A delay circuit includes an electronic transmission element with a first input and a first output. The first input is coupled to the first output by two first switches wired in parallel. The first switches each have a control input, a second input and a second output. The second input is coupled to the second output by two second switches wired in parallel. The circuit further includes an input circuit to receive an input signal and feed the input signal to one of the transmission element inputs and feed the inverted input signal to the other of the transmission element inputs, and an output circuit. The output circuit is configured such that the output signal only changes in the case of a change in the input signal if the change in the input signal has brought about a change both at the first output and at the second output.

According to examples, an apparatus may include a field effect transistor (FET), a driver to receive an input signal and to output a driver output signal, and a gate to receive the input signal. The apparatus may also include a delay element to receive the driver output signal and to output a delayed signal to the gate after a delay from receipt of the driver output signal, in which the gate is to output a gate output signal to the FET in response to receipt of the input signal and the delayed signal, and in which receipt of the gate output signal by the FET drives the FET to provide a boost to the driver output signal.

There is provided a CMOS inverter circuit device. The CMOS inverter circuit device includes a delay circuit unit configured to generate different charge and discharge paths of each gate node of a PMOS transistor and an NMOS transistor respectively at the time that an input signal transitions between high and low levels. Therefore, the present examples minimize or erase generation of a short circuit current made at the time that the input signal transition. The examples may simplify circuit architecture, and may make a magnitude of a CMOS inverter circuit device smaller.

A pulse counting circuit receives pulses supplied by a source circuit having at least two inverted pulse signal supply terminals. The circuit includes a first counter to count pulses of a first pulse signal and supply a first count and a second counter to count pulses of a second pulse signal and supply a second count. A selection circuit selects one of the first and second counts.

A Hardware-Embedded Delay PUF (HELP) leverages entropy by monitoring path stability and measuring path delays from core logic macros. HELP incorporates techniques to deal with bias. A unique feature of HELP is that it may compare data measured from different test structures. HELP may be implemented in existing FPGA platforms. HELP may leverage both path stability and within-die variations as sources of entropy.

Disclosed in present invention is a clock driving circuit resistant to single-event transient. The clock driving circuit resistant to single-event transient consists of two kinds of inverters: double-input double-output (DIDO) inverter and double-input single-output (DISO) inverter, the specific number of the two kinds of inverters used, and the connection way thereof are determined by the complexity of a designed circuit and a clock design method used by the designed circuit. The DIDO inverter and DISO inverter both comprise two PMOS transistors and two NMOS transistors. In a clock distribution network based on double-input double-output and double-input single-output clock inverters, the probability that single-event transient pulses generated on the DIDO inverter are propagated to clock leaf nodes is zero. Therefore, the invention significantly improves the ability of the clock distribution network to resist single-event transient, effectively reducing the probability that the clock distribution network generates single-event transient pulses on the respective clock leaf nodes after being bombarded by radiation particles. Thus, the reinforced clock circuit resistant to single-event transient of the present invention is superior to a conventional unreinforced clock circuit in single-event transient resistance.

A power stage includes a power transistor and a driver, the power transistor comprising a collector, a gate and an emitter and being configured to change over from a saturated state to an off state and vice versa in accordance with a control from the driver, the power stage comprising a resistor Rg positioned between the driver and the gate, the power stage comprising a circuit for compensating for delays that is positioned in parallel with the resistor Rg, comprising: a circuit for compensating for turn-on initialization delays, which is configured to divert the current from the resistor Rg when a saturation of the power transistor is initialized, a circuit for compensating for turn-off initialization delays, which is configured to divert the current from the resistor Rg when a switching-off of the power transistor is initialized, a circuit for compensating for delays that is configured to divert the current from the resistor Rg when the power transistor is close to the saturated state.

An example method performed for a circuit path includes: receiving signals in the circuit path; and controlling states of the signals in the circuit path based on skews produced by circuits electrically connected in series in the circuit path. The states are controlled by inverting or not inverting the signals in the circuit path so that skews produced by different circuits in the circuit paths at least partially cancel.

A Hardware-Embedded Delay PUF (HELP) leverages entropy by monitoring path stability and measuring path delays from core logic macros. HELP incorporates techniques to deal with bias. A unique feature of HELP is that it may compare data measured from different test structures. HELP may be implemented in existing FPGA platforms. HELP may leverage both path stability and within-die variations as sources of entropy.

Aspects of various embodiments of the present disclosure are directed to methods and circuits preventing hold violations in clock synchronized circuits. In an example implementation, a circuit includes a logic circuit having a set of inputs. Signal propagation time on a signal path to at least one of the set of inputs presents a hold violation. The circuit includes first and second level-sensitive latches. The first level-sensitive latch has an output connected to the one of the plurality of inputs. The second level-sensitive latch has an input connected to an output of the logic circuit. A latch control circuit is configured to remove the hold violation on the input by providing a pulsed clock signal to a clock input of the second level-sensitive latch and an inversion of the pulsed clock signal to a clock input of the first level-sensitive latch.