error is fed to noise shaping filter, said reference levels of each quantizer is generated from a digital to analog converter coupled with a digital quantizer reference controller and said digital quantizer reference controller is randomly changing the reference levels in a way that quantizer coupled DAC elements are indirectly randomised to improve the overall linearity and noise performance of the converter.

A multilevel analog to digital converter (ADC) is composed of noise shaping filter and multi-level quantizer, where said quantizer is made from an array of comparators, each coupled with one reference level, the said quantizer is coupled with a thermometric digital to analog converters (DAC) in the feedback path, the said DAC output is compared with ADC input and error is fed to noise shaping filter, said reference levels of each quantizer is generated from a digital to analog converter coupled with a digital quantizer reference controller and said digital quantizer reference controller is randomly changing the reference levels in a way that quantizer coupled DAC elements are indirectly randomised to improve the overall linearity and noise performance of the converter.

Enhanced operational amplifier trim circuitry and techniques are presented herein. In one implementation, a circuit includes a reference circuit configured to produce a set of reference voltages, and a digital-to-analog conversion (DAC) circuit. The DAC circuit comprises a plurality of transistor pairs, where each pair among the plurality of transistor pairs is configured to provide portions of adjustment currents for an operational amplifier based at least on the set of reference voltages and sizing among transistors of each pair. The circuit also includes drain switching elements coupled to drain terminals of the transistors of each pair and configured to selectively couple one or more of the portions of the adjustment currents to the operational amplifier in accordance with digital trim codes.

Enhanced operational amplifier trim circuitry and techniques are presented herein. In one implementation, a circuit includes a reference circuit configured to produce a set of reference voltages, and a digital-to-analog conversion (DAC) circuit. The DAC circuit comprises a plurality of transistor pairs, where each pair among the plurality of transistor pairs is configured to provide portions of adjustment currents for an operational amplifier based at least on the set of reference voltages and sizing among transistors of each pair. The circuit also includes drain switching elements coupled to drain terminals of the transistors of each pair and configured to selectively couple one or more of the portions of the adjustment currents to the operational amplifier in accordance with digital trim codes.

A current transformer (CT) for the purpose of, for example, current measurement, that uses a power line as a first coil and a second coil for measurement purposes, is further equipped with a third coil. Circuitry connected to the third coil is adapted to measure a signal therefrom. The measured signal from the third coil is compared to a signal measured from the second coil and based on the results, internal CT parameters are determined allowing calibration of actual results to expected results thereby providing an improved accuracy. This is especially desirable when using the CT for measurement of the like of current or phase of the primary coil when measurements are adjusted using the newly determined calibration parameters.

A current transformer (CT) for the purpose of, for example, current measurement, that uses a power line as a first coil and a second coil for measurement purposes, is further equipped with a third coil. Circuitry connected to the third coil is adapted to inject a known reference signal to the third coil of the CT. The injected reference signal, i.e., current, generates signals in the first and second coils of the CT. The signal generated in the second coil is compared using circuitry attached thereto to the reference signal. Based on the results, and the difference between the expected results and the actual results, updated calibration parameters are determined. These provide improved accuracy when using the CT, for example for measurement of the like of current or phase of the primary coil when measurements are adjusted using the newly determined calibration parameters.