The invention relates to a connector plug for a medical instrument, in particular a bipolar electrode or forceps, comprising an insulating body for connecting two limbs of the instrument, wherein the insulating body has openings for receiving, inserting or sliding in the limbs, wherein in each of the openings a latching or spring element is provided for fastening one of the limbs of the instrument in the insulating body.

An electric circuit jumper having a coupling that electrically connects a first electrical connector and a second electrical connector that are to be connected, respectively, with a first point of electric circuit and a second point of the electric circuit. A first probe, intended to be electrically connected to the first point in the electric circuit, is electrically connected to the first electrical connector and a second probe, intended to be electrically connected to the second point in the electric circuit, is electrically connected to the second electrical connector. The electric circuit is bypassed by electrically jumping from the first point of the electric circuit to the second point of the electric circuit via the first probe, the first electrical connector, the coupling, the second electrical connector, and the second probe.

A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one cavity formed in the plunger member with a conductive bearing in the cavity in electrical contact with the plunger and with the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. At least one cavity formed in the first plunger member with a first conductive bearing in the cavity in electrical contact with the first plunger and with the wall of the barrel member and at least one cavity formed in the second plunger member with a second conductive bearing in the cavity in electrical contact with the second plunger and with the wall of the barrel member.

A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one rectangular cavity formed in the plunger member with a movable cylindrical bearing in the cavity that applies a slight transverse force to the plunger member ensuring good electrical contact between the plunger and the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. At least one rectangular cavity formed in the first plunger member with a first movable cylindrical bearing in the cavity that applies a slight transverse force to the first plunger member ensuring good electrical contact between the first plunger member and the wall of the barrel member and at least one rectangular cavity formed in the second plunger member with a second movable cylindrical bearing in the cavity that applies a slight transverse force to the second plunger member ensuring good electrical contact between the second plunger member and the wall of the barrel member

A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one cavity formed in the plunger member with a conductive bearing in the cavity in electrical contact with the plunger and with the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. At least one cavity formed in the first plunger member with a first conductive bearing in the cavity in electrical contact with the first plunger and with the wall of the barrel member and at least one cavity formed in the second plunger member with a second conductive bearing in the cavity in electrical contact with the second plunger and with the wall of the barrel member.

A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a split plunger member comprised of an upper split plunger part separated from a lower split plunger part separated by a diagonal cut reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the upper split plunger part and the second end of the internal cavity. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first split plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second split plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. The first and second split plunger members are each comprised of two parts: a first upper plunger part separated from a first lower plunger part by a diagonal cut. A spring member is positioned in the internal cavity between the first and second upper split plunger parts. In each split plunger the diagonal surface of the upper split plunger part exerts a transverse force to the diagonal surface of the lower split plunger part ensuring good electrical contact between the lower split plunger member part and the barrel wall.

A method and structure for improving signal integrity probing. A coaxial or a microcoaxial cable is threaded through an optional alignment substrate where the cable is used to support or align the cable or an array of cables. A conductive elastomer is placed on a cable or a microcoaxial cable to improve signal integrity probing.

A method and structure for improving signal integrity probing. A coaxial or a microcoaxial cable is threaded through an optional alignment substrate where the cable is used to support or align the cable or an array of cables. A conductive elastomer is placed on a cable or a microcoaxial cable to improve signal integrity probing.

A connector includes a connector body including a hole, a contact disposed in the hole and arranged such that, when the connector is connected to a substrate, the contact is connected to a corresponding electrical pad on the substrate, a conductive elastomeric interface arranged such that, when the connector is connected to the substrate, the conductive elastomeric interface is between the connector body and the substrate, and a cable connected to the contact. The contact includes a ground ferrule and a locking ferrule arranged to mate with the hole, and the hole of the connector body and the locking ferrule are at least partially threaded. When the connector is connected to the substrate and when the locking ferrule is threaded with the hole, the ground ferrule contacts at least one of the conductive elastomeric interface and the upper surface of the substrate.

A contact-making device (10) is used for a resistance measurement on a test object (30). The test object (30) comprises a threaded hole (31), which has an internal thread (32). The contact-making device (10) is designed to be mechanically coupled to the internal thread (32) of the threaded hole (31). The contact-making device (10) comprises a first contact (11) and a second contact (12), in order to make electrical contact with the test object (30) at, at least, two points when the contact-making device (10) is mechanically coupled to the internal thread (32). The first contact (11) and the second contact (12) are electrically insulated from one another by an insulating material (15-17) in the contact-making device (10).