In certain aspects, an analog-to-digital converter (ADC) includes a comparator having a first input, a second input, and an output. The ADC also includes a digital-to-analog converter (DAC) coupled to the first input of the comparator, a switching circuit, a first capacitor coupled between the first input of the comparator and the switching circuit, a second capacitor coupled between the first input of the comparator and the switching circuit, and an amplifying circuit having an input and an output, wherein the input of the amplifying circuit is coupled to the switching circuit. The ADC further includes a first switch coupled between the output of the amplifying circuit and the DAC, and a successive approximation register (SAR) having an input and an output, wherein the input of the SAR is coupled to the output of the comparator, and the output of the SAR is coupled to the DAC.

A circuit portion comprising a clock domain is disclosed. A first clock is arranged to clock components in the clock domain. An analogue to digital converter is clocked by a second clock with a duty cycle. The second clock is derived from the first clock. The analogue to digital converter is arranged to output a feedback signal upon finishing a conversion of a sample, and the feedback signal is arranged to control the duty cycle.

A system includes an ADC configured to generate a superposition signal by the ADC being configured to under-sample an input signal at a sampling frequency in which the input signal that is input to the analog to digital converter has a bandwidth and the sampling frequency is less than a Nyquist rate for the bandwidth of the input signal. The system includes a digital signal processor (DSP) configured to digitally process the superposition signal to separate the superposition signal into a plurality of bitstreams, where each of the plurality of bitstreams corresponds to information in a different one of a plurality of separable, distinct frequency bands within the input signal. The information in the superposition signal for at least one of the said plurality of bitstreams is present in the input signal at frequencies greater than the sampling frequency, and the DSP is configured to output said plurality of bitstreams.

Methods and systems are described for generating a process-voltage-temperature (PVT)-dependent reference voltage at a reference branch circuit based on a reference current obtained via a band gap generator and a common mode voltage input, generating a PVT-dependent output voltage at an output of a static analog calibration circuit responsive to the common mode voltage input and an adjustable current, adjusting the adjustable current through the static analog calibration circuit according to a control signal generated responsive to comparisons of the PVT-dependent output voltage to the PVT-dependent reference voltage, and configuring a clocked data sampler with a PVT-calibrated current by providing the control signal to the clocked data sampler.

A device includes a sensor configured to output an analog sensor signal, an analog-to-digital converter circuit configured to convert the analog sensor signal into a sigma-delta-modulated digital signal having a bit width of n bits, and a pulse width modulator configured to generate a pulse-width-modulated signal based on the sigma-delta-modulated digital signal.

Provided are an analog-to-digital converter and/or an operating method thereof. The analog-to-digital converter includes a sample/hold circuit, a digital-to-analog converter, a comparing circuit, and a control logic circuit, wherein the digital-to-analog converter includes a first capacitor connected to a first comparison node and a first filtering node, a first reference voltage switch connected to the first filtering node and connected to a first delivery node or a first transmission node, a first pre-charge switch connected to the first filtering node or the first delivery node, and a first pre-charge capacitor connected to the first pre-charge switch and a ground voltage.

The present disclosure discloses a band-pass analog-to-digital converter (ADC) using a bidirectional voltage-controlled oscillator (VCO) including a first converter configured to receive an analog input signal and quantize the analog input signal according to a first clock signal to output a first digital signal, a second converter configured to receive the analog input signal and quantize the analog input signal in a time-interleaving manner according to a second clock signal, which has a phase opposite to that of the first clock signal, to output a second digital signal, and a multiplexer configured to receive the first and second digital signals and select one of the two signals in response to the first clock signal to finally output a digital output signal.

The present disclosure relates to a read-out circuit comprising N inputs configured to be connected to N respective outputs of a pixel array of an image sensor, with N being an integer strictly greater than 1; and N analog-to-digital converters organized in K groups, with K being an integer strictly greater than 1 and strictly less than N, and each having a first input coupled to a respective one of the N inputs and a second input. In each group, the second inputs of the analog-to-digital converters of the group are connected together, electrically decoupled from the second inputs of the analog-to-digital converters of the other groups, and configured to receive a first reference signal that is identical for all the analog-to-digital converters of the group.

An electronic device has an amplifier having an amplifier input terminal and an amplifier output terminal, the amplifier output terminal being connected to the device output terminal. An input capacitor is connected between the device input terminal and the amplifier input terminal. A feedback capacitor is connected between the amplifier output terminal and the amplifier input terminal. A switchable capacitor has a first terminal connected to the amplifier input terminal and a second terminal connected to a respective first terminal of each of a first switch and a second switch. The first switch has its second terminal connected to the device input terminal. The second switch has its second terminal connected to the amplifier output terminal. In this arrangement, the switchable capacitor can be switched between forming part of the input path of the amplifier or the feedback path of the amplifier.

A sample-and-hold amplification circuit can include a sampling circuit configured to sample first and second input signals in response to first and second control signals to generate first and second sampled signals, an amplification circuit configured to amplify a voltage difference between the first and second sampled signals to generate first and second output signals, and an offset compensation circuit configured to form a first path between input and output terminals of the amplification circuit in response to the first control signal to store an offset of the input terminal and form a second path between the input and output terminals in response to the second control signal to reflect the offset to the output terminal.