Provided are improved manufacturing methods of semiconductor devices, probe cards, test apparatuses including the probe card, and methods for manufacturing probe cards. The probe card includes a circuit board, a support located under the circuit board, and a plurality of probe needles located on a bottom surface of the support. Each of the probe needles has a tip configured to contact a side surface of a bump included in a test target. The support may include a stress absorption layer located on a bottom surface to which the probe needles are connected. Manufacturing of semiconductor devices may comprise forming elongated conductive bumps on a body of a semiconductor device, testing the semiconductor device by contacting tips of the probe needles to sides surfaces of the bumps and packaging of the semiconductor device.

Electrical connector for an apparatus for charging electric storage battery cells, which comprises a bush power supplied by an electrical power source and provided with an end wall intended to abut against an electrode of a cell of an electric storage battery in order to power supply it. The electrical connector also comprises an electrical contacting element mounted inside the bush and provided with a plurality of pins which traverse corresponding through holes, electrically isolated, of the end wall of the bush in order to abut against the electrode of the cell so to carry out electrical measurements.

An electric circuit jumper having a coupling that electrically connects a first electrical connector and a second electrical connector that are to be connected, respectively, with a first point of electric circuit and a second point of the electric circuit. A first probe, intended to be electrically connected to the first point in the electric circuit, is electrically connected to the first electrical connector and a second probe, intended to be electrically connected to the second point in the electric circuit, is electrically connected to the second electrical connector. The electric circuit is bypassed by electrically jumping from the first point of the electric circuit to the second point of the electric circuit via the first probe, the first electrical connector, the coupling, the second electrical connector, and the second probe.

A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a split plunger member comprised of an upper split plunger part separated from a lower split plunger part separated by a diagonal cut reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the upper split plunger part and the second end of the internal cavity. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first split plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second split plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. The first and second split plunger members are each comprised of two parts: a first upper plunger part separated from a first lower plunger part by a diagonal cut. A spring member is positioned in the internal cavity between the first and second upper split plunger parts. In each split plunger the diagonal surface of the upper split plunger part exerts a transverse force to the diagonal surface of the lower split plunger part ensuring good electrical contact between the lower split plunger member part and the barrel wall.

A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one rectangular cavity formed in the plunger member with a movable cylindrical bearing in the cavity that applies a slight transverse force to the plunger member ensuring good electrical contact between the plunger and the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. At least one rectangular cavity formed in the first plunger member with a first movable cylindrical bearing in the cavity that applies a slight transverse force to the first plunger member ensuring good electrical contact between the first plunger member and the wall of the barrel member and at least one rectangular cavity formed in the second plunger member with a second movable cylindrical bearing in the cavity that applies a slight transverse force to the second plunger member ensuring good electrical contact between the second plunger member and the wall of the barrel member.

An extensible medical lead comprises at least one proximal contact, at least one distal electrode, and having at least one conductive filer electrically coupled between the proximal contacts and the distal stimulation electrode. The lead further comprises an outer jacket made of a longitudinally compressible material. The conductive filer may also be coiled to provide extensibility.

An extensible medical lead comprises at least one proximal contact, at least one distal electrode, and having at least one conductive filer electrically coupled between the proximal contacts and the distal stimulation electrode. The lead further comprises an outer jacket made of a longitudinally compressible material. The conductive filer may also be coiled to provide extensibility.

An ultrasound probe according to the present invention includes: a main body section including a plurality of transducers configured to send and receive an ultrasonic wave to and from an inside of a diagnosing object; a cable including a plurality of signal lines connected to the plurality of transducers, and a sheath configured to cover the plurality of signal lines; a connector section configured to connect the cable to an ultrasound diagnostic apparatus; and a bush including a through hole where the cable is passed, configured to fix the cable passed through the through hole together with the sheath that is folded back, and including a fixed portion fixed, in place, to the connector section.

An ultrasound probe according to the present invention includes: a main body section including a plurality of transducers configured to send and receive an ultrasonic wave to and from an inside of a diagnosing object; a cable including a plurality of signal lines connected to the plurality of transducers, and a sheath configured to cover the plurality of signal lines; a connector section configured to connect the cable to an ultrasound diagnostic apparatus; and a bush including a through hole where the cable is passed, configured to fix the cable passed through the through hole together with the sheath that is folded back, and including a fixed portion fixed, in place, to the connector section.

The invention relates to a connector plug for a medical instrument, in particular a bipolar electrode or forceps, comprising an insulating body for connecting two limbs of the instrument, wherein the insulating body has openings for receiving, inserting or sliding in the limbs, wherein in each of the openings a latching or spring element is provided for fastening one of the limbs of the instrument in the insulating body.