There is described an analog-to-digital converter, ADC, device (100), comprising: i) a first converter stage (110), comprising a first digital-to-analog converter, DAC, (115), comprising at least two first unit elements (116, 117, 118) each with a first unit element value (U11, U12, U13); ii) a second converter stage (120), comprising a second DAC (125), comprising at least two second unit elements each with a second unit element value (U21, U22, U23); and iii) a control device (180), coupled to the first DAC (115) and the second DAC and configured to: swap at least one of the first unit element values (U1) with at least one of the second unit element values (U2) to obtain corresponding third unit element values (U3) and forth unit element values (U4).

A sample and hold (S/H) circuit includes an analog-to-digital converter (ADC), a register and a digital-to-analog converter (DAC). The ADC receives an input signal and converts the input signal into a digital code. The register, coupled to the ADC, stores the digital code. The DAC, coupled to the register, converts the digital code into an output signal.

An analog-to-digital converter (ADC) having an input operable to receive an input voltage, V.sub.IN, and an output operable to output a digital code representative of V.sub.IN, the ADC including: a voltage-to-delay circuit having an input and an output, the input of the voltage-to-delay circuit coupled to the input of the ADC; a folding circuit having an input and an output, the input of the folding circuit coupled to the output of the voltage-to-delay circuit; and a time delay-based analog-to-digital converter backend having an input and a digital code output coupled to the output of the ADC, the input of the time delay-based analog-to-digital converter backend coupled to the output of the folding circuit.

A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

A method is provided for improving the EMC robustness of Integrated Capacitive Sensor systems with a sensor Signal-Conditioner (SSC). The SSC is connected with a capacitive integrating converter to convert a received signal into a bit stream. An oscillator provides a plurality of sampling frequencies. A counter connected with the capacitive integrating converter collects the bit stream and calculates the digital representative of the physical input which is than stored in an output register. The method includes performing some conversions with different sampling frequencies from the oscillator or a frequency divider by the capacitive integrating Signal-Converter; storing the results of the samplings and using the results in the following cycle to calculate for each sampling frequency a difference to the prior sampling of the same frequency; and calculating the digital representative of the input signal from the external sensing capacitor as the reverse weighted average of the samplings of the different frequencies.

A method is provided for improving the EMC robustness of Integrated Capacitive Sensor systems with a sensor Signal-Conditioner (SSC). The SSC is connected with a capacitive integrating converter to convert a received signal into a bit stream. An oscillator provides a plurality of sampling frequencies. A counter connected with the capacitive integrating converter collects the bit stream and calculates the digital representative of the physical input which is than stored in an output register. The method includes performing some conversions with different sampling frequencies from the oscillator or a frequency divider by the capacitive integrating Signal-Converter; storing the results of the samplings and using the results in the following cycle to calculate for each sampling frequency a difference to the prior sampling of the same frequency; and calculating the digital representative of the input signal from the external sensing capacitor as the reverse weighted average of the samplings of the different frequencies.

An analog-to-digital converter (ADC) includes a first ADC stage with a first sub-ADC stage configured to sample the analog input voltage in response to a first phase clock signal and output a first digital value corresponding to an analog input voltage in response to a second phase clock signal. A current mode DAC stage is configured to convert the analog input voltage and the first digital value to respective first and second current signals, determine a residue current signal representing a difference between the first and the second current signal, and convert the residue current signal to an analog residual voltage signal. A second ADC stage is coupled to the first ADC stage to receive the analog residual voltage signal, and convert the analog residue voltage signal to a second digital value. An alignment and digital error correction stage is configured to combine the first and the second digital values.

A method for light-to-digital conversion includes setting a time integrator circuit into a reference condition and starting to integrate charge from a sensor device for the duration of an integration time. An integration signal is generated and is indicative of the integrated charge. The integration signal is compared with an adjustable reference signal. A first count is generated when the comparison indicates that the integration signal has reached an integration range, wherein the integration range is defined by a low and a high voltage. A second count is generated when the comparison indicates that the integration signal has reached the adjustable reference signal. The adjustable reference signal is incremented in discrete steps when a second count has been generated. Then, the time integrator circuit is reset into the reference condition, when the comparison indicates that the integration signal has reached the integration range. The generated first counts is collected as first count signal and the generated second counts are collected as second count signal. Finally, a digital output signal is generated depending on the first count signal and the second count signal.

Technologies are provided for time-to-digital conversion without reliance on a clocking signal. The technologies include a clockless TDC apparatus that can map continuous pulse-widths to binary bits represented via an iterative chaotic map (e.g., tent map, Bernoulli shift map, or similar). The clockless TDC apparatus can convert separated pulses to a single asynchronous digital pulse that turns on when a sensor detects a first pulse and turns off when the sensor detects a second pulse. The asynchronous digital pulse can be iteratively stretched and folded in time according to the chaotic map. The clockless TDC can generate a binary sequence that represents symbolic dynamics of the chaotic map. The process can be implemented by using an iterative time delay component until a precision of the binary output is either satisfied or overwhelmed by noise or other structural fluctuations of the TDC apparatus.