In described examples, an integrated circuit includes an on-off keying (OOK) digital isolator, which includes a first circuitry, a multiplexer, an OOK modulator, an isolation barrier, an OOK envelope detector, and a second circuitry. The first circuitry generates and outputs a calibration signal. The multiplexer has a data signal input, and an input coupled to a first circuitry output. An OOK modulator input is coupled to a multiplexer output. An isolation barrier input is coupled to an OOK modulator output. An OOK envelope detector input is coupled to an isolation barrier output. The second circuitry includes an input coupled to an OOK envelope detector output, and an output coupled to an OOK envelope detector control input. The second circuitry detects a duty cycle distortion (DCD) of the OOK envelope detector output, and outputs a control signal to change the OOK envelope detector output's duty cycle based on the detected DCD.

A random number generator including: a first ring oscillator including a first inverter chain, the first inverter chain including a plurality of serially connected first inverters, the first ring oscillator configured to output a first random signal generated at a first sub-node between two neighboring first inverters among the plurality of first inverters; a second ring oscillator including a second inverter chain, the second inverter chain including a plurality of serially connected second inverters, the second ring oscillator configured to output a second random signal generated at a second sub-node between two neighboring second inverters among the plurality of second inverters; and a signal processing circuit for generating a random number by combining the first random signal with the second random signal.

A random number generator including: a first ring oscillator including a first inverter chain, the first inverter chain including a plurality of serially connected first inverters, the first ring oscillator configured to output a first random signal generated at a first sub-node between two neighboring first inverters among the plurality of first inverters; a second ring oscillator including a second inverter chain, the second inverter chain including a plurality of serially connected second inverters, the second ring oscillator configured to output a second random signal generated at a second sub-node between two neighboring second inverters among the plurality of second inverters; and a signal processing circuit for generating a random number by combining the first random signal with the second random signal.

A duty cycle correction circuit comprises a buffer stage which outputs a digital output signal having a duty cycle. At least one buffer of the buffer stage is configured to exhibit a controllable tripping threshold. A control loop circuit comprises a sensing circuit including a switched capacitor that is reset to a reference potential and time-integrates the digital output signal. A comparator is configured to compare the potential at a terminal of the capacitor with the reference potential. A register stores a correction value determined by the comparator to adjust the tripping threshold of the at least one buffer.

A duty cycle correction circuit comprises a buffer stage which outputs a digital output signal having a duty cycle. At least one buffer of the buffer stage is configured to exhibit a controllable tripping threshold. A control loop circuit comprises a sensing circuit including a switched capacitor that is reset to a reference potential and time-integrates the digital output signal. A comparator is configured to compare the potential at a terminal of the capacitor with the reference potential. A register stores a correction value determined by the comparator to adjust the tripping threshold of the at least one buffer.

Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

A device of measuring a duty cycle includes a resistor-capacitor circuit and a control circuit. The resistor-capacitor circuit is used to generate a first voltage when a reference signal is in a first state, and generate a second voltage and a third voltage when the reference signal is in a second state. The control circuit is coupled to the resistor-capacitor circuit, and configured to acquire an ON-time according to the first voltage, the second voltage and the third voltage. The ON-time is a time interval during which the reference signal is in the first state.

A phase locked loop includes a pulse limiter between a phase frequency detector and a charge pump. The phase frequency detector generates and sends a clock pulse to the pulse limiter. The pulse limiter generates a first signal that indicates that the clock pulse is greater than a minimum pulse width of the phase frequency detector. The pulse limiter receives a pulse limiter buffer selection signal that selects one buffer of a plurality of buffers within the pulse limiter. The pulse limiter generates a second signal that indicates a truncated pulse width as the minimum pulse width of the phase frequency detector plus a delay period that is associated with the pulse limiter buffer selection signal. The pulse limiter truncates the clock pulse to the truncated pulse width and sends the truncated clock pulse to the charge pump.

A phase locked loop includes a pulse limiter between a phase frequency detector and a charge pump. The phase frequency detector generates and sends a clock pulse to the pulse limiter. The pulse limiter generates a first signal that indicates that the clock pulse is greater than a minimum pulse width of the phase frequency detector. The pulse limiter receives a pulse limiter buffer selection signal that selects one buffer of a plurality of buffers within the pulse limiter. The pulse limiter generates a second signal that indicates a truncated pulse width as the minimum pulse width of the phase frequency detector plus a delay period that is associated with the pulse limiter buffer selection signal. The pulse limiter truncates the clock pulse to the truncated pulse width and sends the truncated clock pulse to the charge pump.