A laminate contains a crystal substrate; a middle layer formed on a main surface of the crystal substrate, the middle layer comprising a mixture of an amorphous region in an amorphous phase and a crystal region in a crystal phase having a corundum structure mainly made of a first metal oxide; and a crystal layer formed on the middle layer and having a corundum structure mainly made of a second metal oxide, wherein the crystal region is an epitaxially grown layer from a crystal plane of the crystal substrate.

A two-dimensional semiconductor transistor includes a gate electrode, a gate insulating layer disposed on the gate electrode, an organic dopant layer disposed on the gate insulating layer and comprising an organic material including electrons, a two-dimensional semiconductor layer disposed on the organic dopant layer, a source electrode disposed on the two-dimensional semiconductor layer, and a drain electrode disposed on the two-dimensional semiconductor layer and spaced apart from the source electrode. A hysteresis of the two-dimensional semiconductor transistor is reduced due to the two-dimensional semiconductor transistor including the organic dopant layer.

A thin film transistor, a manufacturing method thereof, an array substrate and an electronic device arc provided. The thin film transistor includes an active layer including multiple oxide layers which includes a channel layer, a transition layer and a first barrier layer, the channel layer is an layer with a highest carrier mobility, the channel layer is a crystalline or amorphous oxide layer, the transition layer is in direct contact with the channel layer, the first barrier layer is an outermost oxide layer, the first barrier layer and the transition layer are both crystalline oxide layers; a crystallization degree of the first barrier layer and a crystallization degree of the transition layer are greater than a crystallization degree of the channel layer, and a band gap of the first barrier layer and a band gap of the transition layer are larger than a band gap of the channel layer.

Semiconductor devices and corresponding methods of manufacturing the same are disclosed. For example, a semiconductor device includes a first transistor comprising a first channel region. The first channel region includes one or more first nanostructures formed of a semiconductor material. The semiconductor device includes a second transistor disposed vertically with respect to the first transistor and comprising a second channel region. The second channel region includes one or more second nanostructures formed of a conductive oxide material.

Heterostructures include a layer of a two-dimensional material placed on a multiferroic layer. An ordered array of differing polarization domains in the multiferroic layer produces corresponding domains having differing properties in the two-dimensional material. When the multiferroic layer is ferroelectric, the ferroelectric polarization domains in the layer produce local electric fields that penetrate the two-dimensional material. The local electric fields modulate the charge carriers and carrier density on a nanometer length scale, resulting in the formation of lateral p-n or p-i-n junctions, and variations thereof appropriate for device functions.

An integrated circuit includes a substrate, a transistor over the substrate, a first inter-metal dielectric (IMD) layer over the transistor, a metal via in the first IMD layer, a first 2-D material layer cupping an underside of the metal via, a second IMD layer over the metal via, a metal line in the second IMD layer, and a second 2-D material layer cupping an underside of the metal line. The second 2-D material layer span across the metal via and the first 2-D material layer.

A transistor includes a first gate electrode, a composite channel layer, a first gate dielectric layer, and source/drain contacts. The composite channel layer is over the first gate electrode and includes a first capping layer, a crystalline semiconductor oxide layer, and a second capping layer stacked in sequential order. The first gate dielectric layer is located between the first gate electrode and the composite channel layer. The source/drain contacts are disposed on the composite channel layer.

A semiconductor device comprising stacked complimentary transistors are described. In some embodiments, the semiconductor device comprises a first device comprising an enhancement mode III-N heterostructure field effect transistor (HFET), and a second device over the first device. In an example, the second device comprises a depletion mode thin film transistor. In an example, a connector is to couple a first terminal of the first device to a first terminal of the second device.

Disclosed are semiconductor devices including a double gate metal oxide semiconductor (MOS) transistor and methods for fabricating the same. The double gate MOS transistor includes a first back gate, a second back gate, and a first dielectric layer disposed on the first back gate and on the second back gate. An MX2 material layer is disposed on the first dielectric layer, a second dielectric layer disposed on the MX2 material layer, and a work function metal (WFM) is disposed on the second dielectric layer. A front gate is disposed on the WFM, which fills a space between the first back gate and the second back.

A transistor device including source and drain electrodes, a fin structure extending between and contacting respective sidewalls of the source and drain electrodes, a semiconductor channel layer over the upper surface and side surfaces of the fin structure and including a first and second vertical portions over the side surfaces of the fin structure, and the first and second vertical portions of the semiconductor channel layer both contact the respective sidewalls of the source electrode and the drain electrode, a gate dielectric layer over the semiconductor channel layer, and a gate electrode over the gate dielectric layer. By forming the semiconductor channel layer over a fin structure extending between sidewalls of the source and drain electrodes, a contact area between the semiconductor channel and the source and drain electrodes may be increased, which may provide increased driving current for the transistor device without increasing the device size.