Patent classifications
H05K2201/09836
THROUGH-HOLE ELECTRODE SUBSTRATE
A method of manufacturing a through-hole electrode substrate includes forming a plurality of through-holes in a substrate, forming a plurality of through-hole electrodes by filling a conductive material into the plurality of through-holes, forming a first insulation layer on one surface of the substrate, forming a plurality of first openings which expose the plurality of through-hole electrodes corresponding to each of the plurality of through-hole electrodes, on the first insulation layer and correcting a position of the plurality of first openings using the relationship between a misalignment amount of a measured distance value of an open position of a leaning through-hole among the plurality of through-holes and of a design distance value of the open position of the leaning through-hole among the plurality of through-holes with respect to a center position of the substrate.
Through-hole electrode substrate
A method of manufacturing a through-hole electrode substrate includes forming a plurality of through-holes in a substrate, forming a plurality of through-hole electrodes by filling a conductive material into the plurality of through-holes, forming a first insulation layer on one surface of the substrate, forming a plurality of first openings which expose the plurality of through-hole electrodes corresponding to each of the plurality of through-hole electrodes, on the first insulation layer and correcting a position of the plurality of first openings using the relationship between a misalignment amount of a measured distance value of an open position of a leaning through-hole among the plurality of through-holes and of a design distance value of the open position of the leaning through-hole among the plurality of through-holes with respect to a center position of the substrate.
Test fixture
An example test fixture, which interfaces a tester and a unit under test (UUT), includes the following: first electrical contacts that face the tester; second electrical contacts that face the UUT; a substrate made of sections of printed first material, with the first material being electrically non-conductive, and with the substrate being between the first electrical contacts and the second electrical contacts; and structures through the substrate, with the structures including sections of second material, with the second material being electrically conductive, and with at least one of the structures electrically connecting a first electrical contact and a second electrical contact.
Multilayer wiring substrate, manufacturing method therefor, and substrate for probe card
A multilayer wiring substrate that can realize a higher-density wiring structure is obtained. Provided is a multilayer wiring substrate, where a multilayer body including a first insulating layer and a second insulating layer stacked on the bottom surface of the first insulating layer includes printed wiring electrodes; the printed wiring electrodes are formed by printing with and sintering conductive paste; the printed wiring electrodes respectively include first wiring electrode portions located on the second insulating layer and second wiring electrode portions respectively joined to first wiring electrode portions; and the second wiring electrode portions respectively extend into through holes and, further, are exposed at the top surface of the first insulating layer.
TEST FIXTURE
An example test fixture, which interfaces a tester and a unit under test (UUT), includes the following: first electrical contacts that face the tester; second electrical contacts that face the UUT; a substrate made of sections of printed first material, with the first material being electrically non-conductive, and with the substrate being between the first electrical contacts and the second electrical contacts; and structures through the substrate, with the structures including sections of second material, with the second material being electrically conductive, and with at least one of the structures electrically connecting a first electrical contact and a second electrical contact.
Component Carrier Comprising a Deformation Counteracting Structure
Disclosed is a device for electrically connecting components, which device has at least one electrically insulating layer structure, at least one electrically conducting layer structure, which is stacked and consolidated with the at least one electrically insulating layer structure under formation of a stack of layers, and a warpage stabilization structure for stabilizing the device in a warpage-suppressing manner, which structure at least partially pervades layer structures of the stack of layers.
METHOD FOR PRODUCING A PRINTED CIRCUIT BOARD
A method for producing a printed circuit board is disclosed, In the method, a slot is formed in a substrate having at least three layers with the slot extending through at least two of the layers. The slot has a length and a width with the length being greater than the width. The sidewall of the substrate surrounding the slot is coated with a conductive layer. Then, the conductive layer is separated into at least two segments that are electrically isolated along the side wall of the substrate.
Bus bar plate, electronic component unit, and wire harness
An electronic component unit and a wire harness are provided with a bus bar plate. The bus bar plate is provided with a metallic bus bar that is built in a resin material, and including a through-hole in which a terminal of a relay mounted on a mounting surface is soldered. The through-hole is provided with a bus bar through-hole which penetrates the bus bar, and a resin material through-hole which penetrates the resin material and is formed to be larger than the bus bar through-hole to expose the surface of the bus bar. When an inner diameter of the bus bar through-hole is defined as r and an inner diameter of the resin material through-hole is defined as R, 1.5rR is satisfied.
APPARATUS, SYSTEM, AND METHOD OF PROVIDING A RAMPED INTERCONNECT FOR SEMICONDUCTOR FABRICATION
The disclosure is and includes at least an apparatus, system and method for a ramped electrical interconnection for use in semiconductor fabrications. The apparatus, system and method includes at least a first semiconductor substrate having thereon a first electrical circuit comprising first electrical components; a second semiconductor substrate at least partially covering the first electrical circuit, and having thereon a second electrical circuit comprising second electrical components; a ramp formed through the second semiconductor substrate between at least one of the first electrical components and at least one of the second electrical components; and an additively manufactured conductive trace formed on the ramp to electrically connect the at least one first electrical component and the at least one second electrical component.
Printed wiring board, multilayer resonator, and multilayer filter
A printed wiring board includes a dielectric layer, a first and second conductor layer, and a plurality of via conductors. The dielectric layer has first and second opposing surfaces. The first and second conductor layer lie in the first second surfaces of the dielectric layer, respectively. Each via conductor extends through the dielectric layer and connects the first and second conductor layers to each other. Part of the printed wiring board is surrounded with the via conductors and is an overlap between the first conductor layer and the second conductor layer in a transparent plan view. When viewed in plan, the via conductors each have an aspect ratio greater than 1 and a major axis extending in a first direction and a minor axis extending in a second direction. The via conductors include a via conductor whose major axis extends and connects the via conductors arranged in a line.