A novel method and mass spectrometer apparatus is introduced to enable collision induced dissociation inside linear ion traps/guides or 3D ion traps based on digital waveform manipulation. In particular, using the device's digitally produced trapping waveforms to trap, isolate and energize the ions of interest creates a simplified and versatile ion trap/guide that is capable tandem mass spectrometry and high sensitivity. Coupling the digitally operated ion trap/guides to a TOF creates a Q-TOF instrument that outperforms any commercial system in terms of sensitivity and capabilities.

A time-of-flight mass spectrometer (TOF-MS) utilizes an ion dispersion device and a position-sensitive ion detector or an energy-sensitive ion detector to enable measurement of time of flight and kinetic energy of ions arriving at the detector. The measurements may be utilized to improve accuracy in calculating ion masses.

A mass spectrometer is disclosed comprising an ion mobility spectrometer or separator and an ion guide arranged downstream of the ion mobility spectrometer or separator. A plurality of axial potential wells are created in the ion guide so that ions received from the ion mobility spectrometer or separator become confined in separate axial potential wells. The potential wells maintain the fidelity and/or composition of ions received from the ion mobility spectrometer or separator. The potential wells are translated along the length of the ion guide.

A mass analyser comprises a pair of electrode arrays. Each array has a set of focusing electrodes which are supplied, in use, with voltage to create an electrostatic field in a space between the electrode arrays causing ions to undergo periodic, oscillatory motion in the space, ions passing between electrodes of the sets of focusing electrodes and being repeatedly focused at a centre plane, mid-way between the electrode arrays. At least one electrode of each set of focusing electrodes has an electrode surface closer to the centre plane than the electrode surfaces of other electrodes of the same set. The analyser may be an ion trap mass analyser or a multi-turn ToF mass analyser.

Within an intermediate vacuum chamber next to an ionization chamber maintained at atmospheric pressure, an electrode group of a radio-frequency carpet composed of a plurality of concentrically arranged ring electrodes is placed before a skimmer, with its central axis coinciding with that of an ion-passing hole. Each ring electrode has a circular radial sectional shape. Radio-frequency voltages with mutually inverted phases are applied to the ring electrodes neighboring each other in the radial direction. Additionally, a different level of direct-current voltage is applied to each ring electrode to create a potential which is sloped downward from the outer ring electrode to the inner ring electrode. The circular cross section of the electrode produces a steep pseudo-potential near the electrode and thereby increases the repulsive force which acts on the ions to repel them from the electrode.

An electrostatic analyzer including at least one first set of electrodes, at least one second set of electrodes, and a field free space separating the two sets of electrodes is disclosed. The two sets of electrodes form two-dimensional electrostatic fields of ion mirrors and are arranged to provide isochronous ion oscillations in an x-y plane. Both sets of electrodes are curves at a constant curvature radius R along a third locally orthogonal Z-direction to form a torroidal field region. A related method is also disclosed.

A method of mass spectrometry is disclosed comprising providing a first device and a second device disposed downstream of the first device. The method further comprises introducing a potential difference between the exit of the first device and the entrance of the second device and reducing the total potential drop across the first and second devices by applying a reverse axial electric field to the first device and/or the second device. Ions are driven through the first device and/or the second device against the reverse axial electric field.

An orthogonal pulse accelerator for a Time-of-Flight mass analyzer includes an electrically-conductive first plate extending in a first plane, and a second plate spaced from the first plate. The second plate includes a grid that defines a plurality of apertures each having a first dimension extending in a first direction and a second dimension orthogonal to the first dimension, the first and second dimensions lying in the second plane and the second dimension begin larger than the first dimension. The first and second plates are positioned in the Time-of-Flight mass analyzer to receive, during operation of the mass analyzer, an ion beam propagating in the first direction in a region between the first and second plates, and the orthogonal pulse accelerator directs ions in the ion beam through the apertures.

A mass analyser is disclosed comprising an annular ion guide comprising a first annular ion guide section and a second annular ion guide section, wherein the annular ion guide comprises: (i) an inner cylindrical electrode arrangement which is axially segmented and comprises a plurality of first electrodes and (ii) an outer cylindrical electrode arrangement which is axially segmented and comprises a plurality of second electrodes. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits. Ions are orthogonally accelerated from the first annular ion guide section into the second annular ion guide section and one or more parabolic DC potentials are maintained along a portion of the second annular ion guide section so that ions undergo simple harmonic motion. An inductive ion detector is arranged and adapted to detect ions within the second annular ion guide section.

A device for mass spectrometry in continuous operation can be equipped with a focused electron beam source or laser radiation source. It can further include a vacuum chamber, a stage for placing the specimen, and an ion beam column with a plasma source for producing a primary ion beam and a secondary ion mass spectrometer for secondary ion analysis. The ion beam column is connected to an inert gas source and to a reactive gas source and is modified for simultaneous introduction of at least two gases from the inert gas source and reactive gas source. The secondary ion mass spectrometer is of an orthogonal Time-of-Flight type to ensure the function with the ion beam column in continuous operation.