A semiconductor device and a method of forming the same are provided. The semiconductor device includes a first logic die including a first through via, an image sensor die hybrid bonded to the first logic die, and a second logic die bonded to the first logic die. A front side of the first logic die facing a front side of the image sensor die. A front side of the second logic die facing a backside of the first logic die. The second logic die comprising a first conductive pad electrically coupled to the first through via.

A semiconductor device and a method of forming the same are provided. The semiconductor device includes a first logic die including a first through via, an image sensor die hybrid bonded to the first logic die, and a second logic die bonded to the first logic die. A front side of the first logic die facing a front side of the image sensor die. A front side of the second logic die facing a backside of the first logic die. The second logic die comprising a first conductive pad electrically coupled to the first through via.

An integrated circuit (IC) package is described. The IC package includes a first die having a first power delivery network on the first die. The IC package also includes a second die having a second power delivery network on the second die. The first die is stacked on the second die. The IC package further includes package voltage regulators integrated with and coupled to the first die and/or the second die within a package core of the integrated circuit package.

An integrated circuit (IC) package is described. The IC package includes a first die having a first power delivery network on the first die. The IC package also includes a second die having a second power delivery network on the second die. The first die is stacked on the second die. The IC package further includes package voltage regulators integrated with and coupled to the first die and/or the second die within a package core of the integrated circuit package.

Provided is packages and method of fabricating the same. The package includes a first die, a second die, and an inductor. The second die is bonded to the first die through a bonding structure thereof. The inductor is located in the bonding structure. The inductor includes a spiral pattern parallel to top surfaces of the first die and the second die, and the spiral pattern includes at least a turn.

Provided is packages and method of fabricating the same. The package includes a first die, a second die, and an inductor. The second die is bonded to the first die through a bonding structure thereof. The inductor is located in the bonding structure. The inductor includes a spiral pattern parallel to top surfaces of the first die and the second die, and the spiral pattern includes at least a turn.

A fan-out wafer-level package comprising at least one integrated circuit, an internal heat spreader thermally connected to the integrated circuit either directly or via an interface layer having a thickness in sub-μm range preferably in the range of 20 nm to 500 nm, wherein the internal heat spreader is embedded in the fan-out wafer-level package.

A fan-out wafer-level package comprising at least one integrated circuit, an internal heat spreader thermally connected to the integrated circuit either directly or via an interface layer having a thickness in sub-μm range preferably in the range of 20 nm to 500 nm, wherein the internal heat spreader is embedded in the fan-out wafer-level package.

A semiconductor device includes: a semiconductor element; a heat radiator body having a housing recess wherein a bottom surface of the housing recess is thermally connected to the upper surface of the semiconductor element; a heat sink which is thermally connected to an upper surface of the heat radiator body through adhesive agent; a sealing resin which covers the lower surface and a side surface of the heat radiator body, an inner side surface of the housing recess, and the lower surface and a side surface of the semiconductor element; and a wiring structure body formed on a lower surface of the sealing resin. The sealing resin includes a covering portion having an upper surface which is substantially flush with the bottom surface of the housing recess and covering the side surface of the heat radiator body. The adhesive agent contacts the side surface of the heat radiator body.

A semiconductor device includes: a semiconductor element; a heat radiator body having a housing recess wherein a bottom surface of the housing recess is thermally connected to the upper surface of the semiconductor element; a heat sink which is thermally connected to an upper surface of the heat radiator body through adhesive agent; a sealing resin which covers the lower surface and a side surface of the heat radiator body, an inner side surface of the housing recess, and the lower surface and a side surface of the semiconductor element; and a wiring structure body formed on a lower surface of the sealing resin. The sealing resin includes a covering portion having an upper surface which is substantially flush with the bottom surface of the housing recess and covering the side surface of the heat radiator body. The adhesive agent contacts the side surface of the heat radiator body.