Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate and the components are connected with conductive material in preformed holes in dielectric material in the bond lines aligned with TSVs of the devices and the exposed conductors of the substrate. Methods of fabrication are also disclosed.

An antenna structure includes a main radiator element, a parasitic radiator element, a feeder and at least one first high-impedance member. The parasitic radiator element is disposed in parallel with the main radiator element. The feeder is configured to electrically or electromagnetically couple the main radiator element. The at least one first high-impedance member directly contacts the parasitic radiator element and is configured to be electrically grounded.

The present disclosure provides an electronic package. The electronic package includes an antenna structure having a first antenna and a second antenna at least partially covered by the first antenna. The electronic package also includes a directing element covering the antenna structure. The directing element has a first portion configured to direct a first electromagnetic wave having a first frequency to transmit via the first antenna and a second portion configured to direct a second electromagnetic wave having a second frequency different from the first frequency to transmit via the second antenna. A method of manufacturing an electronic package is also provided.

A method for curing antenna violations on an integrated circuit that includes multiple levels includes: obtaining a design of a circuit, the design including a first element connected to first device and a second element connected to one or more second devices, wherein the first and second elements both receive a common signal; determining that an antenna violation exists in on the first element at a first level of the multiple levels; and modifying the design of the circuit to add a connected between the first element and the second element at the first layer or at a layer below the first layer.

A test assembly for testing an antenna-in-package (AiP) device includes a socket over a circuit board, where the socket includes an opening for receiving the AiP device; a plunger configured to move along sidewalls of the opening, where during testing of the AiP device, the plunger is configured to cause the AiP device to be pressed towards the circuit board such that the AiP device is operatively coupled to the circuit board via input/output connections of the AiP device and of the circuit board; and a loadboard disposed within the socket and between the plunger and the AiP device, where the loadboard includes a coupling structure configured to be electromagnetically coupled to a transmit antenna and to a receive antenna of the AiP device, so that testing signals transmitted by the transmit antenna are conveyed to the receive antenna externally relative to the AiP device through the coupling structure.

An electronic device can include a housing at least partially defining an internal volume and an exterior surface of the electronic device. The electronic device can also include a display assembly including a display layer, a substrate disposed below the display layer, and a substantially continuous sheet of conductive material disposed on the substrate, the sheet of conductive material covering substantially an entire surface of the substrate. A transparent cover can overlie the display assembly and can be affixed to the housing.

An interconnection device is described including a transmission part for feeding an antenna, the transmission part including a signal feed element and a ground element connectable to a circuit board, a first end of the ground element connectable to the circuit board and a second end of the ground element connectable to the antenna and a first end of the signal feed element connectable to an antenna feeding port on the circuit board and a second end of the signal feed element connectable to an antenna feeding line of the antenna.

A test set-up for testing a system-in package with an integrated antenna is described herein. According to one exemplary embodiment, the test set-up includes a carrier with an RF probe arranged thereon and a test socket with resilient electric contacts. The test socket is mounted on the carrier and provides an electric contact to interconnects of the package when it is placed on the test socket. The test socket has an opening which is arranged superjacent to the RF probe.

Some embodiments relate to a semiconductor module having an integrated antenna structure. The semiconductor module has an excitable element and a first ground plane disposed between a substrate and the excitable element. A second ground plane is separated from the first ground plane by the substrate. The second ground plane is coupled to the first ground plane by one or more through-substrate vias (TSVs) that extend through the substrate.

Embodiments of an embedded mm-wave radio integrated circuit into a substrate of a phased array module are disclosed. In some embodiments, the phased array module includes a first set of substrate layers made of a first material. The mm-wave radio integrated circuit may be embedded in the first set of substrate layers. A second set of substrate layers may be coupled to the first set of substrate layers. The second set of substrate layers may be made of a second material that has a lower electrical loss than the first material. The second set of substrate layers may include a plurality of antenna elements coupled through vias to the mm-wave radio integrated circuit.