A method of measuring signal change including performing at least one calculation or iteration step based on one or more chaos non-linear dynamical functions on first and second input signals, or sample of signals, to produce iteration values. Performing at least a second iteration step by repeating the at least one calculation or iteration step based on one or more non-linear dynamical functions on the first iteration values to produce a second iteration values and subtracting one set of iteration values generated from either the first or second input signal from the corresponding iteration values generated from the other input signal.

A digital to time converter (DTC) system is disclosed. The DTC system comprises a DTC circuit configured to generate a DTC output clock signal at a DTC output frequency, based on a DTC code. In some embodiments, the DTC system further comprises a calibration circuit comprising a period error determination circuit configured to determine a plurality of period errors respectively associated with a plurality consecutive edges of the DTC output clock signal. In some embodiments, each period error of the plurality of period errors comprises a difference in a measured time period between two consecutive edges of the DTC output clock signal from a predefined time period. In some embodiments, the calibration circuit further comprises an integral non-linearity (INL) correction circuit configured to determine a correction to be applied to the DTC code based on a subset of the determined period errors.

Various examples are directed to a variable speed comparator circuit comprising a first comparator, a second comparator, and a third comparator and a logic circuit. The first comparator may be configured to generate a first comparator output using a first input and a second input. The second comparator may be configured to generate a second comparator output using the first input and the second input. The third comparator may be configured to generate a third comparator output using the first input and the second input. A propagation delay of the second comparator may be less than a propagation delay of the first comparator. Also, a propagation delay of the third comparator may be less than the propagation delay of the second comparator. The second comparator may have an input offset relative to the third comparator. The logic circuit may be configured to determine that the second comparator output and the third comparator output are not equivalent and set a comparator circuit output to the first comparator output.

The present disclosure describes a system with a first counter circuit, a first converter circuit, a second counter circuit, and a second converter circuit. The first counter circuit is configured to output a first count value based on a comparison between a first reference value and a switched node value of a voltage regulator. The first converter circuit is configured to adjust an activation time of the voltage regulator based on the first count value. The second counter circuit is configured to output a second count value based on a comparison between a second reference value and the switched node value of the voltage regulator. The second converter circuit is configured to adjust an amount of current drawn away from an output of the voltage regulator based on the second count value.

A signal processing unit for an inductive position sensor is provided. The inductive position sensor provides a first position signal and a second phase-shifted position signal, such as, a sine position signal and a cosine position signal. The signal processing unit has an integrator for integrating an integer number of periods of the first position signal respectively an integer number of periods of the second phase-shifted position signal. The position of the moving target of the position sensor is calculated from the integrated first position signal and the integrated second phase-shifted position signal.

A pipeline ADC comprising an ADC segment and a digital backend coupled to the ADC segment. In some examples the ADC is configured to receive an analog signal, generate a first partial digital code representing a first sample of the analog signal, and generate a second partial digital code representing a second sample of the analog signal. In some examples the digital backend is configured to receive the first and second partial digital codes from the ADC segment, generate a combined digital code based at least partially on the first and second partial digital codes, determine a gain error of the ADC segment based at least partially on a first correlation of a PRBS with a difference between the first and second partial digital codes, and apply a first correction to the combined digital code based at least partially on the gain error of the ADC segment.

Circuits for a successive approximation register analog-to-digital converter and related methods. A global reference circuit includes a first super source follower (SSF) circuit having an input coupled to an output of a first current mirror and to a first adjustment circuit, and an operational amplifier having an input coupled to an output of the first SSF circuit and an output coupled to an input of the first current mirror. Local slices each include a second current mirror having an input coupled to the output of the operational amplifier, a second super source follower (SSF) circuit having an input coupled to an output of the second current mirror and to a second adjustment circuit. The first and second adjustment circuits may be configured to adjust a voltage at the input of the first SSF circuit and respective voltages at the input of the second SSF circuit of each local slice.

An analog-to-digital conversion circuit includes analog-to-digital converters (ADCs) including a target analog-to-digital converter (ADC) providing second data samples, a first adjacent ADC providing first data samples, and a second adjacent ADC providing third data samples. The ADCs perform an analog-to-digital conversion using a time-interleaving approach in response to clock signals having different phases and including a reference clock signal. A timing calibration circuit includes a relative time skew generator generating a relative time skew and an absolute time skew generator generate an absolute time skew. A clock generator adjusts at least one phase of the clock signals based on the absolute time skew.

A delay-domain analog-to-digital converter including a voltage-to-delay circuit and a time-to-digital converter circuit, and a method of calibrating the same. The voltage-to-delay circuit generates a delay signal based on applied calibration voltage, and the delay signal is applied to a first residue stage configured to generate a sign bit and a residue delay signal. The residue delay signal is applied to an input of a successive residue stage, which is configured to generate a sign bit and provide a residue delay signal to inputs of a next successive residue stage. First and second trim circuits are provided in a delay comparator of one of the successive residue stages, and configured to adjust a first response of the residue stage for a calibration voltage in a first range, and to adjust a second response of the residue stage for a calibration voltage in a second range.

An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) and a comparator having a first input coupled to receive an output voltage of the DAC, a second input, and a comparison output. The ADC also includes successive-approximation-register (SAR) circuitry having an input to receive the comparison output, and an output to provide an uncalibrated digital value. The DAC includes a Most Significant Bits (MSBs) sub-DAC including a set of MSB DAC elements and a Least Significant Bits (LSBs) sub-DAC including a set of LSB DAC elements. The ADC also includes calibration circuitry which receives the uncalibrated digital value and applies one or more calibration values to the uncalibrated digital value to obtain a calibrated digital value. The calibration circuitry obtains a calibration value for each MSB DAC element using the set of LSB DAC elements, the termination element, and at least one of the one or more redundant DAC elements.