H01R11/18

CONTACT-MAKING DEVICE AND METHOD FOR MAKING ELECTRICAL CONTACT WITH A TEST OBJECT
20170089965 · 2017-03-30 · ·

A contact-making device (10) is used for a resistance measurement on a test object (30). The test object (30) comprises a threaded hole (31), which has an internal thread (32). The contact-making device (10) is designed to be mechanically coupled to the internal thread (32) of the threaded hole (31). The contact-making device (10) comprises a first contact (11) and a second contact (12), in order to make electrical contact with the test object (30) at, at least, two points when the contact-making device (10) is mechanically coupled to the internal thread (32). The first contact (11) and the second contact (12) are electrically insulated from one another by an insulating material (15-17) in the contact-making device (10).

METHOD FOR MANUFACTURING CONTACT TIP AND ELECTROCONDUCTIVE PIN HAVING CONTACT TIP
20250219307 · 2025-07-03 ·

Proposed are a method for manufacturing a contact tip that can form a contact tip and an end portion into various shapes, and an electroconductive pin having a contact tip and an end portion of various shapes. A contact tip of various shapes can be provided by manufacturing a contact tip through processing, and adjusting the height of an end portion, the slope of the end portion, and the interval between end portions. In addition, an electroconductive pin of various shapes can be provided by forming a contact tip into various shapes through processing.

METHOD FOR MANUFACTURING CONTACT TIP AND ELECTROCONDUCTIVE PIN HAVING CONTACT TIP
20250219307 · 2025-07-03 ·

Proposed are a method for manufacturing a contact tip that can form a contact tip and an end portion into various shapes, and an electroconductive pin having a contact tip and an end portion of various shapes. A contact tip of various shapes can be provided by manufacturing a contact tip through processing, and adjusting the height of an end portion, the slope of the end portion, and the interval between end portions. In addition, an electroconductive pin of various shapes can be provided by forming a contact tip into various shapes through processing.

Temperature probe and method for manufacturing a temperature probe

A temperature probe for determining the temperature according to the three-point probe method includes a three-wire line several meters long consisting of a first connecting line, a second connecting line, and a third connecting line connected to sensor element. The connecting lines are made of a first material and serve to transmit energy and the measured temperature values. A conductive element made of a second material is inserted in the second connecting line and in the third connecting line. The resistivity of said second material is higher than the resistivity of the first material. The two inserted conductive elements are designed such that the second connecting line and the third connecting line have the same resistance as the first connecting line. Additionally, the present disclosure refers to a method describing the manufacture of a temperature probe.

Temperature probe and method for manufacturing a temperature probe

A temperature probe for determining the temperature according to the three-point probe method includes a three-wire line several meters long consisting of a first connecting line, a second connecting line, and a third connecting line connected to sensor element. The connecting lines are made of a first material and serve to transmit energy and the measured temperature values. A conductive element made of a second material is inserted in the second connecting line and in the third connecting line. The resistivity of said second material is higher than the resistivity of the first material. The two inserted conductive elements are designed such that the second connecting line and the third connecting line have the same resistance as the first connecting line. Additionally, the present disclosure refers to a method describing the manufacture of a temperature probe.

Battery probe set

The present disclosure relates to a battery probe set configured to plug into a battery tester and impinge upon one or more terminals of a battery. The battery probe set includes first and second probe assemblies, each including a housing with gripping portions and conductive ports, probe stems of varying lengths that attach to the housing, and probe tips that couple to the probe stems. The housing, probe stem, and probe tips are electrically coupled via conductive paths. The first and second probe assemblies are electrically coupled via a transverse connector, permitting the location of probe plugs onto one of the probe assemblies that is configured to be pluggable into the battery tester. The probe tips are interchangeable and include a light source.