The present invention can be directed to a mass spectrometer, relevant parts thereof like replacement kits or upgrading kits and/or mass spectrometry methods. A mass spectrometer according to the present invention can comprise at least one ion source for generating a beam of ions from a sample. Moreover at least one mass filter downstream of the ion source can be provided and adapted to select ions from the beam by their mass-to-charge ratio (m/z). Furthermore at least one collision cell arranged downstream of the mass filter can be arranged. At least one sector field mass analyser arranged downstream of the collision cell can be further provided and at least one ion multicollector comprising a plurality of ion detectors arranged downstream of the mass analyser, for detecting a plurality of different ion species in parallel and/or simultaneously.

The present invention can be directed to a mass spectrometer, relevant parts thereof like replacement kits or upgrading kits and/or mass spectrometry methods. A mass spectrometer according to the present invention can comprise at least one ion source for generating a beam of ions from a sample. Moreover at least one mass filter downstream of the ion source can be provided and adapted to select ions from the beam by their mass-to-charge ratio (m/z). Furthermore at least one collision cell arranged downstream of the mass filter can be arranged. At least one sector field mass analyser arranged downstream of the collision cell can be further provided and at least one ion multicollector comprising a plurality of ion detectors arranged downstream of the mass analyser, for detecting a plurality of different ion species in parallel and/or simultaneously.

A zircon ID-TIMDS Pb isotope determination method by multiple ion counters with a dynamic multi-collection protocol is provided. Compared with a commonly used multi-ion counter static determination method, the method provided by the present invention completely eliminates influences of gain differences of the different ion counters on determination results of Pb isotopes. Compared with a conventional single-ion counter determination method with five times of peak-jumps, the method provided by the present invention can obtain all of Pb isotope ratios with two times of peak-jumps, which increases the collection efficiency of Pb isotope ion beams and decreases influences of ion beam stability on Pb isotope analysis results. Consequently, compared with a multi-ion counter static method and a single-ion counter peak-jumping method, the method provided by the present invention improves the Pb isotope analysis precision for the single-grain zircon ID-TIMS UPb dating method (with a .sup.205Pb tracer), having application potentials.

A zircon ID-TIMDS Pb isotope determination method by multiple ion counters with a dynamic multi-collection protocol is provided. Compared with a commonly used multi-ion counter static determination method, the method provided by the present invention completely eliminates influences of gain differences of the different ion counters on determination results of Pb isotopes. Compared with a conventional single-ion counter determination method with five times of peak-jumps, the method provided by the present invention can obtain all of Pb isotope ratios with two times of peak-jumps, which increases the collection efficiency of Pb isotope ion beams and decreases influences of ion beam stability on Pb isotope analysis results. Consequently, compared with a multi-ion counter static method and a single-ion counter peak-jumping method, the method provided by the present invention improves the Pb isotope analysis precision for the single-grain zircon ID-TIMS UPb dating method (with a .sup.205Pb tracer), having application potentials.

An ion source (30) for a static gas mass spectrometer is described. The ion source (30) comprises: a source block (310) defining a volume V to receive a sample gas G; an electron source (320) in fluid communication with the source block (310) and configured to provide a flux of electrons E therein for ionising the sample gas G; a set of electrodes (330), including a first electrode (330A), disposed between the electron source (320) and the source block (310); and a controller (not shown) configured to control a voltage applied to the first electrode (330A) to attenuate the flux of the electrons E into the source block (310) during a first time period following receiving of the sample gas G in the source block (310) and to permit the flux of the electrons E into the source block (310) during a second time period following the first time period.

An ion source (30) for a static gas mass spectrometer is described. The ion source (30) comprises: a source block (310) defining a volume V to receive a sample gas G; an electron source (320) in fluid communication with the source block (310) and configured to provide a flux of electrons E therein for ionising the sample gas G; a set of electrodes (330), including a first electrode (330A), disposed between the electron source (320) and the source block (310); and a controller (not shown) configured to control a voltage applied to the first electrode (330A) to attenuate the flux of the electrons E into the source block (310) during a first time period following receiving of the sample gas G in the source block (310) and to permit the flux of the electrons E into the source block (310) during a second time period following the first time period.

An electrostatic trap such as an orbitrap is disclosed, with an electrode structure. An electrostatic trapping field of the form U(r, , z) is generated to trap ions within the trap so that they undergo isochronous oscillations. The trapping field U(r, , z) is the result of a perturbation W to an ideal field U(r, , z) which, for example, is hyperlogarithmic in the case of an orbitrap. The perturbation W may be introduced in various ways, such as by distorting the geometry of the trap so that it no longer follows an equipotential of the ideal field U(r, , z), or by adding a distortion field (either electric or magnetic). The magnitude of the perturbation is such that at least some of the trapped ions have an absolute phase spread of more than zero but less than 2 radians over an ion detection period T.sub.m.

Disclosed herein are embodiments of a system for selectively ionizing samples that may comprise a plurality of different analytes that are not normally detectable using the same ionization technique. The disclosed system comprises a unique split flow tube that can be coupled with a plurality of ionization sources to facilitate using different ionization techniques for the same sample. Also disclosed herein are embodiments of a method for determining the presence of analytes in a sample, wherein the number and type of detectable analytes that can be identified is increased and sensitivity and selectivity are not sacrificed.

Among other things, we describe methods and apparatus for the ionization of target molecular analytes of interest, e.g., for use in mass spectrometry. In some implementations, a thin molecular stream is emitted in either single or a split mode and encounters both an electron-impact ion source and trochoidal electron monochromator placed sequentially or coincidentally. The first ion source emits high-energy electrons (70 eV) to generate characteristic positively-charged mass fragment spectra while the second source emits low-energy electrons in a narrow bandwidth to generate negative molecular ions or other ions via electron capture ionization. The dual ion source may be coupled to analytical instruments such as a gas chromatograph and to any number of mass analyzers such as a polarity switching quadrupole mass analyzer or to multiple mass analyzers.

Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi- reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.